scholarly journals Comprehensive Properties of a Novel Quaternary Sn-Bi-Sb-Ag Solder: Wettability, Interfacial Structure and Mechanical Properties

Metals ◽  
2019 ◽  
Vol 9 (7) ◽  
pp. 791 ◽  
Author(s):  
Kaipeng Wang ◽  
Fengjiang Wang ◽  
Ying Huang ◽  
Kai Qi
Keyword(s):  
Tensile Strength ◽  
Shear Strength ◽  
Low Temperature ◽  
Strain Rate ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Solder Matrix ◽  
Interfacial Structure ◽  
Solder Alloys ◽  
Cu Substrate

Sn-58Bi eutectic solder is the most recommended low temperature Pb-free solder but is also limited from the interfacial embrittlement of Bi segregation. Since the quaternary Sn-38Bi-1.5Sb-0.7Ag solder provides a similar melting point as Sn-58Bi eutectic, this paper systematically investigated the properties of this solder from wettability, bulk tensile properties, interfacial microstructure in solder joints with a Cu substrate, interfacial evolution in joints during isothermal aging and the shear strength on ball solder joints with effect of aging conditions. The results were also compared with Sn-58Bi solder. The wettability of solder alloys was evaluated with wetting balance testing, and the quaternary Sn-38Bi-1.5Sb-0.7Ag solder had a better wettability than Sn-58Bi solder on the wetting time. Tensile tests on bulk solder alloys indicated that the quaternary Sn-38Bi-1.5Sb-0.7Ag solder had a higher tensile strength and similar elongation compared with Sn-58Bi solder due to the finely distributed SnSb and Ag3Sn intermetallics in the solder matrix. The tensile strength of solder decreased with a decrease in the strain rate and with an increase in temperature, while the elongation of solder was independent of the temperature and strain rate. When soldering with a Cu substrate, a thin Cu6Sn5 intermetallic compound (IMC) is produced at the interface in the solder joint. Measurement on IMC thickness showed that the quaternary Sn-38Bi-1.5Sb-0.7Ag had a lower IMC growth rate during the following isothermal aging. Ball shear test on solder joints illustrated that the quaternary Sn-38Bi-1.5Sb-0.7Ag solder joints had higher shear strength than Sn-58Bi solder joints. Compared with the serious deterioration on shear strength of Sn-58Bi joints from isothermal aging, the quaternary Sn-38Bi-1.5Sb-0.7Ag solder joints presented a superior high temperature stability. Therefore, the quaternary Sn-38Bi-1.5Sb-0.7Ag solder provides better performances and the possibility to replace Sn-58Bi solder to realize low temperature soldering.

A design of a new miniature device for solder joints’ mechanical properties evaluation

2016 ◽  
Vol 231 (20) ◽  
pp. 3818-3830 ◽  
Author(s):  
Quang-Bang Tao ◽  
Lahouari Benabou ◽  
Laurent Vivet ◽  
Ky-Lim Tan ◽  
Jean-Michel Morelle ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Shear Strength ◽  
Strain Rate ◽  
Solder Joints ◽  
Testing Machine ◽  
Testing Temperature ◽  
Material Behavior ◽  
Shear Strain Rate ◽  
Solder Alloys ◽  
Lap Shear

This paper makes a focus on the design of a micro-testing machine used for evaluating the mechanical properties of solder alloys. The different parts of the testing device have been developed and assembled in a manner that will facilitate the study of miniature solder joints as used in electronic packaging. A specific procedure for fabricating miniature lap-shear joint specimens is proposed in this work. The tests carried out with the newly developed machine serve to determine the material behavior of solder joints under different controlled loading and temperature conditions. Two new solder alloys, namely SACBiNi and Innolot, are characterized in the study, showing the influence of strain rate and temperature parameters on their respective mechanical responses. In addition, the as-cast and fracture surfaces of the solder joints are observed with a scanning electron microscope to reveal the degradation mechanisms. The SACBiNi solder alloy, which contains less Ni and Sb elements, is found to have smaller shear strength than the Innolot alloy, while its elongation to rupture is significantly improved at the same strain rate level and testing temperature. The highest shear strength is 58.9 MPa and 61.1 MPa under the shear strain rate of 2.0 × 10−2 s−1 and room temperature for the SACBiNi and Innolot solder joints, respectively. In contrast, the lowest shear strength values, 26.6 MPa and 29.5 MPa for SACBiNi and Innolot, respectively, were recorded for the strain rate value of 2.0 × 10−4 s−1 and at temperature of 125℃.

