Peculiarities in the Texture Formation of Intermetallic Compounds Deformed by High Pressure Torsion

2014 ◽  
Vol 1760 ◽  
Author(s):  
Christine Tränkner ◽  
Aurimas Pukenas ◽  
Jelena Horky ◽  
Michael Zehetbauer ◽  
Werner Skrotzki
Keyword(s):  
High Pressure ◽  
High Pressure Torsion ◽  
Electron Backscatter Diffraction ◽  
High Energy ◽  
X Ray ◽  
Local Texture ◽  
Large Rotations ◽  
Electron Backscatter ◽  
Shear Strains ◽  
Backscatter Diffraction

ABSTRACTNiAl, YCu and TiAl polycrystals with B2 and L10 structure, respectively, have been deformed by high pressure torsion (HPT) at temperatures between 20°C and 500°C at a hydrostatic pressure of 8 GPa to high shear strains. Local texture measurements were done by diffraction of high-energy synchrotron radiation and X-ray microdiffraction. In addition, the microstructure was analyzed by electron backscatter diffraction (EBSD). Besides typical shear components an oblique cube component is observed with quite large rotations about the transverse direction. Based on the temperature dependence of this component as well as on microstructure investigations it is concluded that it is formed by discontinuous dynamic recrystallization. The influence of high pressure on recrystallization of intermetallics at low temperatures is discussed.

Texture Evolution of HPT-Processed Ni50Mn29Ga21

2011 ◽  
Vol 702-703 ◽  
pp. 169-172 ◽  
Author(s):  
Robert Chulist ◽  
Andrea Böhm ◽  
E. Rybacki ◽  
T. Lippmann ◽  
C.G. Oertel ◽  
...  
Keyword(s):  
High Pressure ◽  
Hydrostatic Pressure ◽  
Synchrotron Radiation ◽  
High Pressure Torsion ◽  
Electron Backscatter Diffraction ◽  
Texture Evolution ◽  
Residual Austenite ◽  
High Energy ◽  
Electron Backscatter ◽  
Backscatter Diffraction

The texture of polycrystalline Ni50Mn29Ga21alloys fabricated by high pressure torsion (HPT) was investigated with high-energy synchrotron radiation. HPT was performed at temperatures between 873K and 1173K under a hydrostatic pressure of 400 MPa. During HPT above 973K the initial cyclic fibre texture changes to a strong cube and a weak F component. Below 973K a strong rotated cube and weak F and C components develop. Additionally, electron backscatter diffraction reveals that samples deformed at low temperature do not completely transform to martensite giving rise to residual austenite.

An Investigation of Microtexture Evolution in an AlMgSi Alloy Processed by High-Pressure Torsion

2011 ◽  
Vol 702-703 ◽  
pp. 165-168 ◽  
Author(s):  
Aicha Loucif ◽  
Thierry Baudin ◽  
François Brisset ◽  
Roberto B. Figueiredo ◽  
Rafik Chemam ◽  
...  
Keyword(s):  
Grain Size ◽  
High Pressure ◽  
Distribution Function ◽  
High Pressure Torsion ◽  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Homogeneous Microstructure ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Almgsi Alloy

This investigation uses electron backscatter diffraction (EBSD) to study the development of microtexture with increasing deformation in an AlMgSi alloy having an initial grain size of about 150 µm subjected to high pressure torsion (HPT) up to a total of 5 turns. An homogeneous microstructure was achieved throughout the disc sample at high strains with the formation of ultra-fine grains. Observations based on orientation distribution function (ODF) calculation reveals the presence of the torsion texture components often reported in the literature for f.c.c. materials. In particular, the C {001}<110> component was found to be dominant. Furthermore, no significant change in the texture sharpness was observed by increasing the strain.

Role of Texture in Understanding Creep Flow in HPT-Processed Ultrafine Grained Copper

2011 ◽  
Vol 702-703 ◽  
pp. 370-373
Author(s):  
Jörn Leuthold ◽  
Matthias Wegner ◽  
Sergiy V. Divinski ◽  
K. Anantha Padmanabhan ◽  
Daria Setman ◽  
...  
Keyword(s):  
High Pressure ◽  
High Pressure Torsion ◽  
Electron Backscatter Diffraction ◽  
Tensile Elongation ◽  
Tensile Creep ◽  
Creep Flow ◽  
Ultrafine Grained ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Disks of copper samples were produced by High Pressure Torsion (HPT). Specimens for tensile creep experiments were cut from the disks and subjected to creep deformation at 348 K to obtain elongations greater than 30%. Electron backscatter diffraction (EBSD) was used to analyze the texture after HPT deformation and after additional tensile elongation.

