scholarly journals Induced Spirals in Polyethylene Terephthalate Films Irradiated with Ar Ions with an Energy of 70 MeV

Crystals ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 427 ◽  
Author(s):  
Adil Z. Tuleushev ◽  
Maxim V. Zdorovets ◽  
Artem L. Kozlovskiy ◽  
Fiona Erica Harrison
Keyword(s):  
Polyethylene Terephthalate ◽  
Electric Fields ◽  
Temporal Stability ◽  
Coherent Scattering ◽  
Amorphous Region ◽  
Diffraction Reflection ◽  
X Ray ◽  
Spiral Structures ◽  
Amorphous Zone ◽  
Pet Film

This paper presents the results of a study of the ordering in polyethylene terephthalate (PET) film induced by Ar8+ ions with an irradiation fluence of 2 × 1012 ions/cm2, and of the temporal stability of the induced ordering in the irradiated sample, over a three month period. Immediately after irradiation, sharp new reflections not seen at lower fluences were observed in X-ray diffraction patterns, with angular positions of 2 θ = 9–10° and 19° and variable azimuthal intensities. X-ray reflections, previously observed at lower fluences, were also seen: at 2 θ = 26° and 23°, associated with PET crystallites, and at 2 θ = 5–12°, associated with induced ordering in the amorphous zone. Aging of the irradiated sample led to significant growth of the ordering region in the amorphous zone for angles up to 2 θ < 15°, as well as to dissipation and blurring of the new diffraction reflections at 2 θ = 9–10° and 2 θ = 19° and the formation of a new diffraction ring reflection in the range 2 θ = 11–16°. The azimuthal distribution of diffraction reflection intensities immediately after irradiation displays a clear oblique cross located predominantly along lines at angles of π/4 with respect to the direction of the texture of the PET film, indicating the formation of spiral structures based on the molecular strands of PET. Our experimental results lead us to conclude that the formation of coherent scattering areas in the amorphous region at 2 θ < 15° is due to intra-chain rotations of benzene-carboxyl subunits of repeat units of the PET chain molecules interacting with the residual electric field of a single latent track; whereas the formation of spiral structures is due to the inter-chain interaction of these preordered asymmetric subunits under the influence of the electric fields from overlapping latent tracks.

scholarly journals Onnanoscale phenomena inthe electroacoustic sputtering process

2019 ◽  
Vol 18 (4) ◽  
pp. 401-407
Author(s):  
W. H. Al-Tibbi ◽  
V. S. Minakov
Keyword(s):  
Amorphous Phase ◽  
Layer Structure ◽  
Nanocrystalline Structure ◽  
Coherent Scattering ◽  
Process Conditions ◽  
Diffraction Reflection ◽  
Scattering Method ◽  
X Ray ◽  
Nanocrystalline Structures ◽  
Machine Parts

Introduction. The effect of variable parameters of the electroacoustic sputtering (ELAS) process on the characteristics of the crystalline structure of hardening coatings is studied. The ELAS parameter values providing nanostructured cover coatings for machine parts and cutting tools are determined. Hardening through using such coatings allows achieving a significant (5-10 times) increase in the life of hardenable machine parts and various tools designed for mechanical processing. To obtain coatings with the desired properties of the surface layer, nanocrystalline materials should be selected. In this case, a certain content of the amorphous phase is permissible.Materials and Methods. To carry out the X-ray structural analysis, the X-ray diffraction Russian-made device DRON-3M was used. The Scherrer-Wilson method was applied to determine the granularity of particle blocks from the value of the intrinsic broadening of the diffractogram peaks. The conclusions obtained in this paper are based on the method of separation of the affecting factor contributions into broadening the diffraction reflection peaks (the Warren-Averbach method).Research Results. Depending on the process conditions and the technique for obtaining nanostructured materials, a nonuniquely interpretable change in the indices of the diffraction peaks broadening occurs, which is generally characteristic of nanocrystalline metals. One of the possible explanations for this phenomenon is the presence of a nanosized effect in the hardened layer. The occurrence of the nanocrystalline structure in the sputtered layer verifies the calculated values of the dimensions of the coherent scattering regions (CSR). The occurrence of affecting values of the misorientation angle of the crystal structure is verified by the CSR value for the investigated 110 and 220 reflexes, which is supported by a high percentage of the amorphous phase.Discussion and Conclusions. The electroacoustic scattering method is promising for obtaining nanocrystalline structures in the surface and subsurface layers of the sprayed samples. The ELAS process variables variation leads to the parameter spread of the crystal lattice and coherent scattering areas. In this case, there is no definite trend. In the future it is expected to solve the given problem. First, experiments will be conducted to determine the optimal sputtering regimes that could stimulate the formation of nanocrystalline structures. Secondly, visual observation and evaluation of the sprayed layer structure using electron microscopy is planned.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

