Formation of face-centered cubic titanium on a Ni single crystal and in Ni/Ti multilayers

1994 ◽  
Vol 9 (1) ◽  
pp. 31-38 ◽  
Author(s):  
Alan F. Jankowski ◽  
Mark A. Wall
Keyword(s):  
Structural Characteristics ◽  
Single Layer ◽  
High Resolution Electron Microscopy ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resolution Electron ◽  
The Face ◽  
Face Centered

The artificial layering of metals can change both physical and structural characteristics from the bulk. The stabilization of polymorphic metallic phases can occur on a dimensional scale that ranges from single overgrowth layers to repetitive layering at the nanoscale. The sputter deposition of crystalline titanium on nickel, as both a single layer and in multilayer form, has produced a face-centered cubic phase of titanium. The atomic structure of the face-centered cubic titanium phase is examined using high resolution electron microscopy in combination with electron and x-ray diffraction.

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

Controlling Aspect Ratio of Copper Group Nanowire Arrays by Electrochemical Deposition in the Nanopores of AAO

2011 ◽  
Vol 335-336 ◽  
pp. 429-432 ◽  
Author(s):  
Xiu Yu Sun ◽  
Fa Qiang Xu
Keyword(s):  
Aspect Ratio ◽  
Nanowire Arrays ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Anodic Aluminum ◽  
Au Nanowire ◽  
The Face ◽  
Face Centered ◽  
Xrd Patterns

Highly ordered Cu, Ag and Au nanowire arrays with high aspect ratio and highly dense self-supporting nanowire patterns of copper group were successfully prepared using cyclic voltammetry with the assistance of anodic aluminum oxide (AAO) template. The X-ray diffraction (XRD) patterns of the metal nanowries were indexed to the face-centered cubic structure. The field emission scanning electron microscope (FE-SEM) results demonstrated that the length of nanowire could be controlled by changing the electrodepositon conditions. The aspect ratio of nanowire arrays can be tuned.

Highly Oriented Co Soft Magnetic Films on Si Substrates

1999 ◽  
Vol 562 ◽  
Author(s):  
Heng Gong ◽  
Wei Yang ◽  
Maithri Rao ◽  
David E. Laughlin ◽  
David N. Lambeth
Keyword(s):  
Magnetic Properties ◽  
Magnetic Films ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
Soft Magnetic ◽  
X Ray ◽  
Si Substrates ◽  
The Face ◽  
Face Centered

ABSTRACTThin Co and Co based alloy films with the face centered cubic (FCC) structure have been epitaxially grown on single crystal Si wafers by sputter deposition. Epitaxial orientation relationships have been determined by x-ray diffraction, x-ray pole figure scans and TEM. Magnetic properties have been characterized using vibrating sampling magnetometer (VSM), torque magnetometer and BH loop tracer. Soft magnetic properties have been observed for the pure Co films.

A partly disordered 2 × 2 × 2 – superstructure of γ-brass related phase in Mn–Ni–Zn system

2021 ◽  
Vol 236 (3-4) ◽  
pp. 71-80
Author(s):  
Sivaprasad Ghanta ◽  
Anustoop Das ◽  
Rajat Kamboj ◽  
Partha P. Jana
Keyword(s):  
Crystal Structure ◽  
High Symmetry ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Cubic Lattice ◽  
The Face ◽  
Face Centered ◽  
Related Phase

Abstract The T phase in the Mn–Ni–Zn system was obtained as a product of high-temperature solid-state syntheses from the loaded composition of MnxNi2−xZn11 (x = 0.2–1.5)/MnxNi15.38−xZn84.62 (x = 1.54–11.54). The crystal structure of the T phase has been explored by means of X-ray diffraction (XRD) and energy-dispersive X-ray spectroscopy (EDS). The structures were solved in the face-centered cubic space group F 4 ‾ 3 m $F‾{4}3m$ (216) and contain 409–410 atoms/unit cell. The lattice constants were found to be a = 18.1727(2) and 18.1954(1) Å for crystals C1 and C2, respectively. The crystal structure denoted the T phase is a (2aγ)3-superstructure of the ordinary cubic γ-brass-type phase. The phase is isostructural to (Fe, Ni)Zn6.5. A “cluster” description has been used to visualize the crystal structure of the title phase. The structures have been constructed by the five distinct clusters and they are situated about the high symmetry sites of the face-centered cubic lattice. The T phase is stabilized at a valance electron concentration of 1.78, which is slightly higher than those expected for typical γ-brass Hume‐Rothery compounds.

