Development of Variable Temperature Scanning Microwave Microscope for High Throughput Materials Characterization

2005 ◽  
Vol 894 ◽  
Author(s):  
Noriaki Okazaki ◽  
Sohei Okazaki ◽  
Ryota Takahashi ◽  
Makoto Murakami ◽  
Parhat Ahmet ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
High Throughput ◽  
Variable Temperature ◽  
Combinatorial Libraries ◽  
Materials Characterization ◽  
Easy Method ◽  
Coaxial Cavity ◽  
Microwave Microscope ◽  
Temperature Scanning

AbstractWe developed a variable-temperature scanning microwave microscope (VT-SμM) that can perform high-throughput materials characterization in the temperature range between 4K and room temperature. As a sensor probe we used a high-Q coaxial cavity resonator, which was mounted on the low-temperature stage to allow variable-temperature measurements. We carried out systematic studies on the thermal degradation of the conducting polymers using the combinatorial libraries of polyaniline and polythiophene thin films, which showed rapid decrease of conductivity above 300C and 250C, respectively. The low-temperature performance of the VT-SμM was demonstrated by the measurement of composition-spread Nd1-xSrxMnO3 thin film, for which we succeeded in detecting the clear metal-insulator transition at 100K. We also propose a simple and easy method for the quantitative analysis of conductive thin films, by using the standard composition-spread thin films of Ti1-xNbxO2.

High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7−δ thin film by the low-temperature scanning microwave microscope

2006 ◽  
Vol 252 (7) ◽  
pp. 2615-2621 ◽  
Author(s):  
Sohei Okazaki ◽  
Noriaki Okazaki ◽  
Xiaoru Zhao ◽  
Hidetaka Sugaya ◽  
Sei-ichiro Yaginuma ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
High Throughput ◽  
Microwave Microscope ◽  
Local Conductivity ◽  
Temperature Scanning

Low temperature scanning tunneling microscopy and spectroscopy of the PbSe:Cl thin films

1996 ◽  
Vol 46 (S5) ◽  
pp. 2487-2488
Author(s):  
Serguei A. Rykov ◽  
Valery A. Zykov ◽  
Tatyana A. Gavrikova
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Temperature Scanning

Mapping of local electronic properties in nanostructured CMR thin films by Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP)

2004 ◽  
Vol 838 ◽  
Author(s):  
Sohini Kar ◽  
Barnali Ghosh ◽  
L. K. Brar ◽  
M A. Paranjape ◽  
A. K. Raychaudhuri
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
Grain Boundaries ◽  
Electronic Properties ◽  
Variable Temperature ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Colossal Magnetoresistive ◽  
Spatially Resolved ◽  
Temperature Scanning

ABSTRACTWe have investigated the local electronic properties and the spatially resolved magnetoresistance of a nanostructured film of a colossal magnetoresistive (CMR) material by local conductance mapping (LCMAP) using a variable temperature Scanning Tunneling Microscope (STM) operating in a magnetic field. The nanostructured thin films (thickness ≈500nm) of the CMR material La0.67Sr0.33MnO3(LSMO) on quartz substrates were prepared using chemical solution deposition (CSD) process. The CSD grown films were imaged by both STM and atomic force microscopy (AFM). Due to the presence of a large number of grain boundaries (GB's), these films show low field magnetoresistance (LFMR) which increases at lower temperatures.The measurement of spatially resolved electronic properties reveal the extent of variation of the density of states (DOS) at and close to the Fermi level (EF) across the grain boundaries and its role in the electrical resistance of the GB. Measurement of the local conductance maps (LCMAP) as a function of magnetic field as well as temperature reveals that the LFMR occurs at the GB. While it was known that LFMR in CMR films originates from the GB, this is the first investigation that maps the local electronic properties at a GB in a magnetic field and traces the origin of LFMR at the GB.

scholarly journals Temperature-Dependent Accommodation of Two Lattices of Largely Different Size during Growth

Nanomaterials ◽  
2019 ◽  
Vol 9 (5) ◽  
pp. 710
Author(s):  
Carsten Sprodowski ◽  
Karina Morgenstern
Keyword(s):  
Low Temperature ◽  
Variable Temperature ◽  
Lattice Misfit ◽  
Scanning Tunneling ◽  
Temperature Structure ◽  
Misfit Dislocations ◽  
Tunneling Microscopy ◽  
Large Lattice ◽  
Higher Temperature ◽  
Temperature Scanning

If a material grows on another material with a largely different lattice constant, which of the two adapts for an energetically favorable growth? To tackle this question, we investigate the growth of Ag on Cu(111) by variable temperature scanning tunneling microscopy. The structures grown between 120 and 170 K are remarkably different from those grown between 200 and 340 K. The low-temperature structure is rectangular-like and consists of stacked rods, 7 to 8 Ag atoms long, which form a superstructure without long-range order. This structure covers the whole surface prior to nucleation of further layers. The high-temperature structure is hexagonal and consists of misfit dislocations forming 8 × 8 to 10 × 10 superstructures. For this structure, second layer nucleation sets in far before the closure of the first monolayer. While both structures are driven by the large lattice misfit between the two materials, the growing Ag layer adapts to the Cu surface at low temperature, while the Cu surface adapts to the growing Ag layer at higher temperature.

The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures

2003 ◽  
Vol 804 ◽  
Author(s):  
Sohei Okazaki ◽  
Noriaki Okazaki ◽  
Hidetaka Sugaya ◽  
Xiaoru Zhao ◽  
Ken Hasegawa ◽  
...  
Keyword(s):  
Quality Factor ◽  
High Throughput ◽  
Low Temperatures ◽  
Variable Temperature ◽  
Electric Properties ◽  
High Q ◽  
Conducting Materials ◽  
Microwave Microscope ◽  
Sensor Probe

ABSTRACTWe developed a scanning microwave microscope (SμM) designed for characterizing local electric properties at low temperatures. A high-Q λ/4coaxial cavity was used as a sensor probe, which can detect the change of quality factor due to the tip-sample interaction with enough accuracy. From the measurements of combinatorial samples, it was demonstrated that this SμM system has enough performance for high-throughput characterization of sample conductance under variable temperature conditions.

Influence of Cu adatoms on the molecular assembly of 4,4′-bipyridine on Cu(111)

2018 ◽  
Vol 20 (22) ◽  
pp. 15350-15357 ◽  
Author(s):  
M.-A. Dubois ◽  
O. Guillermet ◽  
S. Gauthier ◽  
G. Zhan ◽  
Y. Makoudi ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
First Principles ◽  
Variable Temperature ◽  
Molecular Assembly ◽  
Scanning Tunneling ◽  
First Principles Calculations ◽  
Tunneling Microscopy ◽  
Temperature Scanning

The formation of highly organized structures based on two ligands with pyridyl functionalities, 4,4′-bipyridine (BPY) and 1,4-di(4,4′′-pyridyl) benzene (BPYB), and Cu adatoms on the Cu(111) surface has been studied with low temperature and variable temperature scanning tunneling microscopy (STM) and first-principles calculations.

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