Measuring Line Centers from Digitally Recorded Spectra Using a Minicomputer

1974 ◽  
Vol 28 (4) ◽  
pp. 362-368 ◽  
Author(s):  
S. C. Hurlock ◽  
J. R. Hanratty
Keyword(s):  
High Resolution ◽  
Infrared Spectra ◽  
High Accuracy ◽  
Digital Form ◽  
Measuring Line ◽  
Local Section ◽  
Standard Methods ◽  
Interference Fringes ◽  
The Difference ◽  
Very High

A system is described for determining spectral positions from high resolution infrared spectra which have been recorded in digital form on magnetic tape. The system employs a minicomputer located in the laboratory and line centers are determined by an interactive procedure in which the operator makes judgments based on information displayed on the CRT screen of the computer. This information consists of the spectrum, a reflection of a local section of the spectrum at a vertical line through the center of the screen, a plot of the difference between the spectrum and its reflection, and the square of the area under the difference curve. Very high accuracy is demonstrated for locating the centers of single lines as well as the centers of the components of incompletely resolved double lines. Determinations of spectral positions (wavenumber calibration) parallel operations that were previously performed as batch jobs by a much larger computer. Spectral positions are determined by standard methods of calibration of interference fringes and interpolation.

scholarly journals A Mixed Property-Based Automatic Shadow Detection Approach for VHR Multispectral Remote Sensing Images

2018 ◽  
Vol 8 (10) ◽  
pp. 1883 ◽  
Author(s):  
Hongyin Han ◽  
Chengshan Han ◽  
Xucheng Xue ◽  
Changhong Hu ◽  
Liang Huang ◽  
...  
Keyword(s):  
Remote Sensing ◽  
High Resolution ◽  
Near Infrared ◽  
Shadow Detection ◽  
Detection Methods ◽  
Remote Sensing Images ◽  
Multispectral Remote Sensing ◽  
The Difference ◽  
Mixed Property ◽  
Very High

Shadows in very high-resolution multispectral remote sensing images hinder many applications, such as change detection, target recognition, and image classification. Though a wide variety of significant research has explored shadow detection, shadow pixels are still more or less omitted and are wrongly confused with vegetation pixels in some cases. In this study, to further manage the problems of shadow omission and vegetation misclassification, a mixed property-based shadow index is developed for detecting shadows in very high-resolution multispectral remote sensing images based on the difference of the hue component and the intensity component between shadows and nonshadows, and the difference of the reflectivity of the red band and the near infrared band between shadows and vegetation cover in nonshadows. Then, the final shadow mask is achieved, with an optimal threshold automatically obtained from the index image histogram. To validate the effectiveness of our approach for shadow detection, three test images are selected from the multispectral WorldView-3 images of Rio de Janeiro, Brazil, and are tested with our method. When compared with other investigated standard shadow detection methods, the resulting images produced by our method deliver a higher average overall accuracy (95.02%) and a better visual sense. The highly accurate data show the efficacy and stability of the proposed approach in appropriately detecting shadows and correctly classifying shadow pixels against the vegetation pixels for very high-resolution multispectral remote sensing images.

Near-IR Observations of Vega-like Stars with the VLTI: β Pic, α PsA, ∊ Eri and τ Cet

2004 ◽  
Vol 219 ◽  
pp. 75-79 ◽  
Author(s):  
Emmanuel Di Folco ◽  
Pierre Kervella ◽  
Frédéric Thévenin ◽  
Pierre Morel ◽  
Armando Domiciano de Suza ◽  
...  
Keyword(s):  
High Resolution ◽  
Main Sequence ◽  
High Accuracy ◽  
Field Of View ◽  
Circumstellar Material ◽  
Near Ir ◽  
Long Baselines ◽  
Very High ◽  
Innermost Region ◽  
K Band

We have conducted K band interferometric observations of four nearby main-sequence Vega-like stars at the VLTI with very long baselines. The very high resolution allowed us to probe the innermost region of the disks, where planets are supposed to be formed. The diameters of three bright and nearby prototypes β Pictoris, Fomalhaut (α PsA) and ∊ Eridani as well as τ Ceti have been measured with VINCI, the VLTI commissioning instrument, with a high accuracy. The derived diameters were used to constrain their age with help of the evolution code CESAM. The precision achieved with VINCI allowed us to discuss the shape of their photosphere and the possible detection of warm circumstellar material within the narrow interferometric field of view.

MODERN STANDARDS FOR GRAVITY SURVEYS

Geophysics ◽  
1976 ◽  
Vol 41 (5) ◽  
pp. 1051-1051 ◽  
Author(s):  
Carlo Morelli
Keyword(s):  
High Accuracy ◽  
Base Stations ◽  
Uniform System ◽  
The Difference ◽  
Very High

The modern gravity meter is capable of determining the difference in gravity between measurement sites with very high accuracy. However, the gravity values established by one survey can be related to those established by another survey only when both are tied to gravity base stations whose gravity values are in a uniform system.

scholarly journals Technical Analysis To Determine Buying And Selling Signal In Stock Trade

2020 ◽  
Vol 9 (1) ◽  
pp. 58-67
Author(s):  
Rommy Pramudya ◽  
Rommy Pramudya
Keyword(s):  
Moving Average ◽  
Technical Analysis ◽  
High Accuracy ◽  
Relative Strength ◽  
Strength Index ◽  
Single Indicator ◽  
The Difference ◽  
The Right ◽  
Very High

