Microstructure Characterization of the Reaction Interface between CBN Grain and Titanium-Deposited Film

2012 ◽  
Vol 538-541 ◽  
pp. 166-171
Author(s):  
Wen Feng Ding ◽  
Yang Min Liang ◽  
Jian He ◽  
Li Tang ◽  
Jie Yu ◽  
...  
Keyword(s):  
Heating Temperature ◽  
Cubic Boron Nitride ◽  
High Vacuum ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
Energy Dispersion Spectrometer ◽  
Heat Treated ◽  
Deposited Film

Cubic boron nitride (CBN) abrasive grains with surface titanium-deposited film were heat-treated during 550-950°C for 60 min under high vacuum circumstance. Detailed interfacial compounds analysis by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersion spectrometer (EDS), differential thermal analysis (DTA) indicates that the interfacial reactions are much dependent on the heating temperature to some extents, and the reaction products, TiN, TiB2 and TiB chiefly form the network structure. In particular, at 950°C the transition layers with excellent performance, CBN/TiB2/TiB/(TiB+TiN)/TiN/CBN, is realized.

Synthesis and Characterization of YCrxAl1-xO3 Particles by a Reverse Micelle Processing

2017 ◽  
Vol 47 ◽  
pp. 54-59 ◽  
Author(s):  
Dae Han Lee ◽  
Ji Young Ock ◽  
Jeong Hoon Son ◽  
Dong Sik Bae
Keyword(s):  
Reverse Micelle ◽  
Heating Temperature ◽  
Molar Ratio ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
Inorganic Pigment ◽  
X Ray ◽  
Heat Treated ◽  
Average Size

YCrxAl1-xO3 nanoparticles were synthesized by a reverse micelle processing for inorganic pigment. Y(NO3)2·6H2O, Cr (NO3)2·6H2O and Al (NO3)3·9H2O are used for precursors in order to synthesis YCrxAl1-xO3 nanoparticles. The aqueous solution consists of mixing the molar ratio of Y/Cr/Al at 1:x:1-x and heat treated at 900~1300°C for 2h. The average size and distribution of synthesized YCrxAl1-xO3 powders was in the range of 10-20nm and narrow, respectively. The average size of the synthesized YCrxAl1-xO3 powders increased with increasing water to surfactant molar ratio and heating temperature. The crystallinity of synthesized YCrxAl1-xO3 powder increased with increasing heating temperature. The synthesized YCrxAl1-xO3 powders were characterized by X-ray diffraction analysis (XRD), field emission scanning electron microscopy (FE-SEM) and color spectrophotometer. The properties of the synthesized powders were affected by such variables as molar ratio, heating temperature etc.

Application of Gandolfi X-Ray Diffraction to the Characterization of Reaction Products from the Alteration of Simulated Nuclear Wastes

1980 ◽  
Vol 24 ◽  
pp. 265-269 ◽  
Author(s):  
C. A. F. Anderson ◽  
M. E. Zolensky ◽  
D. K. Smith ◽  
W. P. Freeborn ◽  
B. E. Scheetz
Keyword(s):  
Powder Diffraction ◽  
Individual Particle ◽  
Nuclear Wastes ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Individual ◽  
Individual Grains ◽  
Phase Characterization

AbstractAccurate phase characterization of the alteration products of rad-waste requires the separation and identification of scattered individual grains from among the bulk product. These grains are typically 5 to 100 μm in size. Bulk x-ray powder diffraction will normally not detect these minor phases, and even if the phase can be detected, it often may not be identifiable. The use of the Gandolfi technique with the individual particle not only facilitates the identification, but also allows the assignment of the identification to the specific grain.

Characterization of Tungsten Silicides Formed by Rapid Thermal Annealing.

