scholarly journals Study on the Quantitative Evaluation of the Surface Force Using a Scanning Probe Microscope

Lubricants ◽  
2020 ◽  
Vol 8 (6) ◽  
pp. 66
Author(s):  
Wataru Yagi ◽  
Tomomi Honda ◽  
Kazushi Tamura ◽  
Keiichi Narita
Keyword(s):  
Force Measurement ◽  
Electrostatic Force ◽  
Surface Force ◽  
Calibration Method ◽  
Interaction Force ◽  
Polar Group ◽  
Force Microscopy ◽  
Fluid Resistance ◽  
Atomic Force ◽  
Probe Microscope

There are two types of friction modifiers (FMs) used as lubricant additives: Reaction film FMs (RF-FMs) and adsorption film FMs (AF-FMs). While RF-FMs provide good performance in severe conditions, AF-FMs excel in mild conditions. This empirical evidence leads us to combine these two FMs to cover broader conditions. However, the effects of their combination are highly complicated due to the interaction between these FMs. If the interaction force of AF-FMs with various materials can be evaluated, it would help us to improve tribological performances of lubricants. Although atomic force microscopy seems suitable for this application, we found some obstacles, such as fluid resistance, electrostatic force, and laser positioning of the cantilever, to achieve proper measurements of the adsorption force. In this study, the adsorption force between the polar group and the surface was directly measured in oil with a 1 µm silica probe modified with CH3 or COOH. This paper proposed how to eliminate errors included in the adsorption force measurement using AFM and a calibration method for obtaining an accurate adsorption force of the polar group, and a test of normality of the measured data was conducted by 400 measurements. As a result, it was shown that approximately 100 tests were needed to obtain an accurate adsorption force in this study.

scholarly journals Anomalous Interfacial Structuring of a Non-Halogenated Ionic Liquid: Effect of Substrate and Temperature

2018 ◽  
Vol 2 (4) ◽  
pp. 60 ◽  
Author(s):  
Milad Radiom ◽  
Patricia Pedraz ◽  
Georgia Pilkington ◽  
Patrick Rohlmann ◽  
Sergei Glavatskih ◽  
...  
Keyword(s):  
Ionic Liquid ◽  
Surface Charge ◽  
Force Measurement ◽  
Surface Force ◽  
Solid Surfaces ◽  
Effect Of Temperature ◽  
Decay Length ◽  
Force Microscopy ◽  
Large Size ◽  
Atomic Force

We investigate the interfacial properties of the non-halogenated ionic liquid (IL), trihexyl(tetradecyl)phosphonium bis(mandelato)borate, [P6,6,6,14][BMB], in proximity to solid surfaces, by means of surface force measurement. The system consists of sharp atomic force microscopy (AFM) tips interacting with solid surfaces of mica, silica, and gold. We find that the force response has a monotonic form, from which a characteristic steric decay length can be extracted. The decay length is comparable with the size of the ions, suggesting that a layer is formed on the surface, but that it is diffuse. The long alkyl chains of the cation, the large size of the anion, as well as crowding of the cations at the surface of negatively charged mica, are all factors which are likely to oppose the interfacial stratification which has, hitherto, been considered a characteristic of ionic liquids. The variation in the decay length also reveals differences in the layer composition at different surfaces, which can be related to their surface charge. This, in turn, allows the conclusion that silica has a low surface charge in this aprotic ionic liquid. Furthermore, the effect of temperature has been investigated. Elevating the temperature to 40 °C causes negligible changes in the interaction. At 80 °C and 120 °C, we observe a layering artefact which precludes further analysis, and we present the underlying instrumental origin of this rather universal artefact.

scholarly journals Influence of spurious resonances on the interaction force in dynamic AFM

2015 ◽  
Vol 6 ◽  
pp. 420-427 ◽  
Author(s):  
Luca Costa ◽  
Mario S Rodrigues
Keyword(s):  
Calibration Method ◽  
Interaction Force ◽  
Measured Signal ◽  
Acoustic Excitation ◽  
Cantilever Deflection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Excitation Force ◽  
Tip Position ◽  
Effective Excitation

The quantification of the tip–sample interaction in amplitude modulation atomic force microscopy is challenging, especially when measuring in liquid media. Here, we derive formulas for the tip–sample interactions and investigate the effect of spurious resonances on the measured interaction. Highlighting the differences between measuring directly the tip position or the cantilever deflection, and considering both direct and acoustic excitation, we show that the cantilever behavior is insensitive to spurious resonances as long as the measured signal corresponds to the tip position, or if the excitation force is correctly considered. Since the effective excitation force may depend on the presence of such spurious resonances, only the case in which the frequency is kept constant during the measurement is considered. Finally, we show the advantages that result from the use of a calibration method based on the acquisition of approach–retract curves.

Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

2005 ◽  
Vol 77 (12) ◽  
pp. 2149-2170 ◽  
Author(s):  
John Ralston ◽  
Ian Larson ◽  
Mark W. Rutland ◽  
Adam A. Feiler ◽  
Mieke Kleijn
Keyword(s):  
Surface Force ◽  
Distinct Advantage ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Technical Report ◽  
Relative Separation ◽  
Frictional Forces ◽  
Probe Microscope ◽  
Friction Measurements

The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection of the spring, which is monitored optically. Usually, a feedback loop is employed, which holds the spring deflection constant, and the corresponding movement of the piezoelectric positioner thus generates the image. From this it can be seen that the scanning AFM has all the attributes necessary for the determination of surface and adhesion forces; a sensitive spring to determine the force, a piezoelectric crystal to alter the separation of the tip and surface, which if sufficiently well-calibrated also allows the relative separation of the tip and surface to be calculated. One can routinely quantify both the net surface force (and its separation dependence) as the probe approaches the sample, and any adhesion (pull-off) force on retraction. Interactions in relevant or practical systems may be studied, and, in such cases, a distinct advantage of the AFM technique is that a particle of interest can be attached to the end of the cantilever and the interaction with a sample of choice can be studied, a method often referred to as colloid probe microscopy. The AFM, or, more correctly, the scanning probe microscope, can thus be used to measure surface and frictional forces, the two foci of this article. There have been a wealth of force and friction measurements performed between an AFM tip and a surface, and many of the calibration and analysis issues are identical to those necessary for colloid probe work. We emphasize that this article confines itself primarily to elements of colloid probe measurement using the AFM.

scholarly journals Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

2014 ◽  
Vol 5 ◽  
pp. 1899-1904 ◽  
Author(s):  
Stanislav S Borysov ◽  
Daniel Forchheimer ◽  
David B Haviland
Keyword(s):  
Force Measurement ◽  
Single Point ◽  
Surface Force ◽  
Calibration Method ◽  
Dynamic Calibration ◽  
Reconstruction Technique ◽  
Force Microscopy ◽  
Physical Amplitude ◽  
Force Reconstruction ◽  
Optical Lever

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

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