Spectral Sensitivities of X-Ray Diffraction to the Roughness of Si/SiO2 Interfaces

1995 ◽  
Vol 399 ◽  
Author(s):  
K.W. Evans-Lutterodt ◽  
Mau-Tsu Tang
Keyword(s):  
Momentum Transfer ◽  
Root Mean Square ◽  
Spectral Distribution ◽  
Root Mean Square Roughness ◽  
Mean Square ◽  
X Ray Diffraction ◽  
X Ray ◽  
Interface Fluctuations

ABSTRACTResults from X-ray diffraction studies of the morphology of the growing Si(001 )/SiO2 interface are presented. We show the evolution of the root mean square roughness as a function of the growth variables, and we try to go beyond the root mean square parametrization of the interface by measuring the spectral distribution of interface fluctuations. Within our current experimental sensitivies we cannot resolve any fluctuations with a finite in-plane momentum transfer.

The Effect of Cold-Work on the X-Ray Diffraction Pattern of a Copper-Silicon-Manganese Alloy

1962 ◽  
Vol 6 ◽  
pp. 96-120 ◽  
Author(s):  
D. O. Welch ◽  
H. M. Otte
Keyword(s):  
Root Mean Square ◽  
Room Temperature ◽  
Tensile Deformation ◽  
Cold Work ◽  
Stacking Faults ◽  
Wire Drawing ◽  
X Rays ◽  
Mean Square ◽  
X Ray Diffraction ◽  
X Ray

AbstractPlastic deformation of metals produces a state characterized by the presence of residual elastic strains, small domains which diffract X-rays coherently, and often stacking faults; these effects may be studied with X-ray diffraction techniques. Changes in the lattice parameter, shifts in the relative positions of diffraction lines, and the broadening of diffraction lines were used to study the state of coldwork resulting in Cu-6.6 at.%Si-1.2 at.%Mn after deformation by filing, wiredrawing, and uniaxial tension at room temperature.Both filing and wire-drawing produce large root-mean-square strains and stacking faults, whereas deformation by tension up to 22% extension fails to produce any clear evidence of faulting or root-mean-square strains. Tensile deformation causes fragmentation of coherent domains to an average dimension of 250 Å after 22% extension, and results in a radial, tensile, residual macrostrain arising from a smaller rate of work hardening in the surface layers than in the interior. Wire drawing also results in a residual macrostrain system. Deformation appears to enhance diffusion and promote solute clustering at room temperature.

Study of Terminated Species on 4H-SiC (0001) Surfaces Planarized by Catalyst-Referred Etching

2013 ◽  
Vol 740-742 ◽  
pp. 510-513 ◽  
Author(s):  
Pho Van Bui ◽  
Shun Sadakuni ◽  
Takeshi Okamoto ◽  
Kenta Arima ◽  
Yasuhisa Sano ◽  
...  
Keyword(s):  
Root Mean Square ◽  
Photoelectron Spectroscopy ◽  
Wafer Surface ◽  
Root Mean Square Roughness ◽  
Mean Square ◽  
Process Of Care ◽  
Xps Spectra ◽  
X Ray ◽  
Etching Mechanism ◽  
Sic Wafer

Our group has developed a novel abrasive-free planarization technique known as catalyst-referred etching (CARE). It can produce flat, undamaged, and smooth SiC surfaces with a root-mean-square roughness of less than 0.1 nm over a whole wafer. This study investigates the etching mechanism of CARE by performing X-ray photoelectron spectroscopy (XPS) measurements to determine the termination species of CARE-processed SiC surfaces. We compared XPS spectra of a CARE-processed surface with those of an as-received SiC surface that had been treated with 50% HF solution. XPS spectra of the CARE-processed wafer contain the F 1s core level, whereas those of an as-received SiC wafer surface did not. This indicates that F anions play an important role in the etching process of CARE.

Autocovariance functions, root-mean-square-roughness height, and autocovariance length for rough deposits of copper, silver, and gold

1982 ◽  
Vol 25 (4) ◽  
pp. 2315-2323 ◽  
Author(s):  
G. Rasigni ◽  
F. Varnier ◽  
M. Rasigni ◽  
J. P. Palmari ◽  
A. Llebaria
Keyword(s):  
Root Mean Square ◽  
Roughness Height ◽  
Root Mean Square Roughness ◽  
Mean Square

The Quantification of Microwear on Chipped Stone Tools: Assessing the Effectiveness of Root Mean Square Roughness (Rq)

2008 ◽  
Vol 33 (2) ◽  
pp. 173-189 ◽  
Author(s):  
W. James Stemp ◽  
Ben E. Childs ◽  
Samuel Vionnet ◽  
Christopher A. Brown
Keyword(s):  
Root Mean Square ◽  
Stone Tools ◽  
Root Mean Square Roughness ◽  
Mean Square ◽  
Chipped Stone

Direct numerical simulation of turbulence over systematically varied irregular rough surfaces

2019 ◽  
Vol 862 ◽  
pp. 781-815 ◽  
Author(s):  
Y. Kuwata ◽  
Y. Kawaguchi
Keyword(s):  
Numerical Simulation ◽  
Direct Numerical Simulation ◽  
Root Mean Square ◽  
Drag Force ◽  
Rough Surfaces ◽  
Skin Friction Coefficient ◽  
Root Mean Square Roughness ◽  
Mean Square ◽  
Mean Velocity ◽  
Navier Stokes Equation