1985 ◽  
Vol 52 ◽  
Author(s):  
M. Siegal ◽  
J. J. Santiago ◽  
J. Van der Spiegel
Keyword(s):  
High Vacuum ◽  
Diffusion Profile ◽  
X Ray Diffraction ◽  
Mixed Composition ◽  
Time Intervals ◽  
X Ray ◽  
Radiation Sources ◽  
New Phase ◽  
Film Side

ABSTRACTTungsten silicide samples were formed by sputter depositing 80 nm W metal onto (100) oriented, 5 ohm-cm Si wafers. After deposition, the samples were fast radiatively processed in an RTA system using quartz-halogen tungsten lamps as radiation sources for time intervals ranging from 20 to 60s under high vacuum. Films processed at 22–25 W/cm2 radiation with the film side of the samples oriented away from the lamps result in films which are metallic or cloudy in color, and have mixed composition as evidenced by x-ray diffraction (W, W5 Si3 and WSi2). Films processed with the film side oriented toward the lamps show the occurrence of a phase transforF.ation clearly nucleated at the film edge. The new phase is grey and mostly composed of WSi2, with film resistivities 55–60 μΩ-cm. AES measurements show a uniformly distributed Si diffusion profile into the metal film, while SEM indicates a nucleation and growth of the phase once diffusion occurs.

Investigations on electrical conduction properties and crystallization conditions of V2O5-P2O5 glass based semiconductors

2013 ◽  
Vol 1494 ◽  
pp. 215-219
Author(s):  
Akifumi Matsuda ◽  
Takuya Aoyagi ◽  
Takashi Naito ◽  
Tadashi Fujieda ◽  
Kenjiro Ikejiri ◽  
...  
Keyword(s):  
High Vacuum ◽  
Potential Candidate ◽  
X Ray Diffraction ◽  
Melt Quenching ◽  
X Ray ◽  
Heat Treated ◽  
Crystallization Conditions ◽  
Quenching Method ◽  
Vanadate Glasses ◽  
Conduction Properties

ABSTRACTWe studied the electrical properties of thermally treated V2O5-CuO-Fe2O3-P2O5 (vanadate) glasses under reducing high-vacuum conditions. The glasses were prepared by using a melt-quenching method and then applied on Al2O3 substrates as ∼40μm-thick films. The glass films were then heat treated at 375−550°C under a vacuum of 10−6 Pa. Powder X-ray diffraction showed the formation of complex oxides of both MxV2O5 (M = Cu, Fe; x = 0.12−1.3) and vanadium oxides (VOx; x = 1.5−2.5). The resistivity of the glass film crystallized at 550°C measured at 50°C and 300°C were 1.8 × 100 Ωcm and 2.8 × 10−1 Ωcm, respectively, which was 10 times lower than that of the film crystallized in air. The Seebeck coefficient was −132 μV/K at 50°C and −130 μV/K at 300°C. These results show that the vanadate glasses crystallized under the appropriate condition become potential candidate materials for semiconductor and thermoelectric application.

Study of high-pressure sintering behavior of cBN composites starting with cBN–Al mixtures

2008 ◽  
Vol 23 (9) ◽  
pp. 2366-2372 ◽  
Author(s):  
Yongjun Li ◽  
Sicheng Li ◽  
Ran Lv ◽  
Jiaqian Qin ◽  
Jian Zhang ◽  
...  
Keyword(s):  
High Pressure ◽  
Sintering Temperature ◽  
Cubic Boron Nitride ◽  
Sintering Behavior ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
Al Content ◽  
High Pressure Sintering

Cubic boron nitride (cBN) composites starting with cBN–Al mixtures were sintered on WC-16 wt% Co substrates under static high pressure of 5.0 GPa and at temperatures of 800–1400 °C for 30 min. Vickers hardness of the sintered samples increased with increasing cBN content, and the highest hardness of 32.7 GPa was achieved for the cBN–5 wt% Al specimens sintered at 1400 °C. The reactions between cBN and Al started to occur at about 900 °C, and the reaction products strongly depended on the Al content, sintering temperature, and Co diffusion from the substrates according to the x-ray diffraction (XRD) observations. The high pressure and high temperature in situ resistance measurement indicated that the reactions between cBN and Al could be completed in about 90 s when the temperature was higher than ∼1200 °C at high pressure. The cBN composite sintered at 1200 °C from a cBN–15 wt% Al mixture showed the best cutting performance.