Fabrication of Nanostructured Ni Film with Superhydrophobic Property

2014 ◽  
Vol 884-885 ◽  
pp. 292-295
Author(s):  
Jin Yun Liao ◽  
Hao Li ◽  
Xi Bin Zhang
Keyword(s):  
Magnetic Field ◽  
Contact Angles ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reaction Solution ◽  
Static Contact ◽  
Superhydrophobic Property ◽  
Face Centered

Superhydrophobic film materials have recieved intensive attention owing to their wide applications in different areas. In the present study, nanostructured Ni film has been successfully fabricated with the assistance of an external magnetic field. X-ray diffraction analysis demonstrates that the as-prepared Ni film is presented in face-centered cubic phase and elmentary analysis indicates the as-prepared Ni film is pure Ni. It is found that ethanol in the reaction solution plays a key role in determing the morpholgy of the final products and ethanol is unfavourable for the formation of Ni film. The static contact angles of water on the as-prepared Ni film can reach ca. 146 o, implying that the film exhibits superhydrophobic property.

Epitaxial Influence of Textured Conducting Metal Oxide Templates on Electrodeposited Ag(Ag3O4)2N03

1992 ◽  
Vol 280 ◽  
Author(s):  
Bryan E. Breyfogle ◽  
Richard J. Phillips
Keyword(s):  
Lattice Mismatch ◽  
Substrate Surface ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Conducting Oxides ◽  
430 Stainless Steel ◽  
The Face ◽  
Face Centered ◽  
Different Thickness

ABSTRACTThe conducting oxysalt Ag(Ag3O4)2NO3 has been electrodeposited onto highly oriented conducting oxides of Tl2 03 and Pb0.8Tl0.2O1.9. T12O3 was grown in a [100] texture while the Pb0.8Tl0.2O1.9 was grown with two different thickness-dependent textures of [110] and [210]. The orientation of the Ag(Ag3O4)2NO3 crystals with respect to the substrate surface was determined by x-ray diffraction. The face-centered-cubic Ag(Ag3O4)2N03 crystals deposited on body-centered-cubic T12 03 and face-centered-cubic Pb0.8Tl0.2O1.9 followed the orientation of these prelayers. However, Ag(Ag3O4)2N03 which was electrodeposited onto polycrystalline 430 stainless steel had a nearly random orientation. The lattice mismatch is 6.6% between T12 03 and Ag(Ag3O4)2N03, and it is 7.8% between Ag(Ag3O4)2N03 and the doubled unit cell of Pb0.8Tl0.2Ol.9.

Stabilization of Thick Fcc Cobalt Layers by One Monolayer of Manganese in Co/Mn Superlattices

1998 ◽  
Vol 528 ◽  
Author(s):  
V. Pierron-Bohnes ◽  
A. Michel ◽  
J.P. Jay ◽  
P. Panissod
Keyword(s):  
Nuclear Magnetic Resonance ◽  
Magnetic Resonance ◽  
Buffer Layer ◽  
Structural Properties ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Face ◽  
Face Centered ◽  
Fcc Phase

AbstractEpitaxial Co/Mn superlattices (0.6 to 4.8 nm thick Co) have been grown on (0002) hcp Ru buffer layer on mica substrates. The face centered cubic (fcc) phase of cobalt is stabilized by the very thin manganese layer. The structural properties of these layers have been studied through x ray diffraction and nuclear magnetic resonance.