The purpose of this study is to determine which indicators are more capable of showing more accurate sell and buy signals on the LQ45 index by using the oscillator indicator Moving Average Divergent Convergent (MACD), Bollinger Band, and Relative Strength Index (RSI). The results in this study indicate that the sell signal can be captured well by the Bollinger band and MACD indicators, but it cannot be captured properly by the RSI, the volume can be small or heading and are in the side ways, while the MACD plays a too slow role in capturing the signal buy compared to Bollinger bands and RSI. The use of a single indicator will never show a buy and sell signal that is really accurate, this is based on the results of research that shows the difference in timeliness in Bollinger, RSI and also MACD so that the combination of several types of indicators will be better compared to using single indicators. Although in statistics there are no significant differences, there are only differences in increment and improvement in the placement of existing values, but in this case, the order of this value is crucial for traders because it requires very high accuracy to determine the right decision in daily transactions.

scholarly journals Глубокая рентгеновская рефлектометрия сверхмногопериодных A3B5-структур с квантовыми ямами, выращиваемых методом молекулярно-пучковой эпитаксии

2020 ◽  
Vol 90 (11) ◽  
pp. 1906
Author(s):  
Л.И. Горай ◽  
Е.В. Пирогов ◽  
М.С. Соболев ◽  
Н.К. Поляков ◽  
А.С. Дашков ◽  
...  
Keyword(s):  
Standard Deviation ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Calculation Method ◽  
Small Difference ◽  
High Accuracy ◽  
X Ray ◽  
The Difference ◽  
High Degree ◽  
Sharp Interfaces

We studied the elastically strained AlGaAs/GaAs super-multiperiod (SMP – 100–1000 periods) superlattices with different degrees of doping and a small difference in the period thickness. The proposed characterization technique, consisting of the matched application of the deep X-ray reflectometry method, based on a rigorous calculation method, as well as the well-known high-resolution X-ray reflectometry method, made it possible to study 100-period structures with 2-nm wide Al0.3Ga0.7As barriers and 10-nm wide GaAs wells and to determine the layer thicknesses and the blurring of interfaces with high accuracy. It can be considered as the first step in the further analysis of thick structures using bright sources of synchrotron radiation. The difference between the expected and obtained, as a result of restoration by the proposed method, values of the layer thicknesses was several percent, including for samples with a high degree of doping (up to 10^18 cm^−3). All SMP structures are characterized by sharp interfaces with a standard deviation of the order of 0.1 nm. Based on the thickness data obtained, it is possible to accurately determine the composition of the layers using high-resolution X-ray diffractometry.

Very High Resolution Analysis of the Dynamics of a Coronal Plasmoid

1994 ◽  
Vol 144 ◽  
pp. 593-596
Author(s):  
O. Bouchard ◽  
S. Koutchmy ◽  
L. November ◽  
J.-C. Vial ◽  
J. B. Zirker
Keyword(s):  
High Resolution ◽  
Solar Eclipse ◽  
Total Solar Eclipse ◽  
Field Of View ◽  
Small Field ◽  
High Resolution Analysis ◽  
Ccd Observations ◽  
Resolution Analysis ◽  
Very High ◽  
Small Field Of View

AbstractWe present the results of the analysis of a movie taken over a small field of view in the intermediate corona at a spatial resolution of 0.5“, a temporal resolution of 1 s and a spectral passband of 7 nm. These CCD observations were made at the prime focus of the 3.6 m aperture CFHT telescope during the 1991 total solar eclipse.

Quanitative aspects of electron diffraction using electron holography

1995 ◽  
Vol 53 ◽  
pp. 616-617
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Software Package ◽  
Spatial Coherence ◽  
Electron Holography ◽  
Image Intensity ◽  
Interference Fringes ◽  
Complex Image ◽  
The Difference ◽  
Recorded Image

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.

Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

1993 ◽  
Vol 51 ◽  
pp. 914-915
Author(s):  
J.S. Bow ◽  
R.W. Carpenter ◽  
M.J. Kim
Keyword(s):  
High Resolution ◽  
Incident Beam ◽  
Hexagonal Crystal ◽  
Detailed Explanation ◽  
Similar Character ◽  
High Resolution Images ◽  
The Difference ◽  
Zigzag Shape ◽  
Hexagonal Crystals ◽  
Dark Contrast

A prominent characteristic of high-resolution images of 6H-SiC viewed from [110] is a zigzag shape with a period of 6 layers as shown in Fig.1. Sometimes the contrast is same through the 6 layers of (0006) planes (Fig.1a), but in most cases it appears as in Fig.1b -- alternate bright/dark contrast among every three (0006) planes. Alternate bright/dark contrast is most common for the thicker specimens. The SAD patterns of these two types of image are almost same, and there is no indication that the difference results from compositional ordering. O’Keefe et al. concluded this type of alternate contrast was due to crystal tilt in thick parts of the specimen. However, no detailed explanation was given. Images of similar character from Ti3Al, which is also a hexagonal crystal, were reported by Howe et al. Howe attributed the bright/dark contrast among alternate (0002) Ti3Al planes to phase shifts produced by incident beam tilt.

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