scholarly journals Low Friction at the Nanoscale of Hydrogenated Fullerene-Like Carbon Films

Coatings ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 643
Author(s):  
Zhao Liu ◽  
Yongfu Wang ◽  
Thilo Glatzel ◽  
Antoine Hinaut ◽  
Junyan Zhang ◽  
...  
Keyword(s):  
Wear Debris ◽  
Carbon Films ◽  
Surface Structures ◽  
Nanometer Scale ◽  
Friction Force Microscopy ◽  
Low Friction ◽  
Friction Coefficients ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Friction Regime

Friction force microscopy experiments at the nanometer scale are applied to study low friction of hydrogenated fullerene-like carbon films. The measured friction coefficients indicate that lower hydrogen concentration during preparation is beneficial to enter the low friction regime, especially in combination with only methane as precursor. Furthermore, two regions are found with distinct friction coefficients and surface roughnesses related to different surface structures. One is rich in amorphous carbon and the other is rich in fullerene-like carbon, dispersed on the same surface. Transmission electron microscopy and Raman spectroscopy images verify this observation of the two separated structures, especially with the extracted fullerene-like structures in the wear debris from macro friction experiments. It is speculated that hydrogen may tend to impair the growth of fullerene-like carbon and is therefore detrimental for lubricity.

Comparative Study of Nanoscale Surface Structures of Calcite Microcrystals Using FE-SEM, AFM, and TEM

2006 ◽  
Vol 12 (4) ◽  
pp. 302-310 ◽  
Author(s):  
Yung-Ching Chien ◽  
Alfonso Mucci ◽  
Jeanne Paquette ◽  
S. Kelly Sears ◽  
Hojatollah Vali
Keyword(s):  
Electron Microscopy ◽  
Three Dimensional ◽  
Quantitative Information ◽  
Surface Structures ◽  
Surface Features ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Micrometer Size ◽  
Microscopic Techniques

The bulk morphology and surface features that developed upon precipitation on micrometer-size calcite powders and millimeter-size cleavage fragments were imaged by three different microscopic techniques: field-emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM) of Pt-C replicas, and atomic force microscopy (AFM). Each technique can resolve some nanoscale surface features, but they offer different ranges of magnification and dimensional resolutions. Because sample preparation and imaging is not constrained by crystal orientation, FE-SEM and TEM of Pt-C replicas are best suited to image the overall morphology of microcrystals. However, owing to the decoration effect of Pt-C on the crystal faces, TEM of Pt-C replicas is superior at resolving nanoscale surface structures, including the development of new faces and the different microtopography among nonequivalent faces in microcrystals, which cannot be revealed by FE-SEM. In conjunction with SEM, Pt-C replica provides the evidence that crystals grow in diverse and face-specific modes. The TEM imaging of Pt-C replicas has nanoscale resolution comparable to AFM. AFM yielded quantitative information (e.g., crystallographic orientation and height of steps) of microtopographic features. In contrast to Pt-C replicas and SEM providing three-dimensional images of the crystals, AFM can only image one individual cleavage or flat surface at a time.

Friction Properties of Array Films of Amorphous Carbon Nanorods Prepared by Dual-Catalyst Growth on Porous AAO Membrane

2005 ◽  
Author(s):  
J. P. Tu ◽  
Y. Jv ◽  
Z. Z. Xia ◽  
S. Y. Guo
Keyword(s):  
Amorphous Carbon ◽  
Catalytic Pyrolysis ◽  
Carbon Film ◽  
Ambient Air ◽  
Friction Force Microscopy ◽  
Low Friction ◽  
Ni Catalysts ◽  
Force Microscopy ◽  
Anodic Aluminum ◽  
Graphitization Degree

The array films of amorphous carbon nanorods were prepared by thermal catalytic pyrolysis of acetylene at 650°C on a porous anodic aluminum oxide (AAO) membrane with Co-Ni catalysts. The morphology and microstructure of the array films were examined by scanning electron microscopy (SEM) and Raman spectroscopy. The friction properties of array films of amorphous carbon nanorods were investigated using a ball-on-disk tribometer and a friction force microscopy (FFM) in ambient air. The friction coefficients of the array films were influenced by the graphitization degree of the amorphous carbon nanorods. The amorphous carbon film with high graphitization degree showed low friction coefficient.

scholarly journals Friction force microscopy of tribochemistry and interfacial ageing for the SiO x /Si/Au system

