Detection and monitoring for cancer and abnormal vasculature by photoacoustic signal characterization of structural morphology

10.32920/ryerson.14661159 ◽

2021 ◽

Author(s):

Jason Zalev

Keyword(s):

High Resolution ◽

Vascular Tissue ◽

Photoacoustic Signal ◽

3D Models ◽

Exact Equation ◽

Structural Morphology ◽

Array Technology ◽

Vascular Structures ◽

Signal Characterization

Photoacoustic systems can produce high-resolution, high-contracts images of vascular structures. To reconstruct images at very high-resolution, signals must be collected from many transducer locations, which can be time consuming due to limitations in transducer array technology, In this thesis a method is presented to discriminate between normal and abnormal tissue based on the structural morphology of vasculature and permits data to be acquired quickly. To demonstrate that the approach may be useful for cancer detection, a special simulator that produces photoacoustic signal from 3D models of vascular tissue is developed. Validation of the simulator is performed against a derived exact equation for finite-length cylindrical photoacoustic sources and through FEM models. Results show that is possible to differentiate tissue classed even when it is not possible to resolve individual blood vessels. Performance of the algorithm remains strong as the number of transducer locations decreases and in the presence of noise.

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Photoacoustic signal characterization of cancer treatment response: Correlation with changes in tumor oxygenation

Photoacoustics ◽

10.1016/j.pacs.2017.03.003 ◽

2017 ◽

Vol 5 ◽

pp. 25-35 ◽

Cited By ~ 19

Author(s):

Eno Hysi ◽

Lauren A. Wirtzfeld ◽

Jonathan P. May ◽

Elijus Undzys ◽

Shyh-Dar Li ◽

...

Keyword(s):

Cancer Treatment ◽

Treatment Response ◽

Photoacoustic Signal ◽

Tumor Oxygenation ◽

Signal Characterization

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Skeletal elements of crinoid echinoderms: High-resolution structural and microanalytical results

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100074768 ◽

1983 ◽

Vol 41 ◽

pp. 194-195

Author(s):

D. F. Blake ◽

L. F. Allard ◽

D. R. Peacor

Keyword(s):

High Resolution ◽

Marine Invertebrates ◽

Sea Urchins ◽

Structural Features ◽

Sea Stars ◽

High Resolution Tem ◽

Relationship Of ◽

The Relationship ◽

Insight Into

Echinodermata is a phylum of marine invertebrates which has been extant since Cambrian time (c.a. 500 m.y. before the present). Modern examples of echinoderms include sea urchins, sea stars, and sea lilies (crinoids). The endoskeletons of echinoderms are composed of plates or ossicles (Fig. 1) which are with few exceptions, porous, single crystals of high-magnesian calcite. Despite their single crystal nature, fracture surfaces do not exhibit the near-perfect {10.4} cleavage characteristic of inorganic calcite. This paradoxical mix of biogenic and inorganic features has prompted much recent work on echinoderm skeletal crystallography. Furthermore, fossil echinoderm hard parts comprise a volumetrically significant portion of some marine limestones sequences. The ultrastructural and microchemical characterization of modern skeletal material should lend insight into: 1). The nature of the biogenic processes involved, for example, the relationship of Mg heterogeneity to morphological and structural features in modern echinoderm material, and 2). The nature of the diagenetic changes undergone by their ancient, fossilized counterparts. In this study, high resolution TEM (HRTEM), high voltage TEM (HVTEM), and STEM microanalysis are used to characterize tha ultrastructural and microchemical composition of skeletal elements of the modern crinoid Neocrinus blakei.

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High-resolution electron microscopy of nanostructured materials

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100137239 ◽

1995 ◽

Vol 53 ◽

pp. 172-173

Author(s):

M. José-Yacamán

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Grain Boundaries ◽

Nanostructured Materials ◽

High Resolution Electron Microscopy ◽

Hrem Image ◽

Small Particles ◽

Resolution Electron ◽

Nanophase Materials

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.

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High-resolution transmission electron microscopic study of highly oxygen doped silicon layer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100155438 ◽

1989 ◽

Vol 47 ◽

pp. 692-693

Author(s):

H. Takaoka ◽

M. Tomita ◽

T. Hayashi

Keyword(s):

High Resolution ◽

Oxygen Concentration ◽

Silicon Layer ◽

Detailed Structure ◽

Electron Microscopic ◽

Cross Sectional ◽

Transmission Electron ◽

Doped Silicon ◽

Argon Ion

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.

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HRTEM simulation of interfacial structure in amorphous multilayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154305 ◽

1989 ◽

Vol 47 ◽

pp. 466-467

Author(s):

Margaret L. Sattler ◽

Michael A. O'Keefe

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Cross Section ◽

High Resolution Electron Microscopy ◽

Interfacial Structure ◽

Multilayer Sample ◽

Resolution Electron ◽

Multilayered Materials ◽

Simulated Images

Multilayered materials have been fabricated with such high perfection that individual layers having two atoms deep are possible. Characterization of the interfaces between these multilayers is achieved by high resolution electron microscopy and Figure 1a shows the cross-section of one type of multilayer. The production of such an image with atomically smooth interfaces depends upon certain factors which are not always reliable. For example, diffusion at the interface may produce complex interlayers which are important to the properties of the multilayers but which are difficult to observe. Similarly, anomalous conditions of imaging or of fabrication may occur which produce images having similar traits as the diffusion case above, e.g., imaging on a tilted/bent multilayer sample (Figure 1b) or deposition upon an unaligned substrate (Figure 1c). It is the purpose of this study to simulate the image of the perfect multilayer interface and to compare with simulated images having these anomalies.

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