TIME-RESOLVED IN SITU GISAXS EXPERIMENT OF EVAPORATION-INDUCED SELF-ASSEMBLY OF CTAB TEMPLATED SILICA THIN FILMS UNDER CONTROLLED HUMIDITY

2005 ◽  
Vol 04 (05n06) ◽  
pp. 873-878 ◽  
Author(s):  
S. DOURDAIN ◽  
M. COLAS ◽  
J. F. BARDEAU ◽  
O. GANG ◽  
B. OCKO ◽  
...  
Keyword(s):  
Thin Films ◽  
Self Assembly ◽  
Silica Matrix ◽  
Time Resolved ◽  
Silica Thin Films ◽  
Short Period ◽  
Cylindrical Micelles ◽  
Evaporation Induced Self Assembly ◽  
Morphologic Changes

The influence of controlled humidity on the phase transformation of CTAB templated silica thin films is studied by time-resolved in situ GISAXS measurements. It is shown that during a short period of time the silica matrix is flexible enough to follow the morphologic changes of the cylindrical micelles into spherical ones. During this time water can be uptaken and outtaken from the film. The evolution of the lattice parameters upon cycling dry and humid air is presented and discussed.

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Formation and characterization of high-density silver nanoparticles embedded in silica thin films by “in situ” self-reduction

2001 ◽  
Vol 16 (10) ◽  
pp. 2934-2938 ◽  
Author(s):  
G. Compagnini ◽  
M. M. Fragal´ ◽  
L. D'Urso ◽  
C. Spinella ◽  
O. Puglisi
Keyword(s):  
Thin Films ◽  
Silver Nanoparticles ◽  
High Density ◽  
Silver Particles ◽  
X Ray Diffraction ◽  
Optical Extinction ◽  
Organometallic Precursor ◽  
Silica Thin Films ◽  
20 Nm

Silver nanoparticles (10–20 nm) embedded into silica thin films have been obtained through the use of a silver organometallic precursor compound dissolved in Spin-On-Glass and subsequently spinned onto suitable substrates. In this paper we present a study of the shape, size, and distribution of silver particles through the use of microscopes, x-ray diffraction, and optical extinction. It has been observed that the obtained films are stable for annealing up to 500 °C with a progressive degradation above this temperature. Furthermore it is possible to obtain high-density silver particles up to 15% in weight without affecting the cluster size and shape.

scholarly journals In Situ Time-Resolved SAXS Study of the Formation of Mesostructured Organically Modified Silica through Modeling of Micelles Evolution during Surfactant-Templated Self-Assembly

Langmuir ◽  
2012 ◽  
Vol 28 (50) ◽  
pp. 17477-17493 ◽  
Author(s):  
Florentin Michaux ◽  
Niki Baccile ◽  
Marianne Impéror-Clerc ◽  
Luca Malfatti ◽  
Nicolas Folliet ◽  
...  
Keyword(s):  
Self Assembly ◽  
Modified Silica ◽  
Time Resolved ◽  
Organically Modified ◽  
Organically Modified Silica

scholarly journals Dynamic cross-linking of an alginate–acrylamide tough hydrogel system: time-resolved in situ mapping of gel self-assembly

RSC Advances ◽  
2021 ◽  
Vol 11 (18) ◽  
pp. 10710-10726
Author(s):  
Akanksha Pragya ◽  
Suhas Mutalik ◽  
Muhammad Waseem Younas ◽  
Siu-Kwong Pang ◽  
Pui-Kin So ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Formation Process ◽  
Self Assembly ◽  
Cross Linking ◽  
Time Resolved ◽  
System Time ◽  
Dynamic Formation ◽  
Hydrogel System

In situ, time-resolved characterisation of an alginate–acrylamide tough hydrogel dynamic formation process indicate routes to intervention and modification of chemo-physico-mechanical properties.

Enhanced Luminescence Characteristics of Mesophase Silica Thin Films Doped with In-Situ-Formed Rare Earth Complexes

2016 ◽  
Vol 8 (1) ◽  
pp. 122-127 ◽  
Author(s):  
Sang Hoon Choi ◽  
Seok-Jun Seo ◽  
Dan Zhao ◽  
Kyoung-Tae Park ◽  
Bum Sung Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Rare Earth ◽  
Rare Earth Complexes ◽  
Silica Thin Films ◽  
Enhanced Luminescence ◽  
Luminescence Characteristics

Mechanism of Surfactant Removal from Ordered Nanocomposite Silica Thin Films by Deep-UV Light Exposure

2003 ◽  
Vol 788 ◽  
Author(s):  
Andrew M. Dattelbaum ◽  
Meri L. Amweg ◽  
Julia D. Ruiz ◽  
Laurel E. Ecke ◽  
Andrew P. Shreve ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Self Assembly ◽  
Uv Light ◽  
Light Exposure ◽  
Complete Removal ◽  
Combined Application ◽  
Silica Thin Films ◽  
Deep Uv ◽  
Surfactant Removal

ABSTRACTIn recent years, methods have been developed for the generation of complex ordered nanocomposite materials through organic templating of inorganic structures. One approach involves preparation of composite materials by an evaporation induced self-assembly process involving organization of organic surfactants and formation of inorganic silica from soluble precursors. Recently, we have shown that deep-UV light (185–254nm) is efficient at removing the surfactant microphase for a routine production of well-ordered mesoporous silica thin films. Here we probe the evolution of surfactant removal from nanocomposite thin film silica mesophases as a function of deep-UV exposure using a combined application of FTIR and single wavelength ellipsometry. Taken together, these data indicate that surfactant removal occurs in a step-wise fashion with the formation of oxidized intermediates prior to complete removal of the surfactant from the thin film.

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