Anomalous Dependence of the Intensity of X-Ray Reflections of Cs2SO4 on the Crystallite Size and Shape

2018 ◽  
Vol 60 (2) ◽  
pp. 390-396
Author(s):  
I. M. Shmyt’ko ◽  
V. V. Kedrov ◽  
A. S. Aronin
Keyword(s):  
Crystallite Size ◽  
X Ray ◽  
Size And Shape ◽  
Anomalous Dependence

Determination of the Crystallite Size and Shape in Substituted Barium Hexaferrite by X-Ray Line Broadening Analysis

1995 ◽  
Vol 114 (2) ◽  
pp. 534-538 ◽  
Author(s):  
M.V. Cabañas ◽  
P. Germi ◽  
J.M. González-Calbet ◽  
M. Pernet ◽  
M. Vallet-Regı́
Keyword(s):  
Crystallite Size ◽  
Barium Hexaferrite ◽  
Line Broadening ◽  
X Ray ◽  
Size And Shape ◽  
Substituted Barium Hexaferrite

Direct Observation of Crystalline Ordering In Naturally Graphitized Carbon Produced by Low Grade Metamorphism

1977 ◽  
Vol 35 ◽  
pp. 162-163
Author(s):  
Thomas R. McKee ◽  
Peter R. Buseck
Keyword(s):  
Crystallite Size ◽  
Sedimentary Rocks ◽  
Carbonaceous Material ◽  
Low Grade ◽  
X Ray ◽  
Graphitized Carbon ◽  
Transmission Electron ◽  
Heat Treated ◽  
Commercial Carbon ◽  
Metamorphic Zone

Sediments commonly contain organic material which appears as refractory carbonaceous material in metamorphosed sedimentary rocks. Grew and others have shown that relative carbon content, crystallite size, X-ray crystallinity and development of well-ordered graphite crystal structure of the carbonaceous material increases with increasing metamorphic grade. The graphitization process is irreversible and appears to be continous from the amorphous to the completely graphitized stage. The most dramatic chemical and crystallographic changes take place within the chlorite metamorphic zone.The detailed X-ray investigation of crystallite size and crystalline ordering is complex and can best be investigated by other means such as high resolution transmission electron microscopy (HRTEM). The natural graphitization series is similar to that for heat-treated commercial carbon blacks, which have been successfully studied by HRTEM (Ban and others).

scholarly journals Quartz Crystallite Size and Moganite Content as Indicators of the Mineralogical Maturity of the Carboniferous Chert: The Case of Cherts from Eastern Asturias (Spain)

Minerals ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 611
Author(s):  
Celia Marcos ◽  
María de Uribe-Zorita ◽  
Pedro Álvarez-Lloret ◽  
Alaa Adawy ◽  
Patricia Fernández ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Crystallite Size ◽  
Archaeological Sites ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Infrared And Raman Spectroscopy ◽  
First Time ◽  
Geological Formations

Chert samples from different coastal and inland outcrops in the Eastern Asturias (Spain) were mineralogically investigated for the first time for archaeological purposes. X-ray diffraction, X-ray fluorescence, transmission electron microscopy, infrared and Raman spectroscopy and total organic carbon techniques were used. The low content of moganite, since its detection by X-ray diffraction is practically imperceptible, and the crystallite size (over 1000 Å) of the quartz in these cherts would be indicative of its maturity and could potentially be used for dating chert-tools recovered from archaeological sites. Also, this information can constitute essential data to differentiate the cherts and compare them with those used in archaeological tools. However, neither composition nor crystallite size would allow distinguishing between coastal and inland chert outcrops belonging to the same geological formations.

scholarly journals Measurements by x-ray diffraction of the temperature dependence of lattice parameter and crystallite size for isostatically-pressed graphite

Carbon Trends ◽  
2021 ◽  
pp. 100071
Author(s):  
Keith R. Hallam ◽  
James Edward Darnbrough ◽  
Charilaos Paraskevoulakos ◽  
Peter J. Heard ◽  
T. James Marrow ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Crystallite Size ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray

Quantitative Evaluation of Voids in Lead Free Solder Joints

2015 ◽  
Vol 772 ◽  
pp. 284-289 ◽  
Author(s):  
Sabuj Mallik ◽  
Jude Njoku ◽  
Gabriel Takyi
Keyword(s):  
Solder Bump ◽  
Solder Joints ◽  
Void Formation ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Paste ◽  
X Ray ◽  
Size And Shape ◽  
Solder Bumps ◽  
Free Solder

Voiding in solder joints poses a serious reliability concern for electronic products. The aim of this research was to quantify the void formation in lead-free solder joints through X-ray inspections. Experiments were designed to investigate how void formation is affected by solder bump size and shape, differences in reflow time and temperature, and differences in solder paste formulation. Four different lead-free solder paste samples were used to produce solder bumps on a number of test boards, using surface mount reflow soldering process. Using an advanced X-ray inspection system void percentages were measured for three different size and shape solder bumps. Results indicate that the voiding in solder joint is strongly influenced by solder bump size and shape, with voids found to have increased when bump size decreased. A longer soaking period during reflow stage has negatively affectedsolder voids. Voiding was also accelerated with smaller solder particles in solder paste.

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera
Keyword(s):  
Crystallite Size ◽  
Original Form ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Variance Method ◽  
The Mean ◽  
Voigt Function

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.

scholarly journals X-ray diffraction study of crystallite size-distribution and strain in carbon blacks

2000 ◽  
Vol 661 ◽  
Author(s):  
T. Ungár ◽  
J. Gubicza ◽  
G. Ribárik ◽  
T. W. Zerda
Keyword(s):  
Crystallite Size ◽  
Size Distribution ◽  
Fourier Coefficients ◽  
Shape Anisotropy ◽  
X Ray Diffraction ◽  
Strain Anisotropy ◽  
X Ray ◽  
Carbon Blacks ◽  
Size Profile ◽  
Crystallite Shape

ABSTRACTThe crystallite size and size-distribution in carbon blacks in the presence of strain are determined by recently developed procedure of X-ray diffraction peak profile analysis. The Fourier coefficients of the measured physical profiles are fitted by Fourier coefficients of well established ab initio functions of size and strain peak profiles. Strain anisotropy is accounted for by expressing the mean square strain in terms of average dislocation contrast factors. Crystallite shape anisotropy is modelled by ellipsoids incorporated into the size profile function. To make the fitting procedure faster, the Fourier transform of the size profile is given as an analitical function. The method is applied to carbon blacks treated at different preassures and temperatures. The microstructure is characterised in terms of crystallite size distribution, dislocation density, and crystallite shape anisotropy.

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