scholarly journals Reinforcement of Natural Rubber Latex Using Jute Carboxycellulose Nanofibers Extracted Using Nitro-Oxidation Method

Nanomaterials ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 706 ◽  
Author(s):  
Sunil K. Sharma ◽  
Priyanka R. Sharma ◽  
Simon Lin ◽  
Hui Chen ◽  
Ken Johnson ◽  
...  
Keyword(s):  
Natural Rubber ◽  
Natural Rubber Latex ◽  
High Energy ◽  
Effective Diameter ◽  
Rubber Latex ◽  
Carboxyl Content ◽  
Force Microscopy ◽  
Petroleum Price ◽  
Atomic Force ◽  
Transmission Electron

Synthetic rubber produced from nonrenewable fossil fuel requires high energy costs and is dependent on the presumed unstable petroleum price. Natural rubber latex (NRL) is one of the major alternative sustainable rubber sources since it is derived from the plant ‘Hevea brasiliensis’. Our study focuses on integrating sustainably processed carboxycellulose nanofibers from untreated jute biomass into NRL to enhance the mechanical strength of the material for various applications. The carboxycellulose nanofibers (NOCNF) having carboxyl content of 0.94 mmol/g was prepared and integrated into its nonionic form (–COONa) for its higher dispersion in water to increase the interfacial interaction between NRL and NOCNF. Transmission electron microscopy (TEM) and atomic force microscopy (AFM) analyses of NOCNF showed the average dimensions of nanofibers were length (L) = 524 ± 203 nm, diameter (D) 7 ± 2 nm and thickness 2.9 nm. Furthermore, fourier transform infra-red spectrometry (FTIR) analysis of NOCNF depicted the presence of carboxyl group. However, the dynamic light scattering (DLS) measurement of NRL demonstrated an effective diameter in the range of 643 nm with polydispersity of 0.005. Tensile mechanical strengths were tested to observe the enhancement effects at various concentrations of NOCNF in the NRL. Mechanical properties of NRL/NOCNF films were determined by tensile testing, where the results showed an increasing trend of enhancement. With the increasing NOCNF concentration, the film modulus was found to increase quite substantially, but the elongation-to-break ratio decreased drastically. The presence of NOCNF changed the NRL film from elastic to brittle. However, at the NOCNF overlap concentration (0.2 wt. %), the film modulus seemed to be the highest.

Unravelling the nanometre-scale stimuli-responsive properties of natural rubber latex particles using atomic force microscopy

Soft Matter ◽  
2012 ◽  
Vol 8 (9) ◽  
pp. 2724 ◽  
Author(s):  
Fabien Gaboriaud ◽  
Benoit de Gaudemaris ◽  
Thomas Rousseau ◽  
Sylvie Derclaye ◽  
Yves F. Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Natural Rubber ◽  
Natural Rubber Latex ◽  
Stimuli Responsive ◽  
Rubber Latex ◽  
Latex Particles ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Preparation of Positively Charged Membrane from Natural Rubber Latex Blending with Chitosan

2014 ◽  
Vol 24 (3S1) ◽  
pp. 51-56
Author(s):  
Wirach Taweepreda ◽  
Supawadee Tuaybut ◽  
Sineenart Puangmanee ◽  
Tran Dang Khoa
Keyword(s):  
Natural Rubber ◽  
Film Formation ◽  
Natural Rubber Latex ◽  
Interfacial Polarization ◽  
Rubber Latex ◽  
Weight Percentage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Two Peaks ◽  
Positively Charged

Film formation of natural rubber latex (NRL) blended with various concentrations of chitosan was investigated. Atomic force microscopy (AFM) images clearly showed that the NRL film covered chitosan phase. Roughness of the films which was calculated from AFM image increases with increasing chitosan concentration. Miscibility of NRL and chitosan in solution was investigated by using dynamic mechanical thermal analysis (DMTA) and found that chitosan incorporated with NRL less than 40 weight percentage (wt%) was partially miscible. Films  of the chitosan blending with higher NRL contents exhibited two peaks of glass transition temperatures. Interfacial polarization and dielectric properties of polymer films were improved with increasing NRL contents. Chemical structure of the blends was characterized by using attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR).

Study of Swift Heavy Ion Irradiation Induced Nanophases of TiO2

2013 ◽  
Vol 24 ◽  
pp. 133-139 ◽  
Author(s):  
Madhavi Thakurdesai ◽  
A. Mahadkar ◽  
Varsha Bhattacharyya
Keyword(s):  
Thin Films ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Heavy Ion ◽  
High Energy ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Non Equilibrium

Ion beam irradiation is a unique non-equilibrium technique for phase formation and material modification. Localized rise in temperature and ultra fast (~1012 s) dissipations of impinging energy make it an attractive tool for nanostructure synthesize. Dense electronic excitation induced spatial and temporal confinement of high energy in a narrow dimension leads the system to a highly non-equilibrium state and the system then relaxes dynamically inducing nucleation of nanocrystals along the latent track. In the present investigation, amorphous thin films of TiO2 are irradiated by 100 MeV Ag ion beam. These irradiated thin films are characterized by Atomic Force Microscopy (AFM), Glancing Angle X-ray Diffraction (GAXRD), Transmission Electron Microscopy (TEM) and UV-VIS absorption spectroscopy. AFM and TEM studies indicate formation of circular nanoparticles of size 10±2 nm in a film irradiated at a fluence of 1×1012 ions.cm-2. Nanophase formation is also inferred from the blueshift observed in UV-VIS absorption band edge.

