scholarly journals A Modular U-Net for Automated Segmentation of X-Ray Tomography Images in Composite Materials

2021 ◽  
Vol 8 ◽  
Author(s):  
João P. C. Bertoldo ◽  
Etienne Decencière ◽  
David Ryckelynck ◽  
Henry Proudhon
Keyword(s):  
Materials Science ◽  
Polyamide 66 ◽  
Promising Alternative ◽  
High Resolution Data ◽  
X Ray ◽  
3D Tomography ◽  
Glass Fiber Reinforced ◽  
Segmentation Methods ◽  
Model Finding ◽  
X Ray Computed

X-Ray Computed Tomography (XCT) techniques have evolved to a point that high-resolution data can be acquired so fast that classic segmentation methods are prohibitively cumbersome, demanding automated data pipelines capable of dealing with non-trivial 3D images. Meanwhile, deep learning has demonstrated success in many image processing tasks, including materials science applications, showing a promising alternative for a human-free segmentation pipeline. However, the rapidly increasing number of available architectures can be a serious drag to the wide adoption of this type of models by the end user. In this paper a modular interpretation of U-Net (Modular U-Net) is proposed with a parametrized architecture that can be easily tuned to optimize it. As an example, the model is trained to segment 3D tomography images of a three-phased glass fiber-reinforced Polyamide 66. We compare 2D and 3D versions of our model, finding that the former is slightly better than the latter. We observe that human-comparable results can be achievied even with only 13 annotated slices and using a shallow U-Net yields better results than a deeper one. As a consequence, neural networks show indeed a promising venue to automate XCT data processing pipelines needing no human, adhoc intervention.

scholarly journals A modular U-Net for automated segmentation of X-ray tomography images in composite materials

2021 ◽  
Author(s):  
João Paulo Casagrande Bertoldo ◽  
Etienne Decencière Ferrandière ◽  
David Ryckelynck ◽  
Henry Proudhon
Keyword(s):  
Polyamide 66 ◽  
Promising Alternative ◽  
High Resolution Data ◽  
X Ray ◽  
3D Tomography ◽  
Glass Fiber Reinforced ◽  
Segmentation Methods ◽  
Model Finding ◽  
X Ray Computed ◽  
2D And 3D

Abstract X-ray Computed Tomography (XCT) techniques have evolved to a point that high-resolution data can be acquired so fast that classic segmentation methods are prohibitively cumbersome, demanding automated data pipelines capable of dealing with non-trivial 3D images. Deep learning has demonstrated success in many image processing tasks, including material science applications, showing a promising alternative for a human-free segmentation pipeline. In this paper a modular interpretation of U-Net (Modular U-Net) is proposed and trained to segment 3D tomography images of a three-phased glass fiber-reinforced Polyamide 66. We compare 2D and 3D versions of our model, finding that the former is slightly better than the latter. We observe that human-comparable results can be achievied even with only 10 annotated layers and using a shallow U-Net yields better results than a deeper one. As a consequence, Neural Network (NN) show indeed a promising venue to automate XCT data processing pipelines needing no human, adhoc intervention.

X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source

2007 ◽  
Vol 222 (11/2007) ◽  
Author(s):  
Andrei Tkachuk ◽  
Fred Duewer ◽  
Hongtao Cui ◽  
Michael Feser ◽  
Steve Wang ◽  
...  
Keyword(s):  
Computed Tomography ◽  
High Resolution ◽  
Phase Contrast ◽  
High Efficiency ◽  
Materials Science ◽  
Fresnel Zone ◽  
X Ray ◽  
X Ray Computed ◽  
Structure Height ◽  
Better Than

High-resolution X-ray computed tomography (XCT) enables nondestructive 3D imaging of complex structures, regardless of their state of crystallinity. This work describes a sub-50 nm resolution XCT system operating at 8 keV in absorption and Zernike phase contrast modes based on a commercially available Cu rotating anode laboratory X-ray source. The system utilizes a high efficiency reflective capillary condenser lens and high-resolution Fresnel zone plates with an outermost zone width of 35 nm and 700 nm structure height resulting in a spatial resolution better than 50 nm currently. Imaging a fragment of the solid oxide fuel cells (SOFC) with 50 nm resolution is presented as an application example of the XCT technique in materials science and nanotechnology.