2018 ◽  
Vol 9 ◽  
pp. 1647-1658 ◽  
Author(s):  
Christiane Petzold ◽  
Marcus Koch ◽  
Roland Bennewitz
Keyword(s):  
Friction Force ◽  
Static Friction ◽  
Chemical Bonds ◽  
Friction Force Microscopy ◽  
Adhesion Forces ◽  
Low Friction ◽  
Friction Forces ◽  
Force Microscopy ◽  
Static Contact ◽  
Wear Friction

Friction force microscopy was performed with oxidized or gold-coated silicon tips sliding on Au(111) or oxidized Si(100) surfaces in ultrahigh vacuum. We measured very low friction forces compared to adhesion forces and found a modulation of lateral forces reflecting the atomic structure of the surfaces. Holding the force-microscopy tip stationary for some time did not lead to an increase in static friction, i.e., no contact ageing was observed for these pairs of tip and surface. Passivating layers from tip or surface were removed in order to allow for contact ageing through the development of chemical bonds in the static contact. After removal of the passivating layers, tribochemical reactions resulted in strong friction forces and tip wear. Friction, wear, and the re-passivation by oxides are discussed based on results for the temporal development of friction forces, on images of the scanned area after friction force microscopy experiments, and on electron microscopy of the tips.

Nanoscale Friction of Graphene

MRS Advances ◽  
2018 ◽  
Vol 3 (44) ◽  
pp. 2743-2748 ◽  
Author(s):  
F. Ptak ◽  
C. M. Almeida ◽  
R. Prioli
Keyword(s):  
Effective Interaction ◽  
Nanometer Scale ◽  
Friction Force Microscopy ◽  
Adhesion Forces ◽  
Friction Forces ◽  
Scanning Velocity ◽  
Graphene Surface ◽  
Force Microscopy ◽  
Number Of Layers ◽  
Open Questions

AbstractDespite being one of the oldest phenomena known to mankind and its vast use, there still are open questions about the frictional process between two surfaces, especially at the nanometer scale, such as the energy dissipation mechanism, the influence of the crystallographic orientation and the correlation between macroscopic and microscopic scales. In this work, we analyze the interaction between a sharp tip and graphene by friction force microscopy. The graphene surface roughness and adhesion forces with the microscope tip were measured. Neither roughness nor adhesion were observed to influence the friction forces. The scanning velocity dependence of friction was also measured for a different number of layers. The friction forces were observed to increase with the scanning velocity until a critical velocity is achieved by which we have estimated the effective interaction potential between the tip and the graphene surface.

High-resolution observations of PbS adsorbed structures on Mg (00.1) surface

1983 ◽  
Vol 41 ◽  
pp. 294-295
Author(s):  
N. Tanaka ◽  
K. Mihama
Keyword(s):  
Carbon Films ◽  
Surface Structures ◽  
Atomic Resolution ◽  
Specimen Preparation ◽  
Characteristic Surface ◽  
Present Specimen ◽  
Transmission Electron ◽  
Evaporation Technique ◽  
Reflection Electron Diffraction ◽  
Gas Evaporation Technique

Characteristic surface structures and adsorbed structures of metals and semiconductors have been elucidated by reflection electron diffraction techniques such as LEED and RHEED. These techniques, however, can not give the information about the atomic arrangements or adsorbed sites in a direct way. The present work is the first trial of observing the adsorbed structures of PbS grown on Mg (00.1) surfaces with atomic resolution by using transmission electron microscopy. For such trials, the specimen preparation is the most important problem which decides the success of the observations. Especially, clean, flat and thin (∽10nm) substrates should be prepared.The present specimen substrates are Mg‐platelike particles prepared by gas evaporation technique. The procedure of the specimen preparation is as follows: Mg-platelike particles (thickness ∽ 20nm) are prepared by the evaporation of Mg ribbon in 10 Torr of argon and gathered on a perforated carbon films. After re-evacuation down to 1 × 10-8 Torr of the chamber, PbS of less than 1 nm in mean thickness is deposited on the Mg-plates.