Investigation of ZnFe2O4 Nanoparticles Prepared by High Energy Milling

2009 ◽  
Author(s):  
S. S. Srinivasan ◽  
N. Kislov ◽  
Yu. Emirov ◽  
D. Y. Goswami ◽  
E. K. Stefanakos
Keyword(s):  
Electron Microscopy ◽  
Particle Size ◽  
Energy Gap ◽  
Blue Shift ◽  
High Energy ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coefficient Estimation ◽  
Transmission Electron

Nanoparticles of Zinc Ferrite (ZnFe2O4) prepared by both wet- and dry- high-energy ball milling (HEBM), have been investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM), surface area and pore size distribution (BET) and wavelength-dependent diffuse reflectance and scattering turned into absorption coefficient estimation using the Kubelka-Munk theory. It was found that after 72 hours of HEBM, the particle size was decreased from 220 nm for the initial material to 16.5 nm and 9.4 nm for the wet- and dry-milled samples, respectively. The optical absorption analysis revealed that the energy gap is increased (blue shift) by 0.45 eV for wet-milled and decreased (“anomalous” red shift) by 0.15 eV for dry-milled samples of ZnFe2O4 as the particle size decreased.

Compliance at the GaSb/GaP Interface by Misfit Dislocations Array

2011 ◽  
Vol 324 ◽  
pp. 85-88
Author(s):  
Salim El Kazzi ◽  
Ludovic Desplanque ◽  
Christophe Coinon ◽  
Yi Wang ◽  
Pierrre Ruterana ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Energy ◽  
Misfit Dislocations ◽  
Initial Growth ◽  
Electron Diffraction Analysis ◽  
High Energy Electron ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

We study the initial growth of 10 monolayers (MLs) of GaSb on a (001) GaP substrate. Transmission electron microscopy and reflection high energy electron diffraction analysis show that an Sb-rich GaP surface promotes the formation of a 90° misfit dislocation array at the epi-substrate interface. Using atomic force microscopy, we investigate the influence of the growth temperature and the growth rate on the formation and the shape of GaSb islands.

scholarly journals MORPHOLOGY OF SILICA-REINFORCED NATURAL RUBBER: THE EFFECT OF SILANE COUPLING AGENT

2015 ◽  
Vol 88 (3) ◽  
pp. 359-372 ◽  
Author(s):  
S. Salina Sarkawi ◽  
Wilma K. Dierkes ◽  
Jacques W. M. Noordermeer
Keyword(s):  
Natural Rubber ◽  
Coupling Agent ◽  
Silane Coupling Agent ◽  
Phase Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Bound Rubber ◽  
Silane Coupling ◽  
Deproteinized Natural Rubber

ABSTRACT A good dispersion of silica in a rubber vulcanizate is important as it influences the filler-to-rubber interaction and consequently the final properties. This article presents an investigation into the morphology of silica-reinforced natural rubber (NR) in the presence and absence of a silane coupling agent, bis(triethoxysilylpropyl) tetrasulfide (TESPT). Micro- and nano-dispersion morphologies of silica in NR and deproteinized natural rubber (DPNR) are studied by using atomic force microscopy (AFM). Using a special network visualization technique based on transmission electron microscopy (TEM), insight into the silica and rubber interaction in the NR and DPNR is gained. In the absence of silane, vacuoles around the silica particles are formed as a result of a weak filler–polymer interaction, whereas the presence of silane leads to strong filler-to-rubber bonding, which prevents formation of vacuoles. Improvement of the micro-dispersion of silica in the NR and DPNR vulcanizates with the use of TESPT is observed from AFM phase imaging. The correlation between the filler-to-rubber interaction as analyzed by TEM and AFM and bound rubber contents as well as the Payne effect is discussed.

scholarly journals Микроскопия поверхности кремния, имплантированного ионами серебра высокими дозами

2019 ◽  
Vol 89 (2) ◽  
pp. 226
Author(s):  
В.В. Воробьев ◽  
А.М. Рогов ◽  
Ю.Н. Осин ◽  
В.И. Нуждин ◽  
В.Ф. Валеев ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Ion Beam ◽  
Threshold Value ◽  
Beam Current ◽  
High Energy ◽  
Implantation Dose ◽  
Beam Current Density ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

AbstractLow-energy ( E = 30 keV) Ag^+ ions have been implanted into single-crystalline Si wafers (c-Si) with an implantation dose varying from 1.25 × 10^15 to 1.5 × 10^17 ions cm^–2 and an ion beam current density varying from 2 to 15 μA/cm^2. The surface morphology of implanted wafers has been examined using scanning electron microscopy, transmission electron microscopy, and atomic force microscopy, and their structure has been studied by means of reflection high-energy electron diffraction and elemental microanalysis. It has been shown that for minimal irradiation doses used in experiments, the surface layer of c-Si experiences amorphization. It has been found that when the implantation dose is in excess of the threshold value (~3.1 × 10^15 ions cm^–2), Ag nanoparticles uniformly distributed over the Si surface arise in the irradiated Si layer. At a dose exceeding 10^17 ions cm^–2, a porous Si structure is observed. In this case, the Ag nanoparticle size distribution becomes bimodal with coarse particles localized at the walls of Si pores.

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