Backside Application of Acoustic Micro Imaging (AMI) on Plastic Ball Grid Array (PBGA) and Plastic Quad Flat Pack (PQFP) Packages

2004 ◽  
Author(s):  
Luis A. Curiel ◽  
Andrew J. Komrowski ◽  
Daniel J.D. Sullivan
Keyword(s):  
Ball Grid Array ◽  
Acoustic Microscopy ◽  
Electronic Packages ◽  
Nondestructive Technique ◽  
Molding Compound ◽  
Microscopy Technique ◽  
Plastic Ball ◽  
Die Surface ◽  
Plastic Ball Grid Array ◽  
Bond Pads

Abstract Acoustic Micro Imaging (AMI) is an established nondestructive technique for evaluation of electronic packages. Non-destructive evaluation of electronic packages is often a critical first step in the Failure Analysis (FA) process of semiconductor devices [1]. The molding compound to die surface interface of the Plastic Ball Grid Array (PBGA) and Plastic Quad Flat Pack (PQFP) packages is an important interface to acquire for the FA process. Occasionally, with these packages, the standard acoustic microscopy technique fails to identify defects at the molding compound to die surface interface. The hard to identify defects are found at the edge of the die next to the bond pads or under the bonds wires. This paper will present a technique, Backside Acoustic Micro Imaging (BAMI) analysis, which can better resolve the molding compound to die surface interface at the die edge by sending the acoustic signal through the backside of the PBGA and PQFP packages.

Prediction of Thermal Performance of Wire-Bonded Plastic Ball Grid Array Package for Underhood Automotive Applications

2003 ◽  
Vol 125 (3) ◽  
pp. 447-455 ◽  
Author(s):  
K. Ramakrishna ◽  
J. R. Trent
Keyword(s):  
Thermal Conductivity ◽  
Natural Convection ◽  
Ambient Temperature ◽  
Thermal Performance ◽  
Ball Grid Array ◽  
Automotive Applications ◽  
Molding Compound ◽  
Wide Range ◽  
Plastic Ball ◽  
Plastic Ball Grid Array

Thermal performance of a three chip, overmolded wire-bonded plastic ball grid array (WB-PBGA) package with four layer substrate attached to a 1.52-mm-thick, four-layer (2s2p), FR4 printed wiring board (PWB) has been evaluated under horizontal natural convection conditions for underhood automotive applications as a function of ambient temperature, package design parameters, and thermophysical properties of the package and PWB materials. A two-tier modeling approach, which accurately accounts for multidimensional heat transfer effects caused by substrate features such as vias and C5 solder joints, has been developed and implemented. In this methodology, the effect of small features is first characterized using a detailed micromodel from which an effective thermal conductivity is computed. The effective thermal conductivity is implemented in the global model thereby excluding the small features in the global model. The actual stackups of the package and PWB have been used in the computations to accurately determine the in-plane heat spreading. Using this methodology for automotive underhood applications, a parametric study of thermal performance of the WB-PBGA package has been carried out. This study shows that: 1. The maximum junction temperature rise above ambient, ΔT, decreases with increase in ambient temperature by 30% as the ambient temperature increases from 23 to 125°C. 2. ΔT decreases by 20% as the emissivity of the molding compound and the PWB surfaces increases from 0 (no radiative loss) to 0.8 under natural convection conditions. 3. The decrease in ΔT is small (∼7%) as the thermal conductivity of the die attach material varies over a wide range. 4. ΔT decreases by 30% as the thermal conductivity of the molding compound is varied over a wide range. 5. ΔT decreases by 45% as the thermal conductivity of the substrate increases (i.e., as the number of vias in the substrate increase) from no vias case to densely populated vias.

The Effect of Ball Pad Metallurgy and Ball Composition on Solder Ball Integrity of Plastic Ball Grid Array Packages

1998 ◽  
Author(s):  
C.H. Zhong ◽  
Sung Yi
Keyword(s):  
Failure Mode ◽  
Barrier Layer ◽  
Shear Force ◽  
Solder Ball ◽  
Ball Grid Array ◽  
Reliability Test ◽  
Shear Forces ◽  
Ball Shear ◽  
Plastic Ball ◽  
Plastic Ball Grid Array

Abstract Ball shear forces of plastic ball grid array (PBGA) packages are found to decrease after reliability test. Packages with different ball pad metallurgy form different intermetallic compounds (IMC) thus ball shear forces and failure modes are different. The characteristic and dynamic process of IMC formed are decided by ball pad metallurgy which includes Ni barrier layer and Au layer thickness. Solder ball composition also affects IMC formation dynamic process. There is basically no difference in ball shear force and failure mode for packages with different under ball pad metallurgy before reliability test. However shear force decreased and failure mode changed after reliability test, especially when packages exposed to high temperature. Major difference in ball shear force and failure mode was found for ball pad metallurgy of Ni barrier layer including Ni-P, pure Ni and Ni-Co. Solder ball composition was found to affect the IMC formation rate.

Plastic Ball Grid Array

2001 ◽  
pp. 577-613
Author(s):  
Mark J. Kuzawinski ◽  
Thomas R. Homa
Keyword(s):  
Ball Grid Array ◽  
Plastic Ball ◽  
Plastic Ball Grid Array
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