scholarly journals Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

2019 ◽  
Vol 52 (4) ◽  
pp. 828-843 ◽  
Author(s):  
Dorian Delbergue ◽  
Damien Texier ◽  
Martin Lévesque ◽  
Philippe Bocher
Keyword(s):  
Residual Stress ◽  
Grain Size ◽  
Tilt Angle ◽  
Measurement Errors ◽  
Electron Backscatter Diffraction ◽  
Measurement Techniques ◽  
Single Exposure ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

X-ray diffraction (XRD) is a widely used technique to evaluate residual stresses in crystalline materials. Several XRD measurement methods are available. (i) The sin2ψ method, a multiple-exposure technique, uses linear detectors to capture intercepts of the Debye–Scherrer rings, losing the major portion of the diffracting signal. (ii) The cosα method, thanks to the development of compact 2D detectors allowing the entire Debye–Scherrer ring to be captured in a single exposure, is an alternative method for residual stress measurement. The present article compares the two calculation methods in a new manner, by looking at the possible measurement errors related to each method. To this end, sets of grains in diffraction condition were first identified from electron backscatter diffraction (EBSD) mapping of Inconel 718 samples for each XRD calculation method and its associated detector, as each method provides different sets owing to the detector geometry or to the method specificities (such as tilt-angle number or Debye–Scherrer ring division). The X-ray elastic constant (XEC) ½S 2, calculated from EBSD maps for the {311} lattice planes, was determined and compared for the different sets of diffracting grains. It was observed that the 2D detector captures 1.5 times more grains in a single exposure (one tilt angle) than the linear detectors for nine tilt angles. Different XEC mean values were found for the sets of grains from the two XRD techniques/detectors. Grain-size effects were simulated, as well as detector oscillations to overcome them. A bimodal grain-size distribution effect and `artificial' textures introduced by XRD measurement techniques are also discussed.

Comparison of Workability of ZK60A Alloy Depending on Casting Methods

2012 ◽  
Vol 630 ◽  
pp. 35-40
Author(s):  
K.H. Jung ◽  
B. Ahn ◽  
S. Lee ◽  
D.S. Choi ◽  
Y.S. Lee ◽  
...  
Keyword(s):  
Magnesium Alloy ◽  
Continuous Casting ◽  
Elevated Temperatures ◽  
Electron Backscatter Diffraction ◽  
Die Casting ◽  
Inspection System ◽  
Compression Tests ◽  
X Ray ◽  
Electron Backscatter ◽  
Backscatter Diffraction

In this research, the effect of casting methods on the workability of magnesium alloy ZK60A was investigated by comparing two different billets, fabricated by semi-continuous casting and die casting. To determine the workability of the materials, uniaxial compression tests were conducted at different elevated temperatures and strain rate of 0.01/s. In addition, the X-ray inspection system and electron backscatter diffraction (EBSD) were employed to compare their internal defects and microstructures, respectively. The workability of ZK60A depending on the casting methods is discussed based on the obtained experimental results.

scholarly journals Effect of TiO2-Nanoparticles on Ni Electrodeposition on Copper Wire

Metals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 406
Author(s):  
Samiha Saad ◽  
Zakaria Boumerzoug ◽  
Anne Laure Helbert ◽  
François Brisset ◽  
Thierry Baudin
Keyword(s):  
Surface Morphology ◽  
Tio2 Nanoparticles ◽  
Vickers Microhardness ◽  
Electron Backscatter Diffraction ◽  
Copper Wire ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electron Backscatter ◽  
Electrodeposited Nickel ◽  
Backscatter Diffraction

The objective of this work is to study, on a copper wire, the effect of TiO2-nanoparticles on electrodeposited nickel. Both the microstructure and surface morphology (texture) of the coating were investigated. This deposit is obtained from baths of sulfated electroplating Watts. The Ni-TO2 composite coating is deposited at a temperature of 45 °C. The composite deposit is prepared by adding nanoparticles of TiO2 to the electrolyte. The characterization has been carried out by X-ray diffraction, scanning electron microscopy, microhardness measurements, and electron backscatter diffraction (EBSD). Vickers microhardness was used to characterize the mechanical properties of the electrodeposited nickel. The results showed the effects of the TiO2 on the composition, the surface morphology, and the hardness of the deposited layer. However, there was not an effect of TiO2 nanoparticles on texture.

Sign in / Sign up

Export Citation Format

Share Document