scholarly journals RECORDING TECHNIQUE OF MASKS ON MULTILAYERED COATINGS (Part 1)

2019 ◽  
Vol 8 ◽  
pp. 47-51 ◽  
Author(s):  
Nikita Gurin ◽  
Viktor Korolkov ◽  
Yury Batomunkuev ◽  
Evgeny Spesivtsev

The aim of the work is an experimental study of the optical characteristics of chromium oxide films, such as the refractive index, absorption coefficient, reflection and transmission coefficients for the visible spectral region. This work is a part of the development of a mask writing technique with focused laser radiation on multilayer absorbing coatings.

2020 ◽  
Vol 8 (1) ◽  
pp. 134-138
Author(s):  
Nikita A. Gurin ◽  
Viktor P. Korolkov ◽  
Yury T. Batomunkuev ◽  
Evgeny V. Spesivtsev

The experimental determination of the reflection coefficients in the visible region of the spectrum of chromium oxide films unexposed and exposed to laser radiation was performed. The reflection coefficients were measured using a Linza - 150 spectrophotometer (operating spectrum range from 380 to 1700 nm). The obtained characteristic values of the reflection coefficients of samples of chromium oxide films at different wavelengths are presented in the table and in the form of graphs. It was found that the reflectance of the chromium oxide film before exposure to laser radiation monotonically decreases with increasing wavelength from 380 to 450 nm, with a further increase in wavelength to 630 nm, the reflectance increases monotonically. This work is part of the development of a technique for recording masks by focused laser radiation on multilayer absorbing coatings.


1992 ◽  
Vol 31 (1) ◽  
pp. 106 ◽  
Author(s):  
Leonard I. Grossweiner ◽  
James L. Karagiannes ◽  
Linda Ramball Jones ◽  
Porter W. Johnson

1965 ◽  
Vol 43 (5) ◽  
pp. 921-934 ◽  
Author(s):  
R. Burman ◽  
R. N. Gould

Epstein (1930) and Rawer (1939) studied the reflection of waves in a stratified medium by transforming the hypergeometric equation into the wave equation. A particular case of the Epstein profile is a symmetrical layer. Considerable attention has been given in the literature to this case as well as to symmetrical layers with certain other profiles of the refractive index. In the present paper a generalized Epstein profile is considered and the reflection and transmission coefficients are obtained. The special case in which the refractive index tends to the same constant value on either side of a layer is then discussed. The symmetrical Epstein profile is a special case of this layer which, in general, is asymmetrical. Particular attention is given to a layer differing only slightly from the symmetrical Epstein layer, a simple approximate formula for the reflection coefficient being derived.


Author(s):  
Yimin Xuan ◽  
Jinguo Huang ◽  
Qiang Li

A tunable metamaterial is proposed by combining a thermochromic oxide with a fishnet structure. The reflection and transmission coefficients are calculated by finite-difference time-domain (FDTD) method. Then the effective electromagnetic parameters of the metamaterial are retrieved on the basis of these data. The results reveal that an effective negative refractive index is obtained by this proposed structure. Furthermore, the wavelength region with negative refractive index can be self-regulated by simply tuning the temperature, which is of importance to extend the applications of negative refractive index materials. The effects of structural sizes on the negative refractive index are discussed in detail. The size-dependence indicates that wavelength region with negative refractive index can be designed to locate at the desired position by dexterously tailoring the structural parameters.


2013 ◽  
Vol 135 (9) ◽  
Author(s):  
Yimin Xuan ◽  
Jinguo Huang ◽  
Qiang Li

A tunable metamaterial is proposed by combining a thermochromic oxide with a fishnet structure. The reflection and transmission coefficients are calculated by finite-difference time-domain (FDTD) method. The effective electromagnetic parameters of the metamaterial are retrieved on the basis of these data. The results reveal that an effective negative refractive index is obtained by this proposed structure and the wavelength region with negative refractive index can be self-regulated by simply tuning the temperature, which is of importance to extend the applications of negative refractive index materials. The effects of structural sizes on the negative refractive index are discussed. The size-dependence indicates that the wavelength range in which the apparent refractive index is negative can be tuned to be located at the desired position by dexterously tailoring the structural parameters.


2019 ◽  
Vol 3 (2) ◽  
pp. p79
Author(s):  
Hanan Ali ◽  
Guoping Zhang

Metamaterial structure based on epoxy resin nanoparticles positioned on mica glass substrate is proposed in order to produce negative refractive index. Complex reflection and transmission coefficients (S-parameters) are computed using CST MWS, based on finite integration technique (FIT) which is equivalent to FDTD when applied to Cartesian grids in the time domain. Effective refractive index, effective permittivity and effective permeability were extracted from the simulated S-parameters by using CST MWS extraction method which is done by using template pots-processing features. The real part of the refractive index is found to be negative at wavelengths where both real parts of the permittivity and permeability are negatives without using split ring resonators and thin wires.


Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1282
Author(s):  
Victor Reshetnyak ◽  
Igor Pinkevych ◽  
Timothy Bunning ◽  
Dean Evans

This study theoretically investigated light reflection and transmission in a system composed of a thin metal layer (Ag) adjacent to a rugate filter (RF) having a harmonic refractive index profile. Narrow dips in reflectance and peaks in transmittance in the RF band gap were obtained due to the excitation of a Tamm plasmon polariton (TPP) at the Ag–RF interface. It is shown that the spectral position and magnitude of the TPP dips/peaks in the RF band gap depend on the harmonic profile parameters of the RF refractive index, the metal layer thickness, and the external medium refractive index. The obtained dependences for reflectance and transmittance allow selecting parameters of the system which can be optimized for various applications.


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