scholarly journals Nanopatterning in a compact setup using table top extreme ultraviolet lasers

2008 ◽  
Vol 16 (4) ◽  
Author(s):  
P. Wachulak ◽  
M. Capeluto ◽  
C. Menoni ◽  
J. Rocca ◽  
M. Marconi
Keyword(s):  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Hydrogen Silsesquioxane ◽  
Time Duration ◽  
Interferometric Lithography ◽  
Euv Lasers ◽  
Extreme Ultraviolet Lasers ◽  
New Applications ◽  
Compact Sources ◽  
Discharge Laser

AbstractThe recent development of table top extreme ultraviolet (EUV) lasers have enabled new applications that so far were restricted to the use of large facilities. These compact sources bring now to the laboratory environment the capabilities that will allow a broader application of techniques related to nanotechnology and nanofabrication. In this paper we review the advances in the utilization of EUV lasers in nanopatterning. In particular we show results of the nanopatterning using a table-top capillary discharge laser producing 0.12-mJ laser pulses with 1.2-ns time duration at a wavelength λ = 46.9 nm. The nanopatterning was realized by interferometric lithography using a Lloyd’s mirror interferometer. Two standard photoresists were used in this work, polymethyl methacrylate (PMMA) and hydrogen silsesquioxane (HSQ). Pillars with a full width half maximum (FWHM) diameter of 60 nm and holes with FWHM diameter of 130 nm were obtained over areas in excess of 500×500 μm2.

scholarly journals Ablation of single-crystalline cesium iodide by extreme ultraviolet capillary-discharge laser

Nukleonika ◽  
2020 ◽  
Vol 65 (4) ◽  
pp. 205-210
Author(s):  
Jan Wild ◽  
Peter Pira ◽  
Tomas Burian ◽  
Ludek Vysin ◽  
Libor Juha ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Capillary Discharge ◽  
Cesium Iodide ◽  
Langmuir Probes ◽  
X Ray ◽  
Long Wavelength ◽  
Discharge Laser ◽  
Mgo Substrate

AbstractExtreme ultraviolet (XUV) capillary-discharge lasers (CDLs) are a suitable source for the efficient, clean ablation of ionic crystals, which are obviously difficult to ablate with conventional, long-wavelength lasers. In the present study, a single crystal of cesium iodide (CsI) was irradiated by multiple, focused 1.5-ns pulses of 46.9-nm radiation delivered from a compact XUV-CDL device operated at either 2-Hz or 3-Hz repetition rates. The ablation rates were determined from the depth of the craters produced by the accumulation of laser pulses. Langmuir probes were used to diagnose the plasma plume produced by the focused XUV-CDL beam. Both the electron density and electron temperature were sufficiently high to confirm that ablation was the key process in the observed CsI removal. Moreover, a CsI thin film on MgO substrate was prepared by XUV pulsed laser deposition; a fraction of the film was detected by X-ray photoelectron spectroscopy.

Generation and measurement of intense few-femtosecond superradiant extreme-ultraviolet free-electron laser pulses

2021 ◽  
Author(s):  
Najmeh S. Mirian ◽  
Michele Di Fraia ◽  
Simone Spampinati ◽  
Filippo Sottocorona ◽  
Enrico Allaria ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Pulses

scholarly journals Measuring the frequency chirp of extreme-ultraviolet free-electron laser pulses by transient absorption spectroscopy

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Thomas Ding ◽  
Marc Rebholz ◽  
Lennart Aufleger ◽  
Maximilian Hartmann ◽  
Veit Stooß ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Transient Absorption ◽  
Extreme Ultraviolet ◽  
Ultrashort Pulses ◽  
Laser Pulses ◽  
Transient Absorption Spectroscopy ◽  
Energy Structure ◽  
Frequency Chirp

AbstractHigh-intensity ultrashort pulses at extreme ultraviolet (XUV) and x-ray photon energies, delivered by state-of-the-art free-electron lasers (FELs), are revolutionizing the field of ultrafast spectroscopy. For crossing the next frontiers of research, precise, reliable and practical photonic tools for the spectro-temporal characterization of the pulses are becoming steadily more important. Here, we experimentally demonstrate a technique for the direct measurement of the frequency chirp of extreme-ultraviolet free-electron laser pulses based on fundamental nonlinear optics. It is implemented in XUV-only pump-probe transient-absorption geometry and provides in-situ information on the time-energy structure of FEL pulses. Using a rate-equation model for the time-dependent absorbance changes of an ionized neon target, we show how the frequency chirp can be directly extracted and quantified from measured data. Since the method does not rely on an additional external field, we expect a widespread implementation at FELs benefiting multiple science fields by in-situ on-target measurement and optimization of FEL-pulse properties.