Solder Joint Reliability of Sn-Cu and Sn-Ag-Cu Lead-Free Solder Alloys Solidified on Copper Substrates with Different Surface Roughnesses

2015 ◽  
Vol 830-831 ◽  
pp. 265-269
Author(s):  
Satyanarayan ◽  
K.N. Prabhu
Keyword(s):  
Solder Joint ◽  
Solder Matrix ◽  
Lead Free ◽  
Lead Free Solder ◽  
Solder Alloys ◽  
Cu Substrate ◽  
Cu Substrates ◽  
Free Solder ◽  
Substrate Surfaces ◽  
Lead Free Solders

In the present work, the bond strength of Sn-0.7Cu, Sn-0.3Ag-0.7Cu, Sn-2.5Ag-0.5Cu and Sn-3Ag-0.5Cu lead free solders solidified on Cu substrates was experimentally determined. The bond shear test was used to assess the integrity of Sn–Cu and Sn–Ag–Cu lead-free solder alloy drops solidified on smooth and rough Cu substrate surfaces. The increase in the surface roughness of Cu substrates improved the wettability of solders. The wettability was not affected by the Ag content of solders. Solder bonds on smooth surfaces yielded higher shear strength compared to rough surfaces. Fractured surfaces revealed the occurrence of ductile mode of failure on smooth Cu surfaces and a transition ridge on rough Cu surfaces. Though rough Cu substrate improved the wettability of solder alloys, solder bonds were sheared at a lower force leading to decreased shear energy density compared to the smooth Cu surface. A smooth surface finish and the presence of minor amounts of Ag in the alloy improved the integrity of the solder joint. Smoother surface is preferable as it favors failure in the solder matrix.

scholarly journals Dynamic Observation of Interfacial IMC Evolution and Fracture Mechanism of Sn2.5Ag0.7Cu0.1RE/Cu Lead-Free Solder Joints during Isothermal Aging

Materials ◽  
2020 ◽  
Vol 13 (4) ◽  
pp. 831 ◽  
Author(s):  
Di Zhao ◽  
Keke Zhang ◽  
Ning Ma ◽  
Shijie Li ◽  
Chenxiang Yin ◽  
...  
Keyword(s):  
Growth Rate ◽  
Fracture Mechanism ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Diffusion Mechanism ◽  
Bulk Diffusion ◽  
Cu Substrate ◽  
Dynamic Observation ◽  
Free Solder ◽  
The Relationship

Dynamic observation of the microstructure evolution of Sn2.5Ag0.7Cu0.1RE/Cu solder joints and the relationship between the interfacial intermetallic compound (IMC) and the mechanical properties of the solder joints were investigated during isothermal aging. The results showed that the original single scallop-type Cu6Sn5 IMC gradually evolved into a planar double-layer IMC consisting of Cu6Sn5 and Cu3Sn IMCs with isothermal aging. In particular, the Cu3Sn IMC grew towards the Cu substrate and the solder seam sides; growth toward the Cu substrate side was dominant during the isothermal aging process. The growth of Cu3Sn IMC depended on the accumulated time at a certain temperature, where the growth rate of Cu3Sn was higher than that of Cu6Sn5. Additionally, the growth of the interfacial IMC was mainly controlled by bulk diffusion mechanism, where the activation energies of Cu6Sn5 and Cu3Sn were 74.7 and 86.6 kJ/mol, respectively. The growth rate of Cu3Sn was slightly faster than that of Cu6Sn5 during isothermal aging. With increasing isothermal aging time, the shear strength of the solder joints decreased and showed a linear relationship with the thickness of Cu3Sn. The fracture mechanism of the solder joints changed from ductile fracture to brittle fracture, and the fracture pathway transferred from the solder seam to the interfacial IMC layer.

scholarly journals Shear Strength and Aging Characteristics of Sn-3.0Ag-0.5Cu/Cu Solder Joint Reinforced with ZrO2 Nanoparticles

Metals ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 1295
Author(s):  
Sri Harini Rajendran ◽  
Seung Jun Hwang ◽  
Jae Pil Jung
Keyword(s):  
Shear Strength ◽  
Solder Joint ◽  
Solder Joints ◽  
Solder Matrix ◽  
Fracture Analysis ◽  
Zro2 Nanoparticles ◽  
Solder Paste ◽  
Lap Shear ◽  
Matrix Fracture ◽  
The Matrix

