A Study on Substrate Orientation Dependence of Si Surface Flattening Process by Sacrificial Oxidation and Its Effect on MIS Diode Characteristics

2016 ◽  
Vol E99.C (5) ◽  
pp. 504-509 ◽  
Author(s):  
Sohya KUDOH ◽  
Shun-ichiro OHMI
1997 ◽  
Vol 117-118 ◽  
pp. 523-529 ◽  
Author(s):  
C. Tatsuyama ◽  
H. Nishiwaki ◽  
K. Asai ◽  
K.K. Lim ◽  
T. Tambo ◽  
...  

1997 ◽  
Vol 36 (Part 2, No. 8B) ◽  
pp. L1100-L1103 ◽  
Author(s):  
Yoshitaka Morishita ◽  
Koichi Iida ◽  
Junya Abe ◽  
Katsuaki Sato

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