scholarly journals Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

2014 ◽  
Vol 5 ◽  
pp. 407-412 ◽  
Author(s):  
Florian Pielmeier ◽  
Daniel Meuer ◽  
Daniel Schmid ◽  
Christoph Strunk ◽  
Franz J Giessibl
Keyword(s):  
Low Temperatures ◽  
Force Sensor ◽  
Frequency Variation ◽  
Force Sensors ◽  
Force Measurements ◽  
Temperature Changes ◽  
Force Microscopy ◽  
Atomic Force ◽  
New Type ◽  
The Stability

In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8–48 K. The sensors are based on the qPlus and length extensional principle. The frequency variation with temperature T for all sensors is negative up to 30 K and on the order of 1 ppm/K, up to 13 K, where a distinct kink appears, it is linear. Furthermore, we characterize a new type of miniaturized qPlus sensor and confirm the theoretically predicted reduction in detector noise.

Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

2008 ◽  
Vol 79 (3) ◽  
pp. 033708 ◽  
Author(s):  
Hui Xie ◽  
Julien Vitard ◽  
Sinan Haliyo ◽  
Stéphane Régnier ◽  
Mehdi Boukallel
Keyword(s):  
Atomic Force Microscopy ◽  
Force Sensor ◽  
Lateral Force ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force

Surface diagnostics for scale analysis

2004 ◽  
Vol 49 (2) ◽  
pp. 183-190 ◽  
Author(s):  
S. Dunn ◽  
S. Impey ◽  
C. Kimpton ◽  
S.A. Parsons ◽  
J. Doyle ◽  
...  
Keyword(s):  
Adhesion Force ◽  
Polymer Materials ◽  
Rapid Screening ◽  
Force Measurements ◽  
Energy Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Modified ◽  
Surface Diagnostics ◽  
Microscopy Techniques

Stainless steel, polymethylmethacrylate and polytetrafluoroethylene coupons were analysed for surface topographical and adhesion force characteristics using tapping mode atomic force microscopy and force-distance microscopy techniques. The two polymer materials were surface modified by polishing with silicon carbide papers of known grade. The struvite scaling rate was determined for each coupon and related to the data gained from the surface analysis. The scaling rate correlated well with adhesion force measurements indicating that lower energy materials scale at a lower rate. The techniques outlined in the paper provide a method for the rapid screening of materials in potential scaling applications.

Growth of 4H-SiC Single Crystals on 6H-SiC Seeds with an Open Backside by PVT Method

2009 ◽  
Vol 615-617 ◽  
pp. 15-18 ◽  
Author(s):  
Emil Tymicki ◽  
Krzysztof Grasza ◽  
Katarzyna Racka ◽  
Marcin Raczkiewicz ◽  
Tadeusz Łukasiewicz ◽  
...  
Keyword(s):  
Single Crystals ◽  
Electron Backscatter Diffraction ◽  
Structural Defects ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Optical Scanning ◽  
Atomic Force ◽  
The Stability ◽  
Backscatter Diffraction ◽  
Source Materials

4H-SiC single crystals grown by the seeded physical vapour transport method have been investigated. These crystals were grown on 6H-SiC seeds. The influence of the seed temperature, form and granulation of SiC source materials on the stability and efficiency of the 4H polytype growth have been investigated. A new way of the seed mounting - with an open backside - has been used. Crystals obtained were free of structural defects in the form of hexagonal voids. The crystalline structure of SiC crystals was investigated by EBSD (Electron Backscatter Diffraction) and X-Ray diffraction methods. Moreover, defects in crystals and wafers cut from these crystals were examined by optical, scanning electron and atomic force microscopy combined with KOH etching.

Direct Force Measurements at Polymer Brush Surfaces by Atomic Force Microscopy

1998 ◽  
Vol 31 (13) ◽  
pp. 4297-4300 ◽  
Author(s):  
Tommie W. Kelley ◽  
Phillip A. Schorr ◽  
Kristin D. Johnson ◽  
Matthew Tirrell ◽  
C. Daniel Frisbie
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Brush ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force

Dynamic Debonding Force Measurements of Ligand (RGD)-Platelet Receptor (GP Ilb/IIIa) System under Physiological Conditions

2000 ◽  
Vol 6 (S2) ◽  
pp. 974-975
Author(s):  
ImShik Lee ◽  
Roger E. Marchant
Keyword(s):  
Thrombus Formation ◽  
Peptide Sequence ◽  
Chain Extension ◽  
Force Measurements ◽  
Platelet Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Direct Measurements ◽  
Platelet Receptor ◽  
Physical Absorption

ABSTRACTBinding formation between a peptide sequence (GSSSGRGDSPA) which contains the cell adhesion sequence –RGD-found in fibrinogen, vWF, fibrinonectin, and vitronectin and human platelet intergrin GP Ilb/IIIa plays an important role in thrombus formation. Using atomic force microscopy (AFM), we visualized the detailed structures of membrane and submembrane of the cell, and measured the interaction forces between a peptide modified cantilever probe tip and platelet surface from pN to nN levels under physiological buffer. Direct measurements of the debonding force for the RGD ligand - GP Ilb/IIIa system are presented. To eliminate the possible measurement of the hgand-receptor pair, or of the ligand and AFM tip, following desorption of the ligand; the cantilever tip surface was modified with covalent coupling chemistry rather than physical absorption. Our results showed that the single molecular rupturing force was 93.3 ± 10.41 pN with considerable chain extension in the receptor. The rupturing forces showed a logarithmic dependence of the rate of loading

scholarly journals Towards an Understanding of Crystallization by Attachment

Crystals ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 463
Author(s):  
Haihua Pan ◽  
Ruikang Tang
Keyword(s):  
Capillary Condensation ◽  
Force Measurements ◽  
Force Microscopy ◽  
Physical Conditions ◽  
Driving Mechanisms ◽  
Atomic Force ◽  
Wide Range ◽  
Dynamics Simulations ◽  
Hydration Layers

Crystallization via particle attachment was used in a unified model for both classical and non-classical crystallization pathways, which have been widely observed in biomimetic mineralization and geological fields. However, much remains unknown about the detailed processes and driving mechanisms for the attachment. Here, we take calcite crystal as a model mineral to investigate the detailed attachment process using in situ Atomic Force Microscopy (AFM) force measurements and molecular dynamics simulations. The results show that hydration layers hinder the attachment; however, in supersaturated solutions, ionic bridges are formed between crystal gaps as a result of capillary condensation, which might enhance the aggregation of calcite crystals. These findings provide a more detailed understanding of the crystal attachment, which is of vital importance for a better understanding of mineral formation under biological and geological environments with a wide range of chemical and physical conditions.

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