This study investigates the shear strength and aging characteristics of Sn-3.0Ag-0.5Cu (SAC 305)/Cu joints by the addition of ZrO2 nanoparticles (NPs) having two different particle size: 5–15 nm (ZrO2A) and 70–90 nm (ZrO2B). Nanocomposite pastes were fabricated by mechanically mixing ZrO2 NPs and the solder paste. ZrO2 NPs decreased the β-Sn grain size and Ag3Sn intermetallic compound (IMC) in the matrix and reduced the Cu6Sn5 IMC thickness at the interface of lap shear SAC 305/Cu joints. The effect is pronounced for ZrO2A NPs added solder joint. The solder joints were isothermally aged at 175 °C for 24, 48, 144 and 256 h. NPs decreased the diffusion coefficient from 1.74 × 10–16 m/s to 3.83 × 10–17 m/s and 4.99 × 10–17 m/s for ZrO2A and ZrO2B NPs added SAC 305/Cu joints respectively. The shear strength of the solder joints decreased with the aging time due to an increase in the thickness of interfacial IMC and coarsening of Ag3Sn in the solder. However, higher shear strength exhibited by SAC 305-ZrO2A/Cu joints was attributed to the fine Ag3Sn IMC’s dispersed in the solder matrix. Fracture analysis of SAC 305-ZrO2A/Cu joints displayed mixed solder/IMC mode upon 256 h of aging.

Effects of Current Stressing and Isothermal Aging on the Tensile Strength of Microscale Lead-Free Solder Joints with Different Joint Volumes

2013 ◽  
Vol 634-638 ◽  
pp. 2800-2803 ◽  
Author(s):  
Li Meng Yin ◽  
Yan Fei Geng ◽  
Zhang Liang Xu ◽  
Song Wei
Keyword(s):  
Tensile Strength ◽  
Current Density ◽  
Isothermal Aging ◽  
Solder Joints ◽  
High Current Density ◽  
Copper Wire ◽  
Lead Free ◽  
Lead Free Solder ◽  
Current Stressing ◽  
Free Solder

Adopting an accurate micro-tensile method based on dynamic mechanical analyzer (DMA) instrument, the tensile strength of three kinds of copper-wire/solder/copper-wire sandwich structured microscale lead-free solder joints that underwent current stressing with a direct current density of 1.0×104 A/cm2 and loading time of 48 hours were investigated, and compared with those solder joints isothermal aged at 100 0C for 48 hours and as-reflowed condition. These three kinds of microscale columnar solder joints have different volumes, i.e., a same diameter of 300 μm but different heights of 100 μm, 200 μm and 300 μm. Experimental results show that both current stressing and isothermal aging degrades the tensile strength of microscale solder joints, and the solder joint with smaller volume obtains higher tensile strength under same test condition. In addition, current stressing induces obvious electromigration (EM) issue under high current density of 1.0×104 A/cm2, resulting in the decreasing of tensile strength and different fracture position, mode and surface morphology of microscale solder joints. The degree of strength degradation increases with the increasing of joint height when keep joint diameter constant, this is mainly due to that electromigration leads to voids form and grow at the interface of cathode, and solder joints with larger volume may contains more soldering defects as well.

Tensile Mechanical Properties of HTPB Propellant at Low Temperature

2018 ◽  
Vol 765 ◽  
pp. 54-59 ◽  
Author(s):  
Xiang Dong Chen ◽  
Xin Long Chang ◽  
You Hong Zhang ◽  
Bin Wang ◽  
Qing Zhang ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Tensile Strength ◽  
Low Temperature ◽  
Strain Rate ◽  
Structural Integrity ◽  
Master Curves ◽  
Initial Modulus ◽  
Static Mechanical ◽  
Htpb Propellant ◽  
Integrity Analysis

To study the low temperature effects of tensile mechanical properties on Hydroxyl-terminated polybutadiene (HTPB) propellant, a quasi-static mechanical experiment was conducted. The results show that tensile mechanical parameters are closely related to strain rate and low temperature. With the decrease of temperature and increase of strain rate, the modulus and tensile strength of HTPB propellant increase obviously. Based on the time-temperature equivalence principle (TTEP), the master curves of tensile strength and initial modulus for HTPB propellant were obtained, which can facilitate the structural integrity analysis of the propellant. The damage of propellant is matrix tearing and dewetting between the filled particles and matrix.

Solder joint quality evaluation based on heating factor

Circuit World ◽  
2018 ◽  
Vol 44 (1) ◽  
pp. 37-44 ◽  
Author(s):  
Petr Veselý ◽  
Eva Horynová ◽  
Jiří Starý ◽  
David Bušek ◽  
Karel Dušek ◽  
...  
Keyword(s):  
Shear Strength ◽  
Solder Alloy ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Strength Increase ◽  
Technological Parameters ◽  
Content Type ◽  
Soldering Process ◽  
Before And After ◽  
Joint Quality

