Role of Ag in the Epitaxial Growth of Oxide Thin Films

1997 ◽  
Vol 474 ◽  
Author(s):  
Clinton B. Lee ◽  
D. Kumar ◽  
Rajiv K. Singh ◽  
Derrick Mathis ◽  
Donovan Moxey
Keyword(s):  
Thin Films ◽  
Film Growth ◽  
Optical Emission ◽  
X Ray Diffraction ◽  
Additional Source ◽  
X Ray ◽  
Colossal Magnetoresistive ◽  
Emission Studies

ABSTRACTIn this paper, we have reported our investigations related to the growth of high temperature superconducting YBa2Cu3O7-δ (YBCO) and colossal magnetoresistive La0.7MnxO3-δ (LMO) thin films in presence of silver. The films were grown using pulsed laser deposition (PLD) techniques and characterized using x-ray diffraction, scanning electron microscopy, Squid magnetometer. The focus of our work is on the realization of significant improvement in microstructural and physical properties of these films by the addition of a common material (silver) to the films during their in-situ formation. Optical emission studies of plumes emanating from Ag target have been carried out to find the role of Ag acting as additional source of oxygen-supply to oxide lattices during film-growth.

Role of grain size on redox induced compositional stresses in Pr doped ceria thin films

2017 ◽  
Vol 19 (19) ◽  
pp. 12206-12220 ◽  
Author(s):  
Jay Sheth ◽  
Di Chen ◽  
Harry L. Tuller ◽  
Scott T. Misture ◽  
Sean R. Bishop ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Size Dependence ◽  
Stress And Strain ◽  
Doped Ceria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Compositional Stresses

In-situ wafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.

Structural Evaluation and Molecular Control of Vacuum-Evaporated Organic Thin Films

MRS Bulletin ◽  
1995 ◽  
Vol 20 (6) ◽  
pp. 26-31 ◽  
Author(s):  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Organic Molecules ◽  
Electronic Devices ◽  
Organic Thin Films ◽  
Electronic Interaction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atoms And Molecules

Recently, organic molecules and their complexes with inorganic or metallic materials have drawn many researchers' interest as candidate materials for nanoscale electronic devices of the next generation, especially since Carter's proposal on molecular electronic devices (MEDs) with the functions of gating, switching, memory, etc. in one molecule. However, in order to build such nanoscopic organic electronic devices to replace conventional silicon-based inorganic devices, one must determine how to produce such nanoscale devices and to recognize the electronic states of a single molecule.The scanning tunneling microscope (STM) developed by G. Binning and H. Rohrer made it possible to visualize atoms and molecules in real space under various atmospheres. In addition, STMs can be used as nanoscopic tools for manipulation of individual atoms and molecules, thus realizing MEDs and nanotechnology.In this article, we present our recent achievements concerning the STM as well as in situ x-ray diffraction studies on the molecular structure of ultrathin films prepared by vacuum evaporation. STM observations with atomic resolution reveal the mechanism of nuclei formation and the crystal-growth process in organic molecules. Computer simulations based on STM images of polar organic molecules with electronic dipoles have elucidated the role of electronic interaction for their aggregation structures.Also, nanometer-sized molecular memory can be created by applying an electronic pulse to the evaporated organic films through the STM tip. Furthermore, we discuss the principle of a newly developed in situ total reflection x-ray diffraction (TRXD) apparatus and its application to the evaluation of crystal structure and molecular orientation in organic thin films during the evaporation process, particularly in regard to the role of the substrate, that is, epitaxial growth on organic molecular crystals.

Substrate Temperature and La0.9Sr0.1Ga0.8Mg0.2O3-δ Electrolyte Film Growth by Radio Frequency Magnetron Sputtering

2015 ◽  
Vol 833 ◽  
pp. 127-133
Author(s):  
Jie Yu ◽  
Jie Xing ◽  
Xiu Hua Chen ◽  
Wen Hui Ma ◽  
Rui Li ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Substrate Temperature ◽  
Radio Frequency ◽  
Film Growth ◽  
Rf Magnetron Sputtering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrolyte Film ◽  
Porous Anode

La0.9Sr0.1Ga0.8Mg0.2O3-δ (LSGM) electrolyte thin films were fabricated on La0.7Sr0.3Cr0.5Mn0.5O2.75 (LSCM) porous anode substrates by Radio Frequency (RF) magnetron sputtering method. The compatibility between LSGM and LSCM was examined. Microstructures of LSGM thin films fabricated were observed by scanning electron microscope (SEM). The effect of substrate temperature on LSGM thin films was clarified by X-ray Diffraction (XRD). Deposition rate increases firstly at the range of 50°C~150°C, and then decreases at the range of 150°C ~300°C. After annealing, perovskite structure with the same growth orientation forms at different substrate temperature. Crystallite size decreases at first, to the minimum point at 150°C, then increases as substrate temperature rises.

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Thermal stability and miscibility of co-evaporated methyl ammonium lead halide (MAPbX3, X = I, Br, Cl) thin films analysed by in situ X-ray diffraction

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Thermal Treatment ◽  
Phase Evolution ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Subsequent Thermal Treatment ◽  
Lead Halide

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

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