scholarly journals Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering

2019 ◽  
Author(s):  
Kewin Desjardins ◽  
Horia Popescu ◽  
Pascal Mercère ◽  
Claude Menneglier ◽  
Roland Gaudemer ◽  
...  
Keyword(s):  
Coherent Scattering ◽  
Cmos Camera ◽  
X Ray ◽  
Back Illuminated

scholarly journals From Femtoseconds to Hours–Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

2021 ◽  
Vol 11 (13) ◽  
pp. 6179
Author(s):  
Felix Lehmkühler ◽  
Wojciech Roseker ◽  
Gerhard Grübel
Keyword(s):  
Time Scales ◽  
Free Electron Laser ◽  
Photon Correlation Spectroscopy ◽  
Signal To Noise Ratio ◽  
Coherent Scattering ◽  
Correlation Spectroscopy ◽  
X Rays ◽  
Photon Correlation ◽  
X Ray ◽  
Scattering Technique

X-ray photon correlation spectroscopy (XPCS) enables the study of sample dynamics between micrometer and atomic length scales. As a coherent scattering technique, it benefits from the increased brilliance of the next-generation synchrotron radiation and Free-Electron Laser (FEL) sources. In this article, we will introduce the XPCS concepts and review the latest developments of XPCS with special attention on the extension of accessible time scales to sub-μs and the application of XPCS at FELs. Furthermore, we will discuss future opportunities of XPCS and the related technique X-ray speckle visibility spectroscopy (XSVS) at new X-ray sources. Due to its particular signal-to-noise ratio, the time scales accessible by XPCS scale with the square of the coherent flux, allowing to dramatically extend its applications. This will soon enable studies over more than 18 orders of magnitude in time by XPCS and XSVS.

scholarly journals Threefold Spiral Structure Constructed by 1D Chains of [[M(NCS)2(bpa)2]·biphenyl]n (M = Fe, Co; bpa = 1,2-bis(4-pyridyl)ethane)

Crystals ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 97 ◽  
Author(s):  
Satoshi Tokinobu ◽  
Haruka Dote ◽  
Satoru Nakashima
Keyword(s):  
Spin Crossover ◽  
Spiral Structure ◽  
Diffusion Method ◽  
Central Metal ◽  
X Ray ◽  
Pyridine Complex ◽  
1D Chain ◽  
One Step ◽  
Spiral Structures ◽  
1D Chains

Assembled complexes [[M(NCS)2(bpa)2]·biphenyl]n (M = Fe, Co; bpa = 1,2-bis(4-pyridyl)ethane) have been synthesized because [Fe(NCBH3)2(bpa)2·biphenyl]n has a novel threefold spiral structure and shows stepwise spin-crossover phenomenon. We attempted to obtain spiral structures for [[Fe(NCS)2(bpa)2]·biphenyl]n and [[Co(NCS)2(bpa)2]·biphenyl]n using a one-step diffusion method, while the reported spiral structure of [[Fe(NCBH3)2(bpa)2]·biphenyl]n was obtained by diffusion method after synthesizing Fe(II)-pyridine complex. X-ray structural analysis revealed that [[Fe(NCS)2(bpa)2]·biphenyl]n and [[Co(NCS)2(bpa)2]·biphenyl]n had a chiral propeller structure of pyridines around the central metal, and they had a novel spiral structure and chiral space group P3121 without the presence of chiral auxiliaries. It was shown that the host 1D chain, having a chiral propeller structure of pyridines around the central metal along with its concerted interaction with an atropisomer of biphenyl, made a threefold spiral structure.

scholarly journals Absorption Corrections for X-Ray Fluorescence Analysis of Environmental Samples

1975 ◽  
Vol 19 ◽  
pp. 381-391 ◽  
Author(s):  
F. Bazan ◽  
N. A. Bonner
Keyword(s):  
Absorption Coefficient ◽  
Environmental Samples ◽  
Fluorescence Analysis ◽  
Coherent Scattering ◽  
Absorption Coefficients ◽  
X Ray

The discovery of a very simple and useful relationship between the absorption coefficient of a particular element and the ratio of incoherent to coherent scattering by the sample containing the element is discussed. By measuring the absorption coefficients for a few elements in a few samples, absorption coefficients for many elements in an entire set of similar samples can be obtained.

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