Understanding the Impact of Batch vs. Single Wafer in Thermal Processing Using Cost of Ownership Analysis

1997 ◽  
Vol 470 ◽  
Author(s):  
S. Hossain-Pas ◽  
M. F. Pas
Keyword(s):  
Thermal Processing ◽  
Rapid Thermal Processing ◽  
Chemical Vapor ◽  
Financial Impact ◽  
Enabling Technology ◽  
Thermal Budget ◽  
Thermal Chemical Vapor Deposition ◽  
Cost Of Ownership ◽  
Technology Nodes ◽  
The Impact

IntroductionBatch thermal processing satisfies device requirements for 0.5μm and larger technology nodes for silicon semiconductor manufacturing and continues to satisfy these requirements as feature sizes decrease beyond 0.5μm to 0.35μm. At the transition from 0.35μm to 0.25μm, source/drain (S/D) anneal, TiSi form, and TiSi anneal require rapid thermal processing (RTP) because of improvements in thermal budget, lateral dopant diffusion, and in silicidation, with RTP. RTP and rapid thermal chemical vapor deposition (RTCVD) become enabling technology for devices at 0.25μm and smaller technology nodes.A cost of ownership (CoO) analysis provides a comparison between the financial impact of alternatives and helps in determining the lowest cost answer for that process, assuming all other process parameters can be met equally by all alternatives. This report analyzes primary cost drivers, their importance within each analysis, and potential for improvements which may cause a significant change in CoO values at 200mm.

Problems with The Concept of Thermal Budget: Experimental Demonstrations

1997 ◽  
Vol 470 ◽  
Author(s):  
R. Ditchfield ◽  
E. G. Seebauer
Keyword(s):  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Thermal Processing ◽  
Rapid Thermal Processing ◽  
Chemical Vapor ◽  
Dopant Diffusion ◽  
Thermal Budget ◽  
Kinetic Effects ◽  
Rapid Isothermal Processing ◽  
Diffusion Problems

ABSTRACTUp to now, kinetic effects in rapid thermal processing (RTP) have been assessed using the concept of thermal budget, with the idea that thermal budget minimization should minimize dopant diffusion and interface degradation. This work highlights shortcomings with that principle. Experiments comparing directly the rate of Si chemical vapor deposition with that of dopant diffusion show how thermal budget minimization can actually worsen diffusion problems rather than mitigate them. We present a straightforward framework for improving the results through comparison of activation energies of the desired and undesired phenomena. This framework explains the experimental results and provides strong kinetic arguments for continued development of rapid isothermal processing and small batch fast ramp methods.

Optimization of Process Parameter and Temperature Uniformity On Wafers For Rapid Thermal Processing

1995 ◽  
Vol 387 ◽  
Author(s):  
Andreas Tillmann
Keyword(s):  
Standard Deviation ◽  
Thermal Processing ◽  
Rapid Thermal Processing ◽  
Oxide Thickness ◽  
Simulation Software ◽  
Process Parameter ◽  
Parameter Distribution ◽  
Temperature Uniformity ◽  
New Strategy ◽  
The Impact

AbstractA new strategy based algorithm to optimize process parameter uniformity (e.g.sheet resistance, oxide thickness) and temperature uniformity on wafers in a commercially available Rapid Thermal Processing (RTP) system with independent lamp control is described. The computational algorithm uses an effective strategy to minimize the standard deviation of the considered parameter distribution. It is based on simulation software which is able to calculate the temperature and resulting parameter distribution on the wafer for a given lamp correction table. A cyclical variation of the correction values of all lamps is done while minimizing the standard deviation of the considered process parameter. After the input of experimentally obtained wafer maps the optimization can be done within a few minutes. This technique is an effective tool for the process engineer to use to quickly optimize the homogeneity of the RTP tool for particular process requirements. The methodology will be shown on the basis of three typical RTP applications (Rapid Thermal Oxidation, Titanium Silicidation and Implant Annealing). The impact of variations of correction values for single lamps on the resulting process uniformity for different applications will be discussed.

Beyond Thermal Budget: Using D · t In Kinetic Optimization Of RTP

1998 ◽  
Vol 525 ◽  
Author(s):  
R. Ditchfield ◽  
E. G. Seebauer
Keyword(s):  
Thermal Processing ◽  
Program Design ◽  
Rapid Thermal Processing ◽  
Dopant Diffusion ◽  
Thermal Budget ◽  
Microelectronic Fabrication ◽  
Kinetic Effects ◽  
Rigorous Method

ABSTRACTRapid thermal processing (RTP) has found continually increasing use for oxidation, silicidation, CVD, and other steps in microelectronic fabrication. Kinetic effects in rapid thermal processing (RTP) are often assessed using the concept of thermal budget, with the idea that low thermal budgets should minimize dopant diffusion and interface degradation. Some definitions of budget employ the product of temperature and time (T-t). In previous work, we have shown that this definition for budget often leads to qualitatively incorrect conclusions regarding heating program design. However, other definitions of budget employ the product of diffusivity and time (D-t), where the diffusivity describes unwanted diffusion or interface degradation. Here we show that minimization of D-t by itself is insufficient to kinetically optimize a heating program; account must be taken of the relative rates of the desired and undesired phenomena. We present a straightforward but rigorous method for doing so.

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