The Structure and Adhesion of Zr/TiAlN Coatings on High-Speed Steel and Cemented Carbide Substrates

2013 ◽  
Vol 459 ◽  
pp. 46-50 ◽  
Author(s):  
Guang Xian ◽  
Hai Bo Zhao ◽  
Hong Yuan Fan ◽  
Hao Du

Zr/TiAlN coatings as well as single TiAlN coatings were deposited on high-speed steel and cemented carbide substrates by medium frequency magnetron sputtering. The crystal structure and cross-sectional morphology of coatings were evaluated by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The adhesion of coatings to substrate was measured by Rockwell indention tests. These investigations show that the main diffraction peak of Zr/TiAlN and TiAlN coatings are corresponding to the TiN phase. The preferred orientation of out TiAlN coatings is obviously affected by Zr interlayer and substrate materials. The TiAlN coatings both on HSS and cemented carbide substrates exhibit a columnar structure. But, the columnar morphology of Zr/TiAlN on cemented carbide substrate becomes ambiguous and this structure of Zr/TiAlN coatings on HSS substrate even changes to isometric. The Rockwell indention results indicate that the adhesion of TiAlN coatings is significantly improved by adding Zr interlayer both on HSS substrate and cemented carbide substrate.

2021 ◽  
Author(s):  
Mei Yang ◽  
Yishu Zhang ◽  
Haoxing You ◽  
Richard Smith ◽  
Richard D. Sisson

Abstract Selective laser melting (SLM) is an additive manufacturing technique that can be used to make the near-net-shape metal parts. M2 is a high-speed steel widely used in cutting tools, which is due to its high hardness of this steel. Conventionally, the hardening heat treatment process, including quenching and tempering, is conducted to achieve the high hardness for M2 wrought parts. It was debated if the hardening is needed for additively manufactured M2 parts. In the present work, the M2 steel part is fabricated by SLM. It is found that the hardness of as-fabricated M2 SLM parts is much lower than the hardened M2 wrought parts. The characterization was conducted including X-ray diffraction (XRD), optical microscopy, Scanning Electron Microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS) to investigate the microstructure evolution of as-fabricated, quenched, and tempered M2 SLM part. The M2 wrought part was heat-treated simultaneously with the SLM part for comparison. It was found the hardness of M2 SLM part after heat treatment is increased and comparable to the wrought part. Both quenched and tempered M2 SLM and wrought parts have the same microstructure, while the size of the carbides in the wrought part is larger than that in the SLM part.


2010 ◽  
Vol 66 ◽  
pp. 35-40 ◽  
Author(s):  
Erdem Baskurt ◽  
Tolga Tavşanoğlu ◽  
Yücel Onüralp

SiC films were deposited by reactive DC magnetron sputtering of high purity (99.999%) Si target. 3 types of substrates, AISI M2 grade high speed steel, glass and Si (100) wafer were used in each deposition. The effect of different CH4 flow rates on the microstructural properties and surface morphologies were characterized by cross-sectional FE-SEM (Field-Emission Scanning Electron Microscope) observations. SIMS (Secondary Ion Mass Spectrometer) depth profile analysis showed that the elemental film composition was constant over the whole film depth. XRD (X-Ray Diffraction) results indicated that films were amorphous. Nanomechanical properties of SiC films were also investigated.


2010 ◽  
Vol 663-665 ◽  
pp. 166-169
Author(s):  
Qing Quan Xiao ◽  
Quan Xie ◽  
Ke Jie Zhao ◽  
Zhi Qiang Yu

Semiconducting Mg2Si films were fabricated on Si (111) substrates by magnetron sputtering and subsequent annealing, and the effects of sputtering pressure on the Mg2Si film growth were studied. The structural and morphological properties of Mg2Si films were investigated by the means of X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that the Mg2Si (220) main diffraction peak intensity increased and then decreased with the increasing of sputtering pressure. The (220) diffraction peak got its maximum at 3.0 Pa sputtering pressure. The intensity of Mg2Si (200) and (400) diffraction peaks increased rapidly as the sputtering pressure decreased when the pressure was lower than 1.5 Pa. The films prepared at higher sputtering pressure had very irregular microstructures, and the surface of semiconducting Mg2Si films became smoother with the decreasing of the sputtering pressure.


2013 ◽  
Vol 791-793 ◽  
pp. 407-410
Author(s):  
Xin Zhao ◽  
Wei Qin ◽  
Guo Dong Zhao

TiZrN thin films have been prepared on high speed steel by using magnetron sputtering. Doping amounts of Zr were adjusted by changing the sputtering time of the Zr target. X-ray diffraction analyses show that TiZrN coatings consist of mixed crystals of TiN, TiZrN phases. The film microhardness first increases and then decreases with the increasing of Zr doping amount. With the same Zr doping amount, the microhardness of the samples will improve with the increasing of doping times.