Interface structure of face-centered-cubic-Ti thin film grown on 6H–SiC substrate

2000 ◽  
Vol 15 (10) ◽  
pp. 2121-2124 ◽  
Author(s):  
Y. Sugawara ◽  
N. Shibata ◽  
S. Hara ◽  
Y. Ikuhara
Keyword(s):  
Thin Film ◽  
Orientation Relationship ◽  
High Resolution Electron Microscopy ◽  
Electron Beam Evaporation ◽  
Face Centered Cubic ◽  
High Adhesion ◽  
Resolution Electron ◽  
Face Centered ◽  
Relationship Of ◽  
High Degree

A titanium thin film was deposited on the flat (0001) face of a 6H–SiC by electron beam evaporation at room temperature in a vacuum of 5.1 × 10−8 Pa. The Ti film was epitaxially grown on the surface, and the interface between Ti and SiC was characterized by high-resolution electron microscopy. It was found that the structure of the deposited titanium is face-centered cubic (fcc), although bulk titanium metal usually has a hexagonal close-packed or body-centered cubic crystal structure. We believe that the unusual fcc structure of Ti thin film is due to the high adhesion of the film to the substrate and the high degree of coherency between them. The orientation relationship of the fcc-Ti/6H–SiC interface was (111)fcc-Ti//(0001)6H–SiC and [110]fcc-Ti//[1120]6H−SiC. Preliminary calculations indicate that this orientation relationship maximizes the lattice coherency across the interface.

Theoretical and experimental study of the gradient properties and the resulting local crystalline structure and orientation in magnetron-sputtered CrAlN coatings with lateral composition and thickness gradient

2017 ◽  
Vol 50 (4) ◽  
pp. 1000-1010
Author(s):  
Bärbel Krause ◽  
Michael Stüber ◽  
Anna Zimina ◽  
Ralph Steininger ◽  
Mareike Trappen ◽  
...  
Keyword(s):  
Target Surface ◽  
Sample Surface ◽  
Composition Gradient ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Al Content ◽  
Spatially Resolved ◽  
Composition Profiles ◽  
Face Centered

Cr–Al–N coatings with a lateral composition gradient were deposited from two segmented Cr/Al targets with different segment size, thus covering the Al content range 0.22 ≲ c ≲ 0.87 and a thickness range from several hundred nanometres to several micrometres. The two-dimensional thickness and composition profiles were determined nondestructively from X-ray fluorescence maps. The results were reproduced by simulations of the flux distribution on the sample surface, combiningTRIDYNsimulations of the reactive sputter process at the target surface andSIMTRAsimulations of the subsequent transport through the gas phase. The phase formation was studied by spatially resolved X-ray diffraction and X-ray absorption spectroscopy at the Cr Kedge. Forc ≲ 0.69, a single-phase solid solution face-centered cubic (f.c.c.) (Cr,Al)N phase was found, and for 0.69 ≲ c ≲ 0.87 coexisting f.c.c. (Cr,Al)N and hexagonal close packed (h.c.p.) (Cr,Al)N phases were observed. The biaxial texture formation in nearly the entire composition range indicates a zone T growth. Four, mainly composition-dependent, texture regions were identified. All observed textures are closely related to textures reported for the h.c.p. AlN and f.c.c. CrN parent phases. Forc ≳ 0.69, a strong thickness dependence of the textures was observed. The measurements reveal an orientation relation between different f.c.c. and h.c.p. textures, indicating that local epitaxy might play a role in the structure formation.

Thermal Stability and Failure Mechanisms of Au/Tiw(N)/Si and Au/TiW(N)/Si02/Si Systems

1996 ◽  
Vol 427 ◽  
Author(s):  
C. R. Chen ◽  
L. J. Chen
Keyword(s):  
Thermal Stability ◽  
Failure Mechanisms ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
Transmission Electron ◽  
Single Face ◽  
Face Centered ◽  
The Stability ◽  
Ar Gas

AbstractThermal stability and failure mechanisms of Au/TiW(N)/Si and Au/TiW(N)/SiO2/Si systems have been studied by both conventional and high-resolution transmission electron microscopy, X- ray diffraction and Auger electron spectroscopy. For films deposited in Ar gas containing 20% N2, a single face-centered-cubic phase was the only crystalline phase detected to form. The samples were found to remain stable after annealing at 700 °C for 30 min. The stability temperature for Au/TiW(N)(Ar:N2=80:20)/SiO2/Si samples was found to be higher than those of Au/TiW(N) (Ar:N2=90:10)/SiO2/Si and Au/TiW/SiO2/Si samples.

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