Effects of Carbon Ion on Glassy Carbon Electrode as Chemical Sensor

2009 ◽  
Vol 1204 ◽  
Author(s):  
Bopha Chhay ◽  
Lynn Bowman ◽  
Daryush Ila
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Sensor ◽  
High Energy ◽  
Carbon Electrode ◽  
Carbon Ions ◽  
Carbon Ion ◽  
Force Microscopy ◽  
Before And After ◽  
Work Done ◽  
Polymeric Carbon

AbstractGlassy polymeric carbon (GPC) is a material commonly used for making electrodes for cyclic voltammetric (CV) and amperometric measurements. Previous work done at Alabama A&M University (AAMU) has shown that high energy ion beams can be used to improve the physical properties of GPC in general. In this work, we fabricated a glassy polymeric carbon electrode and we used carbon ions to activate it. Surface analyses including Raman spectroscopy, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) were performed to compare the changes in surface morphology and structure before and after carbon ion bombardment.

Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
X Ray Diffraction ◽  
Carbon Phase ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

Preparation of Ge (100) Substrates for High-Quality Epitaxial Growth of Group IV Materials

2003 ◽  
Vol 794 ◽  
Author(s):  
Mark Nowakowski ◽  
Jordana Bandaru ◽  
L.D. Bell ◽  
Shouleh Nikzad
Keyword(s):  
Epitaxial Growth ◽  
Chemical Treatment ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
Ozone Treatment ◽  
High Quality ◽  
Surface Evolution ◽  
Chemical Treatments ◽  
Before And After ◽  
Uv Ozone

ABSTRACTWe compare various wet chemical treatments, in preparing high-quality Ge (100) surfaces suitable for molecular beam epitaxy (MBE). Various surface treatments are explored such as UV-ozone treatment followed by exposure to chemical solutions such as de-ionized (DI) water, hydrofluoric acid (HF), or hydrochloric acid (HCl). Chemical treatments to remove the oxide are performed in a nitrogen environment to prevent further formation of surface oxide prior to surface analysis. Following chemical treatments, in situ reflection high-energy electron diffraction (RHEED) analysis is performed to observe the surface evolution as a function of temperature. In a separate chamber, we analyze each sample, before and after chemical treatment by x-ray photoelectron spectroscopy (XPS) to directly determine the oxide desorption following each chemical treatment. Our results of this comparative study, the effectiveness of each chemical treatment, and the stability of the passivated surface suggest that UV ozone cleaning, followed by 10% HCl is the best choice for removing most of the oxide. Furthermore, we present evidence of high quality epitaxial growth of SnxGe1−x on wafers prepared by our method.

Epitaxial Dy2O3 Thin Films Grown on Ge(100) Substrates by Molecular Beam Epitaxy

2010 ◽  
Vol 1252 ◽  
Author(s):  
Md. Nurul Kabir Bhuiyan ◽  
Mariela Menghini ◽  
Christel Dieker ◽  
Jin Won Seo ◽  
Jean-Pierre Locquet ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Photoelectron Spectroscopy ◽  
Molecular Beam ◽  
High Mobility ◽  
High Energy ◽  
Epitaxial Relationship ◽  
Dysprosium Oxide ◽  
X Ray ◽  
Force Microscopy ◽  
Diffraction Patterns

AbstractDysprosium oxide (Dy2O3) films are grown epitaxially on high mobility Ge(100) substrates by molecular beam epitaxy system. Reflection high energy electron diffraction patterns and X-ray diffraction spectra show that single crystalline cubic Dy2O3 films are formed on Ge(100) substrates. The epitaxial-relationship is identified as Dy2O3 (110)║Ge(100) and Dy2O3 [001]║Ge[011]. Atomic force microscopy results show that the surface of the Dy2O3 film is uniform, flat and smooth with root mean square surface roughness of about 4.6Å. X-ray photoelectron spectroscopy including depth profiles confirms the composition of the films being close to Dy2O3. TEM measurements reveal a sharp, crystalline interface between the oxide and Ge.

