Crystallization of Sputter Deposited Ti-Al Amorphous Alloy
Keyword(s):
AbstractThe crystallization process of Ti-Al amorphous alloy has been studied by X-ray diffraction, small-angle neutron scattering and high resolution electron microscopy. In the early stage of crystallization of a thick sample with 55at%Al, a metastable hcp(α, α2) phase appeares. For a thin sample with 52at%Al, a new metastable phase having primitive tetragonal symmetry is found in the early stage of crystallization. The lattice parameter of this tetragonal phase is a=c=0.69nm. The prototype structure which has the same atomic arrangement as this phase is only Cu4Pd type structure (P42/m) in the Peason's Handbook.
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