Morphology and Field-Effect Mobility Characterization of Planar Five-Ring-Fused Dithiophene-Dione
The thin films of compound 2,7-dihexyl-4,9-dihydro-s-indaceno [1,2-b:5,6-b']- dithiophene-4,9-dione were grown by physical vapor growth at different substrate temperatures. The morphology of surfaces was characterized by atomic force microscope and X-ray diffraction, which exhibits increased crystal grain size and film order with the increase of substrate temperature. The molecule exhibits layer-by-layer packing on the Si/SiO2 substrate and the tilt angle with respect to the substrate is 49.5°, which form extended slipped face-to-face π-stacking in each layer. This result indicates that molecular packing in the thin film is similar to that in the single crystal. The organic field-effect transistors (OFETs) incorporating this compound shows a field effect mobility at the order of 10-3 cm2V-1s-1 and an on-off ratio of 4 × 106 with good air-stability.