Fabrication of metallic micropatterns using table top extreme ultraviolet laser interferometric lithography

2008 ◽  
Vol 17 (2) ◽  
pp. 024019 ◽  
Author(s):  
L Ottaviano ◽  
F Bussolotti ◽  
S Piperno ◽  
M Rinaldi ◽  
S Santucci ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Ultraviolet Laser ◽  
Interferometric Lithography ◽  
Laser Interferometric

scholarly journals Extreme Ultraviolet-Printability and Mechanistic Studies of Engineered Hydrogen Silsesquioxane Photoresist Systems

2021 ◽  
Author(s):  
Ashish Rathore ◽  
Ivan Pollentier ◽  
Maicol Cipriani ◽  
Harpreet Singh ◽  
Danilo De Simone ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Mechanistic Studies ◽  
Hydrogen Silsesquioxane

scholarly journals All-optical single shot complete electric field measurement of extreme ultraviolet free electron laser pulses

Optica ◽  
2021 ◽  
Author(s):  
William Peters ◽  
Travis Jones ◽  
Anatoly Efimov ◽  
Emanuele Pedersoli ◽  
Laura Foglia ◽  
...  
Keyword(s):  
Electric Field ◽  
Free Electron ◽  
Field Measurement ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Pulses ◽  
Single Shot ◽  
Electric Field Measurement ◽  
All Optical

Picosecond pumping of extreme-ultraviolet lasers using preformed laser plasmas

1996 ◽  
Vol 13 (2) ◽  
pp. 436 ◽  
Author(s):  
H. Yamakoshi ◽  
P. R. Herman ◽  
M. P. Le Flohic ◽  
B. Xiao ◽  
L. Zhao ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Laser Plasmas ◽  
Ultraviolet Lasers ◽  
Extreme Ultraviolet Lasers

Extreme ultraviolet plasma spectroscopy of a pseudospark XUV source

2020 ◽  
Vol 35 (9) ◽  
pp. 2011-2022
Author(s):  
Di Qu ◽  
Davide Bleiner
Keyword(s):  
Extreme Ultraviolet ◽  
Plasma Spectroscopy ◽  
New Applications

The development of extreme ultraviolet (XUV) sources for tabletop operation has enabled a range of new applications in nano-structuring and spectroscopy.

Science of High Energy, Single-Cycled Lasers

2019 ◽  
Vol 10 (01) ◽  
pp. 227-244
Author(s):  
Jonathan A. Wheeler ◽  
Gérard Mourou ◽  
Toshiki Tajima
Keyword(s):  
Laser Pulse ◽  
Laser Pulses ◽  
High Energy ◽  
New Developments ◽  
X Ray ◽  
Ion Accelerator ◽  
Laser Acceleration ◽  
High Field Science ◽  
New Applications ◽  
Wakefield Accelerator

With the advent of the Thin Film Compression, high energy single-cycled laser pulses have become an eminent path to the future of new high-field science. An existing CPA high power laser pulse such as a commercially available PW laser may be readily converted into a single-cycled laser pulse in the 10PW regime without losing much energy through the compression. We examine some of the scientific applications of this, such as laser ion accelerator called single-cycle laser acceleration (SCLA) and bow wake electron acceleration. Further, such a single-cycled laser pulse may be readily converted through relativistic compression into a single-cycled, X-ray laser pulse. We see that this is the quickest and very innovative way to ascend to the EW (exawatt) and zs (zeptosecond) science and technology. We suggest that such X-ray laser pulses have a broad and new horizon of applications. We have begun exploring the X-ray crystal (or nanostructured) wakefield accelerator and its broad and new applications into gamma rays. Here, we make a brief sketch of our survey of this vista of the new developments.

Sign in / Sign up

Export Citation Format

Share Document