Surface Functionalisation of Polyester Nonwoven Fabrics by Sputter Coating of Titanium Dioxide

2009 ◽  
Vol 17 (6) ◽  
pp. 347-351 ◽  
Author(s):  
Yang Xu ◽  
Ning Wu ◽  
Qufu Wei ◽  
Libo Chu
Keyword(s):  
Titanium Dioxide ◽  
Photoelectron Spectroscopy ◽  
Chemical Compositions ◽  
Sem Images ◽  
Xps Spectra ◽  
Force Microscopy ◽  
Nonwoven Fabrics ◽  
Significant Difference ◽  
Sputter Coating ◽  
Before And After

Titanium dioxide (TiO2) functional films were deposited on the surface of polyester nonwoven fabrics at room temperature by direct current (DC) reactive magnetron sputtering. Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) were employed to study the topographies and chemical compositions of the functional fabric surfaces, respectively. Scanning electron microscopy (SEM) was used to investigate the interfacial microstructures and adhesion between the substrate and TiO2 coating. The AFM observations indicated that there was a significant difference in the surface morphology of the polyester fibres before and after TiO2 sputter coating. XPS spectra reflected the chemical features of the deposited TiO2 nanostructures. The SEM images showed that TiO2 thin films deposited on the substrate under confirmed processing conditions had unique, fine surfaces and good adhesion to the substrate. It was found that the deposition of TiO2 on the polyester nonwoven fabrics significantly improved their ultraviolet (UV) absorption and antistatic properties.

Epitaxial Growth and Characterization of NbxTi1−xO2 Rutile Films by Oxygen-Plasma-Assisted Molecular Beam Epitaxy

1995 ◽  
Vol 401 ◽  
Author(s):  
Y. Gao ◽  
S. A. Chambers
Keyword(s):  
Molecular Beam Epitaxy ◽  
Photoelectron Spectroscopy ◽  
Oxygen Plasma ◽  
Molecular Beam ◽  
High Energy ◽  
Epitaxial Films ◽  
Layer By Layer ◽  
Force Microscopy ◽  
Atomic Force

AbstractEpitaxial films of NbxTi1−xO2 rutile were grown on TiO2 (110) and (100) at 600 °C by oxygen-plasma-assisted molecular beam epitaxy using elemental Ti and Nb sources. The epitaxial films were characterized by means of reflection high-energy and low-energy electron diffraction (RHEED/LEED), x-ray photoelectron spectroscopy and diffraction (XPS/XPD), ultraviolet photoemission spectroscopy (UPS) and atomic force microscopy (AFM). The epitaxial films grow in a layer-by-layer fashion and have excellent short- and long-range structure order at x≤0.3 on TiO2(110) and at x≤0.15 on TiO2(100). However, the epitaxial films become rough and disorder at higher doping levels. Nb substitutionally incorporates at cation lattice sites, leading to NbxTi1−xO2 solid solutions. In addition, the oxidation state of Nb in the NbxTi1−xO2 films has been determined to be +4.

scholarly journals Атомный состав и морфология тонких пленок ресвератрола на поверхности окисленного кремния и поликристаллического золота

2019 ◽  
Vol 61 (3) ◽  
pp. 598
Author(s):  
А.С. Комолов ◽  
Э.Ф. Лазнева ◽  
Н.Б. Герасимова ◽  
В.С. Соболев ◽  
Ю.А. Панина ◽  
...  
Keyword(s):  
Surface Area ◽  
Photoelectron Spectroscopy ◽  
Sample Surface ◽  
Total Surface Area ◽  
Contact Mode ◽  
Force Microscopy ◽  
Scanning Area ◽  
Before And After ◽  
The Stability ◽  
Substrate Surfaces

AbstractThe atomic composition of films of a polyphenol antioxidant, namely, resveratrol (RVL), with a thickness of up to 50 nm thermally deposited on an oxidized silicon surface is studied by the method of X-ray photoelectron spectroscopy (XPS). It is found that the surface area of pores in the RVL film is about 15% of the total surface area. The results of studying the stability of the RVL films when their surface is treated with Ar^+ ions of 3 keV under the electric current of 1 μA passing through the sample for 30 s are given. The treatment gives rise to an increase in the area of pores to 30–40%, while the ratio of the concentration of C atoms to the concentration of O atoms in the RVL film both before and after the treatment of the surface with ions does not correspond to the chemical formula of RVL molecules. Using the method of atomic force microscopy (AFM) in contact mode with a scanning area size of about 10 × 10 μm, RVL coatings deposited on the oxidized silicon and polycrystalline Au surfaces are studied. It is found that the RVL films produce grainy and porous coatings on the substrate surfaces. The typical size of grains in the sample surface plane is 150–300 nm, and the characteristic elevation reaches 30 nm.