Purpose The purpose of this paper is to increase the reliability of manufactured electronics and to reveal reliability significant factors. The experiments were focused especially on the influence of the reflow oven parameters presented by a heating factor. Design/methodology/approach The shear strength of the surface mount device (SMD) resistors and their joint resistance were analyzed. The resistors were assembled with two Sn/Ag/Cu-based and one Bi-based solder pastes, and the analysis was done for several values of the heating factor and before and after isothermal aging. The measurement of thickness of intermetallic compounds was conducted on the micro-sections of the solder joints. Findings The shear strength of solder joints based on the Sn/Ag/Cu-based solder alloy started to decline after the heating factor reached the value of 500 s · K, whereas the shear strength of the solder alloy based on the Bi alloy (in the measured range) always increased with an increase in the heating factor. Also, the Bi-based solder joints showed shear strength increase after isothermal aging in contrast to Sn/Ag/Cu-based solder joints, which showed shear strength decrease. Originality/value The interpretation of the results of such a comprehensive measurement leads to a better understanding of the mutual relation between reliability and other technological parameters such as solder alloy type, surface finish and parameters of the soldering process.

High Strain Rate Mechanical Properties of SAC-Q Between -65°C and +200°C After Exposure to Isothermal Aging

2020 ◽  
Author(s):  
Pradeep Lall ◽  
Vishal Mehta ◽  
Jeff Suhling ◽  
Ken Blecker
Keyword(s):  
Mechanical Properties ◽  
Strain Rate ◽  
Isothermal Aging ◽  
High Strain ◽  
Strain Rates ◽  
Solder Alloys ◽  
Stress Strain ◽  
Wide Range ◽  
Operating Temperatures ◽  
Electronic Parts

Abstract In many industries, such as automotive, oil and gas, aerospace, medical technologies, electronic parts can often be exposed to high strain loads during shocks, vibrations and drop-impact conditions. Such electronic parts can often be subjected to extreme low and high temperatures ranging from −65°C to 200°C. Also, these electronic devices can be subjected to strain rates of 1 to 100 per second in the critical environment. Recently, many doped SAC solder alloys are being introduced in the electronic component including SAC-Q, SAC-R, Innolot. SAC-Q is made with addition of Bi in Sn-Ag-Cu composition. Mechanical characteristic results and data for lead-free solder alloys are extremely important for optimizing electronic package reliability, at high temperature storage and elevated strain rates. Furthermore, the mechanical properties of solder alloys can be changed significantly due to a thermal aging, which is causing modification of microstructure. Data for the SAC-Q solder alloy with a high temp aging and testing at extreme low to high operating temperatures are not available. SAC-Q material was tested and analyzed for this study at range of operating temperatures of −65°C to 200°C and at a strain rate up to 75 per second. After the specimens were manufactured and reflowed, specimens were stored at 100°C for the isothermal aging for up to 90 days, before tensile tests were carried out at different operating temperatures. For the wide range of strain rates and test temperatures, stress-strain curves are established. In addition, the measured experimental results and data were fitted to the Anand viscoplasticity model and the Anand constants were calculated by estimating the stress-strain behavior measured in the wide range of operating temperatures and strain rates.

Isothermal Aging Effects on the Microstructure, IMC and Strength of SnAgCu/Cu Solder Joint

2007 ◽  
Vol 353-358 ◽  
pp. 2928-2931 ◽  
Author(s):  
Xiao Yan Li ◽  
Xiao Hua Yang ◽  
Wei Zhen Dui ◽  
Ben Sheng Wu
Keyword(s):  
Tensile Strength ◽  
Solder Joint ◽  
Aging Time ◽  
Isothermal Aging ◽  
Solder Matrix ◽  
Aging Effects ◽  
Imcs Layer ◽  
X Ray ◽  
Formation And Evolution ◽  
Free Solder

The formation and evolution of the intermetallic compound (IMCs) between SnAgCu lead-free solder and Cu substrate, after isothermal aging at 150°C for 24, 48, 120, 240 and 480 hours, were studied. Scanning electron microscope (SEM) was used to observe the microstructure evolution of solder joint during aging. The IMC phases were identified by energy dispersive X-ray (EDX). The results showed that IMCs layer of Cu6Sn5 was formed at the interface of solder and Cu during reflowing. With the increase of aging time, the grain size of the interfacial Cu6Sn5 increased and the morphology of the interfacial Cu6Sn5 column was changed from scallop-like to needle-like and then to rod-like and finally to particles. At the same time, the rod-like Ag3Sn phase formed at the interface of solder and the IMCs layer of Cu6Sn5 with the aging time increased. In addition, large Cu6Sn5 formed in the solder with the aging time increased. The tensile strength was measured for the solder joints. The results showed that the tensile strength increases slightly at beginning and then decreases with the aging time. SEM was used to observe the fracture surface and it showed that the fracture position moved from solder matrix to the interfacial Cu6Sn5 IMCs layer with the aging time increased. The weakening of the solder matrix is caused by the coarsening of the eutectic solder structures. The weakening of the interfacial IMCs layer is caused by the evolution of morphology and size of the interface Cu6Sn5 layer.

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