3D Chemical Characterization of Micron-Sized Coal Fly Ash Particles

The surface layers on coal fly ash particles are of special environmental interest in that concentration enrichments of trace elements may occur [1], thereby enhancing the potential bioavailability of toxic species. Little research, however, has been devoted to the analytical characterization of intraparticle and interparticle distributions of trace elements. The high detection sensitivity, spatial resolution, and depth profiling capabilities of secondary ion mass spectrometry (SIMS), coupled to digital image acquisition and processing [2], permit three-dimensional (3D) compositional maps for collections of individual micron-sized particles. The 3D analysis of trace element distributions in coal fly ash particles is the subject of this SIMS investigation

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Chemical characterization of coal fly ash and quantification of lung deposition in rodent inhalation studies

Environmental Research ◽

10.1016/0013-9351(80)90142-5 ◽

1980 ◽

Vol 22 (2) ◽

pp. 298-306 ◽

Cited By ~ 11

Author(s):

G.L. Fisher ◽

D. Silberman ◽

O.G. Raabe

Keyword(s):

Fly Ash ◽

Coal Fly Ash ◽

Chemical Characterization ◽

Lung Deposition

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Chemical Characterization of Coal Fly Ash Samples by ICP-AES and ICP-MS With Focus on Trace Level Toxic Elements

Atomic Spectroscopy ◽

10.46770/as.2016.06.003 ◽

2016 ◽

Vol 37 (6) ◽

pp. 229-237 ◽

Cited By ~ 1

Author(s):

V. Padmasubashini

Keyword(s):

Fly Ash ◽

Toxic Elements ◽

Coal Fly Ash ◽

Chemical Characterization ◽

Trace Level ◽

Icp Ms

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Secondary ion mass spectrometry/digital imaging for the three‐dimensional chemical characterization of solid state devices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573263 ◽

1985 ◽

Vol 3 (6) ◽

pp. 2102-2107 ◽

Cited By ~ 16

Author(s):

S. R. Bryan ◽

W. S. Woodward ◽

R. W. Linton ◽

D. P. Griffis

Keyword(s):

Mass Spectrometry ◽

Solid State ◽

Digital Imaging ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Chemical Characterization ◽

Solid State Devices ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Microvolume Analysis of Fly Ash by Synchrotron Radiation X-ray Fluorescence (SRXRF) and Electron Microprobe X-ray Microanalysis (EPXMA)

Advances in X-ray Analysis ◽

10.1154/s0376030800020164 ◽

1989 ◽

Vol 33 ◽

pp. 673-678

Author(s):

Sz. Török ◽

Sz. Sándor ◽

H. Rausch

Keyword(s):

Fly Ash ◽

Coal Combustion ◽

Coal Fly Ash ◽

Chemical Characterization ◽

Particulate Material ◽

Toxic Trace Elements ◽

X Ray ◽

Toxicological Effects ◽

Physical And Chemical

The assessment of the potential environmental and toxicological effects of particulate material emitted to the atmosphere requires detailed physical and chemical characterization of the particles. One of the most widely studied types of pollutant particles is coal fly ash as a byproduct of coal combustion. These particles are inhomogeneous, highly variable, span a broad range of sizes and have diverse morphologies.It has been shown that numerous toxic trace elements tend to increase in bulk concentrations with decreasing particle size (1).

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Chemical characterization of density separated submicrometer coal fly ash

Microchimica Acta ◽

10.1007/bf01236091 ◽

1988 ◽

Vol 96 (1-6) ◽

pp. 41-56 ◽

Cited By ~ 4

Author(s):

Kiichiro Mukai ◽

Tadashi Kikuchi ◽

Keiichi Furuya

Keyword(s):

Fly Ash ◽

Coal Fly Ash ◽

Chemical Characterization

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Summary Abstract: Sensitivity factors for quantitative secondary ion mass spectrometry analysis of trace elements in coal fly ash

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575643 ◽

1988 ◽

Vol 6 (3) ◽

pp. 1079-1080

Author(s):

Mohsen Shenasa ◽

Gadi Yaron ◽

David Lichtman

Keyword(s):

Mass Spectrometry ◽

Trace Elements ◽

Fly Ash ◽

Secondary Ion Mass Spectrometry ◽

Coal Fly Ash ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Sensitivity Factors ◽

Secondary Ion

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Three-Dimensional Characterization of LiNbO3 Waveguides By Secondary Ion Mass Spectrometry (SIMS) Image Depth Profiling

10.1117/12.963930 ◽

1990 ◽

Cited By ~ 1

Author(s):

Steven W. Novak ◽

Hilda Kanber ◽

Stephan Bar ◽

Champa Sridhar ◽

Robert Wilson

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Image Depth

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Applications of SIMS to electronic materials and devices

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133047 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1682-1683

Author(s):

S.F. Corcoran

Keyword(s):

Depth Distribution ◽

Secondary Ion Mass Spectrometry ◽

Semiconductor Device ◽

Electronic Materials ◽

Profile Analysis ◽

Semiconductor Industry ◽

Small Diameter ◽

Depth Resolution ◽

Detection Sensitivity

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.

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