scholarly journals Microstructure-mechanical properties relationships in vibration welded glass-fiber-reinforced polyamide 66: A high-resolution X-ray microtomography study

2020 ◽  
Vol 85 ◽  
pp. 106454 ◽  
Author(s):  
Eeva Mofakhami ◽  
Sylvie Tencé-Girault ◽  
Jonathan Perrin ◽  
Mario Scheel ◽  
Laurent Gervat ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
High Resolution ◽  
Glass Fiber ◽  
Fiber Reinforced ◽  
Polyamide 66 ◽  
X Ray ◽  
Glass Fiber Reinforced

Difference Fourier Analysis of Glucose Embedded and Frozen Hydrated Purple Membrane

1982 ◽  
Vol 40 ◽  
pp. 74-75
Author(s):  
Jules S. Jaffe ◽  
Robert M. Glaeser
Keyword(s):  
Purple Membrane ◽  
Data Set ◽  
High Resolution Data ◽  
X Ray ◽  
X Ray Crystallography ◽  
Fourier Techniques ◽  
Versus Protein ◽  
The Difference ◽  
Difference Fourier ◽  
Ideal Method

Although difference Fourier techniques are standard in X-ray crystallography it has only been very recently that electron crystallographers have been able to take advantage of this method. We have combined a high resolution data set for frozen glucose embedded Purple Membrane (PM) with a data set collected from PM prepared in the frozen hydrated state in order to visualize any differences in structure due to the different methods of preparation. The increased contrast between protein-ice versus protein-glucose may prove to be an advantage of the frozen hydrated technique for visualizing those parts of bacteriorhodopsin that are embedded in glucose. In addition, surface groups of the protein may be disordered in glucose and ordered in the frozen state. The sensitivity of the difference Fourier technique to small changes in structure provides an ideal method for testing this hypothesis.

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Electron holography of interfaces in electroceramics

1993 ◽  
Vol 51 ◽  
pp. 1088-1089
Author(s):  
Vinayak P. Dravid ◽  
V. Ravikumar ◽  
Richard Plass
Keyword(s):  
Space Charge ◽  
Direct Evidence ◽  
Materials Science ◽  
Theoretical Work ◽  
Electron Holography ◽  
Resolution Limit ◽  
Interference Phenomenon ◽  
X Ray ◽  
Electron Sources ◽  
Science Community

With the advent of coherent electron sources with cold field emission guns (cFEGs), it has become possible to utilize the coherent interference phenomenon and perform “practical” electron holography. Historically, holography was envisioned to extent the resolution limit by compensating coherent aberrations. Indeed such work has been done with reasonable success in a few laboratories around the world. However, it is the ability of electron holography to map electrical and magnetic fields which has caught considerable attention of materials science community.There has been considerable theoretical work on formation of space charge on surfaces and internal interfaces. In particular, formation and nature of space charge have important implications for the performance of numerous electroceramics which derive their useful properties from electrically active grain boundaries. Bonnell and coworkers, in their elegant STM experiments provided the direct evidence for GB space charge and its sign, while Chiang et al. used the indirect but powerful technique of x-ray microchemical profiling across GBs to infer the nature of space charge.

X-ray mapping without STEM

1994 ◽  
Vol 52 ◽  
pp. 508-509
Author(s):  
Judith M. Brock ◽  
Max T. Otten
Keyword(s):  
Life Science ◽  
Materials Science ◽  
Chemical Elements ◽  
Full Description ◽  
Scanning System ◽  
Elemental Distribution ◽  
X Ray ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Made In

A knowledge of the distribution of chemical elements in a specimen is often highly useful. In materials science specimens features such as grain boundaries and precipitates generally force a certain order on mental distribution, so that a single profile away from the boundary or precipitate gives a full description of all relevant data. No such simplicity can be assumed in life science specimens, where elements can occur various combinations and in different concentrations in tissue. In the latter case a two-dimensional elemental-distribution image is required to describe the material adequately. X-ray mapping provides such of the distribution of elements.The big disadvantage of x-ray mapping hitherto has been one requirement: the transmission electron microscope must have the scanning function. In cases where the STEM functionality – to record scanning images using a variety of STEM detectors – is not used, but only x-ray mapping is intended, a significant investment must still be made in the scanning system: electronics that drive the beam, detectors for generating the scanning images, and monitors for displaying and recording the images.

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