Optical properties of polymeric thin films grown by chemical vapor deposition

1996 ◽  
Vol 11 (1) ◽  
pp. 236-242 ◽  
Author(s):  
Justin F. Gaynor ◽  
Seshu B. Desu

For the first time, the refractive index of polyparaxylylene films, the only polymers grown commercially by chemical vapor deposition (CVD), is reported throughout the visible spectrum. This information is required if optical components such as antireflective coatings or waveguides are to be fabricated with CVD polymers. These properties are compared to a low-index CVD copolymer, poly(parachloroxylylene-co-perfluorooctyl methacrylate), invented in our laboratory. The ellipsometric constants psi and delta were measured for wavelengths between 400 nm and 1000 nm using variable angle spectroscopic ellipsometry; many samples of each film were grown to improve statistics. The data were modeled assuming a birefringent Cauchy dispersion; excellent agreement between models and experimental data was obtained. The refractive index (λ = 632.8 nm) of the copolymer in the film plane was 1.389, compared to 1.645–1.665 for the homopolymers. PPX, PPX-C, and the copolymer showed negative birefringence, while PPX-D showed positive bifringence. The optical properties of PPX showed little thickness dependence for films ranging from 36 nm to 2100 nm thick.

2004 ◽  
Vol 43 (No. 6A) ◽  
pp. L698-L701 ◽  
Author(s):  
Marco Sacilotti ◽  
Luc Imhoff ◽  
Colette Dumas ◽  
Pierre Viste ◽  
Jean-Claude Vial ◽  
...  

2018 ◽  
Vol 780 ◽  
pp. 57-61 ◽  
Author(s):  
K.A. Mat-Sharif ◽  
Nasr Y.M. Omar ◽  
M.I. Zulkifli ◽  
S.Z. Muhd-Yassin ◽  
Y.K. Sin ◽  
...  

This paper presents the progress in the fabrication of highly doped thulium silica fiber. As much as 5.3 wt. % Tm alongside 7.1 wt. % Al (co-dopant) were incorporated into silica preform. The preform was fabricated using the Modified Chemical Vapor Deposition (MCVD)-chelate vapor delivery with soot-dopant stepwise technique. The preform was analyzed for several key properties such as refractive index variation along deposition length, dopants distribution profiles and UV-Vis absorption. The results showed a homogeneous dopants distribution with 4% RSD in the longitudinal refractive index along a 40 cm preform length. The UV-Vis absorption spectrum exhibited a strong absorption peak at 790 nm attributed to Tm 3H4 energy manifold.


1999 ◽  
Vol 4 (S1) ◽  
pp. 634-641 ◽  
Author(s):  
M. Sumiya ◽  
T. Ohnishi ◽  
M. Tanaka ◽  
A. Ohtomo ◽  
M. Kawasaki ◽  
...  

Control of the polarity of GaN films deposited by metalorganic chemical vapor deposition was achieved by substrate nitridation and subsequent annealing of a buffer layer. The surface morphology and optical properties of 1.2μm GaN films were influenced by the different growth mode due to the polar direction. Coaxial impact collision ion scattering spectroscopy revealed that the polarity composition of a buffer layer on nitrided sapphire varied by annealing in a H2 atmosphere. It was considered that the systematic variation of the surface morphology was caused by the polarity composition of the buffer layer.


1995 ◽  
Vol 77 (12) ◽  
pp. 6534-6541 ◽  
Author(s):  
Sadanand V. Deshpande ◽  
Erdogan Gulari ◽  
Steven W. Brown ◽  
Stephen C. Rand

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