Lattice Boltzmann direct numerical simulation of turbulent open-channel flows over randomly distributed hemispheres at $Re_{\unicode[STIX]{x1D70F}}=600$ is carried out to reveal the influence of roughness parameters related to a probability density function of rough-surface elevation on turbulence by analysing the spatial and Reynolds- (double-) averaged Navier–Stokes equation. This study specifically concentrates on the influence of the root-mean-square roughness and the skewness, and profiles of turbulence statistics are compared by introducing an effective wall-normal distance defined as a wall-normal integrated plane porosity. The effective distance can completely collapse the total shear stress outside the roughness sublayer, and thus the similarity of the streamwise mean velocity is clearer by introducing the effective distance. In order to examine the influence of the root-mean-square roughness and the skewness on dynamical effects that contribute to an increase in the skin friction coefficient, the triple-integrated double-averaged Navier–Stokes equation is analysed. The main contributors to the skin friction coefficient are found to be turbulence and drag force. The turbulence contribution increases with the root-mean-square roughness and/or the skewness. The drag force contribution, on the other hand, increases in particular with the root-mean-square roughness whereas an increase in the skewness does not increase the drag force contribution because it does not necessarily increase the surface area of the roughness elements. The contribution of the mean velocity dispersion induced by spatial inhomogeneity of the rough surfaces substantially increases with the root-mean-square roughness. A linear correlation is confirmed between the root-mean-square roughness and the equivalent roughness while the equivalent roughness monotonically increases with the skewness. A new correlation function based on the root-mean-square roughness and the skewness is developed with the available experimental and direct numerical simulation data, and it is confirmed that the developed correlation reasonably predicts the equivalent roughness of various types of real rough surfaces.

scholarly journals Manufacture of Highly Transparent and Hazy Cellulose Nanofibril Films via Coating TEMPO-Oxidized Wood Fibers

Nanomaterials ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 107 ◽  
Author(s):  
Weisheng Yang ◽  
Liang Jiao ◽  
Wei Liu ◽  
Hongqi Dai
Keyword(s):  
Root Mean Square ◽  
Low Cost ◽  
Inorganic Nanoparticles ◽  
Root Mean Square Roughness ◽  
Mean Square ◽  
Cellulose Nanofibril ◽  
Wood Fibers ◽  
Excellent Thermal Stability ◽  
Blending Method ◽  
Coating Method

Traditionally, inorganic nanoparticles (SiO2, TiO2) have been utilized to tune the optical haze of optoelectronic devices. However, restricted to complex and costly processes for incorporating these nanoparticles, a simple and low-cost approach becomes particularly important. In this work, a simple, effective, and low-cost method was proposed to improve optical haze of transparent cellulose nanofibril films by directly depositing micro-sized 2,2,6,6-tetramethylpiperidine-1-oxyl (TEMPO)-oxidized wood fibers (“coating” method). The obtained films had a high total transmittance of 85% and a high haze of 62%. The film samples also showed a high tensile strength of 80 MPa and excellent thermal stability. Dual sides of the obtained films had different microstructures: one side was extremely smooth (root-mean-square roughness of 6.25 nm), and the other was extremely rough (root-mean-square roughness of 918 nm). As a reference, micro-sized TEMPO-oxidized wood fibers and cellulose nanofibrils were mixed to form a transparent and hazy film (“blending” method). These results show that hazy transparent films prepared using the “coating” method exhibit superior application performances than films prepared using the “blending” method.

Statistical measures of spottiness in diffraction rings

2013 ◽  
Vol 47 (1) ◽  
pp. 166-172 ◽  
Author(s):  
Bridget Ingham
Keyword(s):  
Carbon Dioxide ◽  
Size Distribution ◽  
Intensity Variation ◽  
Incident Beam ◽  
Mean Square ◽  
X Ray Diffraction ◽  
X Ray ◽  
Statistical Measures ◽  
Diffraction Patterns

Spotty diffraction rings arise when the size distribution of crystallites illuminated by the incident beam includes crystallites that are large compared with the size of the beam. In this article, several statistical measures are used in conjunction to quantify spottiness and relate it to a crystallite size distribution: the number of peaks, the normalized root mean square intensity variation and the fractal dimension. These are demonstrated by way of example using synchrotron X-ray diffraction patterns collected duringin situcorrosion of mild steel in carbon dioxide-saturated aqueous brine.

Morphological Character and Statistical Property of Random Surface of ZnO Thin Film Prepared by RF Magnetron Sputtering

2010 ◽  
Vol 663-665 ◽  
pp. 1159-1162
Author(s):  
Ning Yu Zhang ◽  
Qing Song Huo ◽  
Li Xin Han ◽  
Gang Fu ◽  
Jun Qing Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetron Sputtering ◽  
Root Mean Square ◽  
Gaussian Function ◽  
Gaussian Model ◽  
Film Surface ◽  
Root Mean Square Roughness ◽  
Zno Thin Film ◽  
Mean Square ◽  
Auto Correlation

A method for characterizing the morphology property of ZnO film surface with Gaussian correlation is investigated. The parameters of root-mean-square roughness w and lateral correlation lengthξare introduced in Gaussian model to describe the correlation properties of the random film surfaces. In the experimental performance, ZnO thin films are grown on quartz glass and silicon substrates by the reactive radio-frequency magnetron sputtering method under different deposition pressure. The surface morphologies of the film surface are scanned by an atomic force microscopy. The height auto-correlation functions and root-mean-square roughness are obtained by using the numerical calculus method. Carried on the fitting with the Gaussian function to the height auto-correlation function data, the lateral correlation lengths are extracted to describe the statistical properties of ZnO thin film in mathematics with other parameters.

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