1998 ◽  
Vol 13 (8) ◽  
pp. 2117-2122 ◽  
Author(s):  
M. T. Rodrigo ◽  
C. Jiménez ◽  
L. Váquez ◽  
F. Alonso ◽  
M. Fernández ◽  
...  

Ti and TiNx (x < 1) thin films have been deposited on high speed steel (HSS) substrates by reactive sputtering and then N+ implanted. The increase of the N/Ti ratio of the films during deposition is related to a decrease in their roughness, and N+ implantation produces another additional slight decrease of the roughness. The hardness of samples increases with the nitrogen content in the as-deposited samples; nevertheless, N+-implanted Ti coatings show lower values of hardness than reactive sputtered TiNx films. α–Ti, ε–Ti2N, and δ–TiN phases were identified by grazing x-ray diffraction.


2012 ◽  
Vol 217-219 ◽  
pp. 1306-1311
Author(s):  
Chuan Liang Cao ◽  
Xiang Lin Zhang ◽  
Hai Yang Wang

TiN coating is often coated on fine blanking tools made of with the powder metallurgy high speed steel S790 by Multi-arc ion plating. The phase variation, residual stress and microhardness of TiN coatings were respectively analyzed by X-Ray Diffraction(XRD) and Vickers hardness tester in this research. The result shows that: there is obvious preferred orientation in the crystal surface (1 1 1) and (2 2 2) of TiN coating, the residual stress of TiN coating ranges from -2 347 MPa to -1 920 MPa, and that of the substrate from -154.9 MPa to -69.21 MPa, both of which decrease with the increasing of coating thickness. The TiN coating on the S790 substrate was annealed at temperature 500°C for one hour. It was revealed that the stress state of TiN coating was better and thus the properties of the TiN coating were improved.


2005 ◽  
Vol 22 (6) ◽  
pp. 407-417 ◽  
Author(s):  
Manfred Wießner ◽  
Siegfried Kleber ◽  
Alfred Kulmburg

2006 ◽  
Vol 530-531 ◽  
pp. 48-52 ◽  
Author(s):  
M.M. Serna ◽  
Edilson Rosa Barbarosa Jesus ◽  
E. Galego ◽  
Luís Gallego Martinez ◽  
H.P.S. Corrêa ◽  
...  

The aim of the work was to prepare an overview about the microstructures present in high-speed steel, focused on the crystallography of the carbides. High-speed steels are currently obtained by casting, powder metallurgy and more recently spray forming. High-speed steels have a high hardness resulting from a microstructure, which consists of a steel matrix (martensite and ferrite), in which embedded carbides of different crystal structure, chemical composition, morphology and size, exist. These carbides are commonly named MxC, where M represents one or more metallic atoms. These carbides can be identified by X-ray diffraction considering M as a unique metallic atom. In this work, it is discussed, in basis of the first principles of physics crystallography, the validation of this identification when it is considered that other atoms in the structure are substitutional. Further, it is discussed some requirements for data acquisition that allows the Rietveld refinement to be applied on carbide crystallography and phase amount determination.


2011 ◽  
Vol 495 ◽  
pp. 335-338 ◽  
Author(s):  
Yong Feng Ruan ◽  
Peng Fei Wang ◽  
Li Huang ◽  
Wei Zhu

Nitrogen-doped 6H-SiC single crystals irradiated with neutrons up to a fluence of 5.74×1018 n/cm2 at the temperature of 60-80°C were investigated by means of X-ray diffractometer and metallurgical microscope. The experimental results showed the X-ray diffraction peak (0006) was broadened due to the lattice distortion resulting from irradiation-induced defects, and then narrowed linearly when isochronally annealed over the temperature of 700°C. Meanwhile, from the chemical etching photomicrographs, the characteristic was accompanied by the changes of the dislocation density after the process of irradiation and post-irradiation annealing. According to this characteristic of irradiated 6H-SiC crystals, a novel temperature sensor suitable for the temperature range of 700-1300°C or more is developed, which depends on the linear relationship between XRD FWHM (the full width at the half maximum of X-ray diffraction peak) and isochronal annealing temperature over about 700°C. The subsequent application test demonstrated that the sensor remained no damage in the very harsh conditions as well as possessed a less than +5% of the relative temperature error. Therefore, the neutron-irradiated 6H-SiC can be employed as a kind of non-invasive temperature measurement sensor to determine the temperature of closed, high-speed rotating and difficult-to-access parts on a running machine such as internal-combustion engine pistons, turbine blades and so on.


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