scholarly journals Deformation Mechanisms and Fracture of Ni-Based Metallic Glasses

2016 ◽  
Vol 61 (2) ◽  
pp. 791-796 ◽  
Author(s):  
S. Lesz ◽  
S. Griner ◽  
R. Nowosielski

Abstract The cracking of materials and fracture surface is of great practical and academic importance. Over the last few years the development of the fractography of crystalline alloys resulted in a useful tool for the prediction or failure analysis. Many attempts have been made to observe cracks using optical microscopy, X-ray topography and transmission electron microscopy (TEM). Of these techniques, the resolution of optical microscopy and X-ray topography is too poor. By contrast, the resolution of TEM is high enough for detailed information to be obtained. However, in order to apply TEM observations, a thin foil specimen must be prepared, and it is usually extremely difficult to prepare such a specimen from a pre-selected region containing a crack. In the present work, deformation mechanisms fracture surfaces of Ni-based metallic glass samples have been studied by specially designed experiments. In order to study the deformation mechanisms and fracture the Ni-based metallic glasses have been investigated in the tensile test. The structure and fracture surfaces after the decohesion process in tensile tests were observed using transmission electron microscope (TEM) and scanning electron microscope (SEM), respectively. The studies of structure were performed on thin foils. Moreover the investigated tape was subjected to a banding test. Then, the tape was straightened and the thin foil from the area of maximum strain was prepared. This thin foil sample was deformed before the TEM investigation to obtain local tears.

2014 ◽  
Vol 887-888 ◽  
pp. 116-120
Author(s):  
Ying Liang Bai ◽  
Lian Long He

Transmission Electron Microscope (TEM) and X-Ray Diffraction (XRD) were used to investigate crystallization of the Zr70Cu8Ti7Ni15 bulk amorphous alloy, the results show that the edge region of BMGs sample produces nanosize Nickel crystals using the method of the ion thinning to make the TEM sample. The quantity of nanocrystals is proportional to the time of ion thinning and they are not residual crystals in the BMGs.


Author(s):  
D. Imeson ◽  
J. B. Vander Sande

It is well established that when an electron beam is incident upon a thin foil in the form of a focused probe, as in STEM, multiple scattering events in the sample cause considerable lateral spreading of the electron beam. The volume of material excited by the electron beam is therefore much greater than that volume defined by simple projection of the incident beam through the sample. In the application of the techniques of quantitative X-ray analysis in STEM to regions of composition variation with small spatial extent this point becomes of crucial importance, being the main determinant of the ability to map such composition changes, or even to detect them. It is the view of the authors that there exists some confusion over the nature of the beam spreading phenomenon in thin foils of crystalline material and the concept of spatial resolution of composition determination by characteristic X-ray emission. We intend here to clarify these concepts by discussing the meaning and use of the term “beam broadening” in analytical transmission electron microscopy.


1986 ◽  
Vol 82 ◽  
Author(s):  
D.W. Susnitzky ◽  
C.B. Carter

ABSTRACTSurfaces of crystalline materials generally facet and form steps and ledges on low-index planes to reduce their total energy. A conventional wedge-shaped transmission electron microscope (TEM) thin foil, prepared slightly misoriented with respect to a low-index plane, provides a suitable geometry for the study of surface ledges, steps and facets. This TEM study characterizes the surface features of annealed thin foils prepared from various oxides with a range of nominally low-index orientations. Observations from single-crystal α-A12O3 and MgAl2O4 (spinel) will be included.The steps and facets typically form along energetically favorable, low-index planes and bound terraces of low-index orientation. The structure of these features are discussed. In addition, surface step movement has been observed and monitored through a series of reannealing experiments on the same foil.


Author(s):  
E. U. Lee ◽  
P. A. Garner ◽  
J. S. Owens

Evidence for ordering (1-6) of interstitial impurities (O and C) has been obtained in b.c.c. metals, such as niobium and tantalum. In this paper we report the atomic and microstructural changes in an oxygenated c.p.h. metal (alpha titanium) as observed by transmission electron microscopy and diffraction.Oxygen was introduced into zone-refined iodide titanium sheets of 0.005 in. thickness in an atmosphere of oxygen and argon at 650°C, homogenized at 800°C and furnace-cooled in argon. Subsequently, thin foils were prepared by electrolytic polishing and examined in a JEM-7 electron microscope, operated at 100 KV.


Author(s):  
E. A. Kenik ◽  
J. Bentley

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.


Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.


Author(s):  
R. Sinclair ◽  
B.E. Jacobson

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).


Author(s):  
A. Zangvil ◽  
L.J. Gauckler ◽  
G. Schneider ◽  
M. Rühle

The use of high temperature special ceramics which are usually complex materials based on oxides, nitrides, carbides and borides of silicon and aluminum, is critically dependent on their thermomechanical and other physical properties. The investigations of the phase diagrams, crystal structures and microstructural features are essential for better understanding of the macro-properties. Phase diagrams and crystal structures have been studied mainly by X-ray diffraction (XRD). Transmission electron microscopy (TEM) has contributed to this field to a very limited extent; it has been used more extensively in the study of microstructure, phase transformations and lattice defects. Often only TEM can give solutions to numerous problems in the above fields, since the various phases exist in extremely fine grains and subgrain structures; single crystals of appreciable size are often not available. Examples with some of our experimental results from two multicomponent systems are presented here. The standard ion thinning technique was used for the preparation of thin foil samples, which were then investigated with JEOL 200A and Siemens ELMISKOP 102 (for the lattice resolution work) electron microscopes.


Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.


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