Surface Changes after Silver Formation on a Precoated Surface with Polyaniline for Textile Metallization

2012 ◽  
Vol 441 ◽  
pp. 304-308
Author(s):  
Ya Ping Zhao ◽  
Zai Sheng Cai ◽  
Xiao Lan Fu
Keyword(s):  
Photoelectron Spectroscopy ◽  
Atomic Emission ◽  
Attenuated Total Reflection ◽  
Metallic Elements ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Ag Deposition ◽  
Surface Changes

Silver (Ag) deposition was performed on a polyaniline-precoated surface for textile metallization. Polyaniline was utilized as an intermediate layer on fabrics to facilitate Ag formation. Inductivily coupled plasma atomic emission spectgrometry (ICP-AES) was used to monitor the content of metallic elements on Ag-laden polyaniline layers prepared under different conditions of polyaniline fomation. The surface modification of the samples before and after Ag plating was characterized by attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR), X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM) and atomic force microscopy (AFM).

KrF Pulsed Laser Ablation of Thin Films Made from Fluorinated Heterocyclic Poly(Naphthyl-Imide)s

2012 ◽  
Vol 18 (3) ◽  
pp. 545-557 ◽  
Author(s):  
Mariana-Dana Damaceanu ◽  
Radu-Dan Rusu ◽  
Mihaela Adriana Olaru ◽  
Daniel Timpu ◽  
Maria Bruma
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Photoelectron Spectroscopy ◽  
Thermal Reaction ◽  
Polyimide Films ◽  
Time Resolved ◽  
Force Microscopy ◽  
Laser Fluences ◽  
Before And After ◽  
The Many

AbstractAmong the many aspects of laser ablation, development of conical structures induced by excimer laser radiation on polyimide surfaces has been thoroughly investigated. Because the mechanisms that produce these surface textures are not fully understood, two theories, photochemical bond breaking and thermal reaction, have been introduced. Here we present the first study of ultraviolet laser ablation behavior of thin films made from fluorinated poly(naphthyl-imide)s containing oxadiazole rings and the investigation of the mechanism of cone-like structure formation at two laser fluences, 57 and 240 mJ/cm2. The morphology of thin films before and after laser ablation was studied by using various spectroscopy techniques such as Fourier transform infrared spectroscopy, time-resolved emission and X-ray photoelectron spectroscopy, atomic force microscopy, and contact angle measurements. All of the data suggest impurities shielded at low fluence radiation (57 mJ/cm2) and a radiation hardening process at high value fluence (240 mJ/cm2), which are proposed as the main mechanisms for laser ablation of our polyimide films, and we bring evidence to support them.

Influence of implantation of heavy metallic ions on the mechanical properties of two polymers, polystyrene and polyethylene terephthalate

1997 ◽  
Vol 12 (7) ◽  
pp. 1917-1926 ◽  
Author(s):  
Michael V. Swain ◽  
Anthony J. Perry ◽  
James R. Treglio ◽  
Alex Elkind ◽  
J. Derek Demaree
Keyword(s):  
Mechanical Properties ◽  
Polyethylene Terephthalate ◽  
High Energy ◽  
Metallic Ions ◽  
Maximum Hardness ◽  
Gradual Decline ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Indenter Penetration

Ion implantation of polyethylene terephthalate (PET) and polystyrene (PS) with various high energy metallic ions at 70 kV and a dose of 3 × 1016 ions/cm2 has been made. Measurements of the mechanical properties of the polymers before and after implantation have been made with an ultra microindentation system using both pointed and a small (2 μm) radius spherical-tipped indenter. The surface regions were also investigated by atomic force microscopy (AFM) and Rutherford backscattering (RBS). Significant differences have been observed between the Ti–B dual-implanted surfaces and those of the Au and W implanted surfaces. For both the PET and PS, the resistance to indenter penetration at very low loads was much greater for the Ti–B dual-implanted surfaces. The estimated maximum hardness and modulus of the implanted materials were 0.3 and 8 GPa for the PET material and 1.4 and 16 GPa for the PS material. The results obtained with the spherical indenter show a gradual decline in effective modulus of the surface with penetration depth, whereas the hardness or contact pressure goes through a maximum before declining asymptotically to the bulk values. The values of hardness estimated for the spherical-tipped indenter are somewhat more conservative than the optimistic estimates with the Berkovich indenter. The improved increase in hardness for the Ti–B dual-implanted PET material scales with the RBS measured increased depth of implantation.

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