Determination of Thermal Expansion by High-Temperature X-Ray Diffraction

1961 ◽  
Vol 5 ◽  
pp. 238-243 ◽  
Author(s):  
Dale A. Vaughan ◽  
Charles M. Schwartz

AbstractTwo high-temperature X-ray diffraction cameras are described which have been employed at Battelle to determine thermal expansion of metals and ceramic materials. Specimen preparation and temperature measurement and control are described. Lattice-parameter data vs. temperature are presented for uranium, uranium dioxide, and magnesium oxide.

2018 ◽  
Vol 212 ◽  
pp. 161-166 ◽  
Author(s):  
Adam C. Lindsey ◽  
Matthew Loyd ◽  
Maulik K. Patel ◽  
Ryan Rawl ◽  
Haidong Zhou ◽  
...  

Author(s):  
Katarzyna M. Kosyl ◽  
Wojciech Paszkowicz ◽  
Alexey N. Shekhovtsov ◽  
Miron B. Kosmyna ◽  
Jerzy Antonowicz ◽  
...  

The structure of calcium europium orthoborate, Ca3Eu2(BO3)4, was determined using high-resolution powder X-ray diffraction data collected at the ID22 beamline (ESRF) under ambient conditions, as well as at high temperature. Rietveld refinement allowed determination of the lattice constants and structural details, including the Ca/Eu ratios at the three cationic sites and their evolution with temperature. Clear thermal expansion anisotropy was found, and slope changes of lattice-constant dependencies on temperature were observed at 923 K. Above this temperature the changes in occupation of the Ca/Eu sites occur, exhibiting a tendency towards a more uniform Eu distribution over the three Ca/Eu sites. Possible structural origins of the observed thermal expansion anisotropy are discussed.


2018 ◽  
Vol 15 (1) ◽  
pp. 46
Author(s):  
Sundami Restiana ◽  
Ari Sulistyo Rini

Visualization of crystal structures and simulation of X-ray diffraction patterns of perovskite ceramic was successfully performed by VESTA software programs. The purpose of this research is to obtain the relation of lattice parameter, and composition to the diffraction pattern. The software program produces crystal structure information and a representative X-ray diffraction pattern for the ceramic materials. The program needs several input parameters such as the coordinates of each constituent atom, lattice parameters, and space symmetry. The obtained output of the software program are in the form of diffraction pattern graph and crystal structure data which gives the description of the profile and type (phase) of ceramic material. The results showed that the peak position and intensity of the diffraction pattern are influenced by the arrangement of  the atoms within the unit cell. The addition of impurity atoms such as Sr on the Ba side in BaTiO3 causes the BaTiO3 structure changes from Orthorombic (a≠b≠c) to Tetragonal (a=b≠c) structure. Based on the simulation, it can be predicted that the critical concentration of the change of structure occur at Sr concentration about 0.4.


2004 ◽  
Vol 443-444 ◽  
pp. 31-34
Author(s):  
Giovanni Berti ◽  
Rob Delhez ◽  
S. Norval ◽  
B. Peplinski ◽  
E. Tolle ◽  
...  

This paper outlines the standardisation process for the XRPD method that is currently being considered by a Working Group (WG10) of Technical Committee 138 "Non-destructive Testing" of the European Committee for Standardisation CEN. Several Standard Documents are on the verge of being released. These documents concern the general principles of (X-ray) diffraction, its terminology, and the basic procedures applied. Another document concerns the instruments used and it offers procedures to characterise and control the performance of an X-ray diffractometer properly. It is intended to issue Standard Documents on specific methods, e.g. determination of residual stresses. In fact work is in progress on this subject. The Standard Documents can be used by industry, government organisations, and research centres with activities related to safety, health and the environment, as well as for educational purposes.


2017 ◽  
Vol 17 (2) ◽  
pp. 107-110
Author(s):  
K. Stec ◽  
J. Podwórny ◽  
B. Psiuk ◽  
Ł. Kozakiewicz

Abstract Using the available analytical methods, including the determination of chemical composition using wavelength-dispersive X-ray fluorescent spectroscopy technique and phase composition determined using X-ray diffraction, microstructural observations in a highresolution scanning microscope equipped with an X-ray microanalysis system as well as determination of characteristic softening and sintering temperatures using high-temperature microscope, the properties of particular chromite sands were defined. For the study has been typed reference sand with chemical properties, physical and thermal, treated as standard, and the sands of the regeneration process and the grinding process. Using these kinds of sand in foundries resulted in the occurrence of the phenomenon of the molding mass sintering. Impurities were identified and causes of sintering of a moulding sand based on chromite sand were characterized. Next, research methods enabling a quick evaluation of chromite sand suitability for use in the preparation of moulding sands were selected.


1990 ◽  
Vol 5 (1) ◽  
pp. 183-189 ◽  
Author(s):  
H. M. O'Bryan ◽  
P. K. Gallagher ◽  
G. W. Berkstresser ◽  
C. D. Brandle

Dilatometry, high-temperature x-ray diffraction, differential thermal analysis, and differential scanning calorirmetry have been performed on LaGaO3, NdGaO3, PrGaO3, SmAlO3, and LaAlO3 single crystals grown by the Czochralski technique. First order phase transitions have been located at 145°C for LaGaO3 and 785°C for SmAlO3, and ΔH has been measured for the LaGaO3 transition. Second order transitions have been identified for LaGaO3, PrGaO3, NdGaO3, and LaAlO3. The usefulness of these compounds as substrates for high temperature superconducting films is discussed in terms of thermal expansion matching.


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