Comparison of Mechanical Enhancing Effects on Chemically Vapor-Deposited 3C-SiC with Different Crystallographic Orientation

2018 ◽  
Vol 10 (5) ◽  
pp. 643-650
Author(s):  
Jung Ho Shin ◽  
Daejong Kim ◽  
Hyeon-Geun Lee ◽  
Ji Yeon Park ◽  
Weon-Ju Kim
Keyword(s):  
Crystallographic Orientation ◽  
Chemically Vapor Deposited

The dislocation structure of a 10° [110] tilt boundary in silicon

1983 ◽  
Vol 41 ◽  
pp. 114-115
Author(s):  
B. Cunningham ◽  
D.G. Ast
Keyword(s):  
Dislocation Structure ◽  
Tilt Angle ◽  
Imaging Technique ◽  
Diamond Lattice ◽  
Tilt Boundary ◽  
Formation Mechanisms ◽  
Diffraction Contrast ◽  
Lattice Fringe ◽  
Tilt Boundaries ◽  
Chemically Vapor Deposited

There have Been a number of studies of low-angle, θ < 4°, [10] tilt boundaries in the diamond lattice. Dislocations with Burgers vectors a/2<110>, a/2<112>, a<111> and a<001> have been reported in melt-grown bicrystals of germanium, and dislocations with Burgers vectors a<001> and a/2<112> have been reported in hot-pressed bicrystals of silicon. Most of the dislocations were found to be dissociated, the dissociation widths being dependent on the tilt angle. Possible dissociation schemes and formation mechanisms for the a<001> and a<111> dislocations from the interaction of lattice dislocations have recently been given.The present study reports on the dislocation structure of a 10° [10] tilt boundary in chemically vapor deposited silicon. The dislocations in the boundary were spaced about 1-3nm apart, making them difficult to resolve by conventional diffraction contrast techniques. The dislocation structure was therefore studied by the lattice-fringe imaging technique.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Texture measurements in Al2O3 using BEKP

1994 ◽  
Vol 52 ◽  
pp. 608-609
Author(s):  
M. D. Vaudin ◽  
J. P. Cline
Keyword(s):  
Neutron Diffraction ◽  
Rapid Method ◽  
Crystallographic Orientation ◽  
Specimen Surface ◽  
X Ray Diffraction ◽  
Anisotropic Crystal ◽  
X Ray ◽  
Verification Method ◽  
Crystal Properties ◽  
Backscattered Electron

The study of preferred crystallographic orientation (texture) in ceramics is assuming greater importance as their anisotropic crystal properties are being used to advantage in an increasing number of applications. The quantification of texture by a reliable and rapid method is required. Analysis of backscattered electron Kikuchi patterns (BEKPs) can be used to provide the crystallographic orientation of as many grains as time and resources allow. The technique is relatively slow, particularly for noncubic materials, but the data are more accurate than any comparable technique when a sufficient number of grains are analyzed. Thus, BEKP is well-suited as a verification method for data obtained in faster ways, such as x-ray or neutron diffraction. We have compared texture data obtained using BEKP, x-ray diffraction and neutron diffraction. Alumina specimens displaying differing levels of axisymmetric (0001) texture normal to the specimen surface were investigated.BEKP patterns were obtained from about a hundred grains selected at random in each specimen.

Preparation of integrated circuits for TEM electromigration in situ studies

1986 ◽  
Vol 44 ◽  
pp. 882-883
Author(s):  
J. V. Maskowitz ◽  
W. E. Rhoden ◽  
D. R. Kitchen ◽  
R. E. Omlor ◽  
P. F. Lloyd
Keyword(s):  
Integrated Circuits ◽  
Crystallographic Orientation ◽  
Silicon Wafers ◽  
Minimum Size ◽  
Test Vehicle ◽  
In Situ Studies ◽  
Boron Doped ◽  
Doped Silicon ◽  
Drill Holes

The fabrication of the aluminum bridge test vehicle for use in the crystallographic studies of electromigration involves several photolithographic processes, some common, while others quite unique. It is most important to start with a clean wafer of known orientation. The wafers used are 7 mil thick boron doped silicon. The diameter of the wafer is 1.5 inches with a resistivity of 10-20 ohm-cm. The crystallographic orientation is (111).Initial attempts were made to both drill and laser holes in the silicon wafers then back fill with photoresist or mounting wax. A diamond tipped dentist burr was used to successfully drill holes in the wafer. This proved unacceptable in that the perimeter of the hole was cracked and chipped. Additionally, the minimum size hole realizable was > 300 μm. The drilled holes could not be arrayed on the wafer to any extent because the wafer would not stand up to the stress of multiple drilling.

Color Etching for Characterization the Grain Orientation in Spheroidal Graphite Cast Iron

2007 ◽  
Vol 537-538 ◽  
pp. 389-396 ◽  
Author(s):  
Ibolya Kardos ◽  
Zoltán Gácsi ◽  
Péter János Szabó
Keyword(s):  
Cast Iron ◽  
Crystallographic Orientation ◽  
Grain Orientation ◽  
Test Material ◽  
Spheroidal Graphite ◽  
Metallic Materials ◽  
Additional Information ◽  
Spheroidal Graphite Cast Iron ◽  
Graphite Cast Iron ◽  
Back Scattering

Color etching is a widely used technique for visualizing different phases in metallic materials. Its advantage to the traditional etching techniques is that it gives additional information within one phase, namely, the color shade of a given phase can change in a certain range. This paper demonstrates that, due to the physics of the color etching, the shade of a phase also depends on the crystallographic orientation of the investigated grain. As a test material, spheroidal graphite cast iron was used, and individual grain orientation was identified by automated electron back scattering diffraction (EBSD). Results showed that there is a strong correlation between grain orientation and the shades obtained by color etching.

scholarly journals Photoconductive Antennas: Effects of Crystallographic Orientation of GaAs Substrate and the Period of Plasmon Grid on THz Antenna Performance (Ann. Phys. 8/2021)

2021 ◽  
Vol 533 (8) ◽  
pp. 2170025
Author(s):  
Arseniy M. Buryakov ◽  
Maxim S. Ivanov ◽  
Dinar I. Khusyainov ◽  
Anastasia V. Gorbatova ◽  
Vladislav R. Bilyk ◽  
...  
Keyword(s):  
Crystallographic Orientation ◽  
Gaas Substrate ◽  
Photoconductive Antennas ◽  
Antenna Performance ◽  
Thz Antenna

Crystallographic orientation dependence of Charpy impact behaviours in stainless steel 316L fabricated by laser powder bed fusion

2021 ◽  
pp. 102104
Author(s):  
Xianglong Wang ◽  
Oscar Sanchez-Mata ◽  
Sıla Ece Atabay ◽  
Jose Alberto Muñiz-Lerma ◽  
Mohammad Attarian Shandiz ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Crystallographic Orientation ◽  
Charpy Impact ◽  
Orientation Dependence ◽  
Powder Bed Fusion ◽  
Laser Powder Bed Fusion ◽  
Stainless Steel 316L ◽  
Powder Bed
Sign in / Sign up

Export Citation Format

Share Document