AFM studies of annealed single-crystal α-alumina surfaces

1995 ◽  
Vol 53 ◽  
pp. 332-333
Author(s):  
Jason R. Heffelfinger ◽  
Michael W. Bench ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Single Crystal ◽  
Finite Size ◽  
Atomic Level ◽  
Surface Structures ◽  
Santa Barbara ◽  
Force Microscopy ◽  
Insulating Surfaces ◽  
Atomic Force ◽  
Transmission Electron

Since the invention of atomic-force microscopy (AFM) in 1986, the technique has found an invaluable niche in the imaging of insulating surfaces. AFM allows for analysis of topographical details at the atomic level with minimum sample preparation, but the technique is subject to artifacts such as broadening of surface structures and ghost images of the tip due to the finite size and shape of the contacting probe. In the present investigation, transmission electron microscopy (TEM) and scanning electron microscopy (SEM) were used as supporting techniques to AFM in the study of annealed single-crystal α-alumina surfaces. Although discrepancies were found between the EM data and the AFM images which point to artifacts inherent to the AFM, useful information on surface step heights and roughness of terraces was gained using AFM.AFM studies were performed on a Nanoscope III (Digital Instruments, Santa Barbara, CA) using microfabricated Si3N4 cantilevers (Ultralevers, Park Inst., Sunnyvale, CA).

Friction force microscopy investigation of nanostructured carbon films

Carbon ◽  
2002 ◽  
Vol 40 (6) ◽  
pp. 883-890 ◽  
Author(s):  
R Buzio ◽  
E Gnecco ◽  
C Boragno ◽  
U Valbusa
Keyword(s):  
Friction Force ◽  
Carbon Films ◽  
Nanostructured Carbon ◽  
Friction Force Microscopy ◽  
Force Microscopy ◽  
Microscopy Investigation

Scanning and Transmission Microscopy of Nematocyst Batteries in Epitheliomuscular Cells of Hydra

1971 ◽  
Vol 29 ◽  
pp. 410-411 ◽  
Author(s):  
Jane A. Westfall ◽  
S. Yamataka ◽  
Paul D. Enos
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Osmium Tetroxide ◽  
External Surface ◽  
Three Dimensional ◽  
Surface Structures ◽  
Transmission Microscopy ◽  
Transmission Electron ◽  
Freeze Dried ◽  
Scanning Electron

Scanning electron microscopy (SEM) provides three dimensional details of external surface structures and supplements ultrastructural information provided by transmission electron microscopy (TEM). Animals composed of watery jellylike tissues such as hydras and other coelenterates have not been considered suitable for SEM studies because of the difficulty in preserving such organisms in a normal state. This study demonstrates 1) the successful use of SEM on such tissue, and 2) the unique arrangement of batteries of nematocysts within large epitheliomuscular cells on tentacles of Hydra littoralis.Whole specimens of Hydra were prepared for SEM (Figs. 1 and 2) by the fix, freeze-dry, coat technique of Small and Màrszalek. The specimens were fixed in osmium tetroxide and mercuric chloride, freeze-dried in vacuo on a prechilled 1 Kg brass block, and coated with gold-palladium. Tissues for TEM (Figs. 3 and 4) were fixed in glutaraldehyde followed by osmium tetroxide. Scanning micrographs were taken on a Cambridge Stereoscan Mark II A microscope at 10 KV and transmission micrographs were taken on an RCA EMU 3G microscope (Fig. 3) or on a Hitachi HU 11B microscope (Fig. 4).

Scanning Secondary Electron Microscopy of Myofibrils Using Transmission Techniques

1975 ◽  
Vol 33 ◽  
pp. 556-557
Author(s):  
M. K. Lamvik
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Carbon Films ◽  
Photographic Recording ◽  
Transmission Electron ◽  
Thin Carbon ◽  
The Common ◽  
Scanning Electron ◽  
Better Than ◽  
Cellular Organelles

When observing small objects such as cellular organelles by scanning electron microscopy, it is often valuable to use the techniques of transmission electron microscopy. The common practice of mounting and coating for SEM may not always be necessary. These possibilities are illustrated using vertebrate skeletal muscle myofibrils.Micrographs for this study were made using a Hitachi HFS-2 scanning electron microscope, with photographic recording usually done at 60 seconds per frame. The instrument was operated at 25 kV, with a specimen chamber vacuum usually better than 10-7 torr. Myofibrils were obtained from rabbit back muscle using the method of Zak et al. To show the component filaments of this contractile organelle, the myofibrils were partially disrupted by agitation in a relaxing medium. A brief centrifugation was done to clear the solution of most of the undisrupted myofibrils before a drop was placed on the grid. Standard 3 mm transmission electron microscope grids covered with thin carbon films were used in this study.

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