Synthesis and Characterization of α-Phase Silicon Nitride Powders by Direct Nitridation

2013 ◽  
Vol 631-632 ◽  
pp. 434-436
Author(s):  
Jiu Ming Liu ◽  
Jian Lei Wang ◽  
Shu Xia Ren
Keyword(s):  
Silicon Nitride ◽  
Raw Materials ◽  
X Ray Diffraction ◽  
Nitrogen Gas ◽  
Pure Nitrogen ◽  
X Ray ◽  
Α Phase ◽  
Heat Treated ◽  
Direct Nitridation

Using silicon powders as raw materials, adding nano-silicon nitride as a diluent and NH4Cl3 and FeCl3 as catalysts, α-phase silicon nitride powders were prepared by direct nitridation method. The silicon powders were first milled with 20% α-Si3N4 and 4% NH4Cl3 for 30 minutes. Then the mixture was heat-treated at 1300°C for 1 hour in the pure nitrogen gas. The phases and their content of the as-prepared product were detected by X-ray diffraction (XRD) and the microstructure was studied by scanning electron microscope (SEM). The results showed that the product mainly consisted ofα-Si3N4 with a mass fraction over 92% and were submicron-sized particles．

XRD and Tem Characterization of Cathodic MnO2 and Discharge Products in the Li-MnO2 Cell

1995 ◽  
Vol 393 ◽  
Author(s):  
Y. Shao ◽  
S.A. Hackney ◽  
B.C. Cornilsen
Keyword(s):  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Electrolytic Manganese Dioxide ◽  
Cathodic Material ◽  
X Ray ◽  
Heat Treated ◽  
Electrolytic Manganese ◽  
Xrd Patterns ◽  
Convergent Beam

ABSTRACTThe crystal structures of the undischarged, heat-treated electrolytic manganese dioxide (HEMD) and discharge products are characterized by high spatial resolution convergent beam electron diffraction (CBED). The results are compared with the x-ray diffraction (XRD) patterns characterized by broad, diffuse peaks. The CBED results for HEMD show that the starting cathodic material has the pyrolusite space group, but with a range of c/a ratios. The variability of the lattice parameter from grain to grain is found to coincide with the broadening on the low angle side of the XRD peaks. The CBED patterns of discharge products suggest a reduction range in c/a ratios and the formation of another phase.

Characterizations on Morphology and Adhesion of Calcium Silicate Coating on Ti6Al4V Substrate

2016 ◽  
Vol 694 ◽  
pp. 83-87 ◽  
Author(s):  
Farah Atiqah Abdul Azam ◽  
Hamisah Ismail ◽  
Roslinda Shamsudin ◽  
Zalita Zainuddin ◽  
Muhammad Azmi Abdul Hamid
Keyword(s):  
Calcium Silicate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Substrate Adhesion ◽  
Surface Polishing ◽  
Ti6al4v Substrate ◽  
Heat Treated ◽  
Evaporation Technique ◽  
Abrasive Paper

The morphology and surface topography of calcium silicate coated on Ti6Al4V implant were studied using field emission scanning electron microscopy (FESEM) and X-ray diffraction analysis (XRD) respectively. The surface of titanium alloy plates was mechanically ground with 320, 800 and 1200 grits of SiC abrasive paper followed by surface polishing into mirror-like finish. The synthesized β-CaSiO3 was deposited onto the Ti6Al4V substrate using electron beam evaporator. After coating, calcium silicate was heat treated at 500 °C for 1 hour. Characterization of the calcium silicate coated on Ti6Al4V substrate using e-beam evaporation technique demonstrated that 5 wt% of PVA addition was able to improve the coating-to-substrate adhesion.

A microstructural characterization of Co-Zr type permanent-magnet materials

1991 ◽  
Vol 49 ◽  
pp. 782-783
Author(s):  
K. R. Lawless ◽  
G. C. Hadjipanayis
Keyword(s):  
Melt Spinning ◽  
Microstructural Characterization ◽  
X Ray Diffraction ◽  
Ion Milling ◽  
X Ray ◽  
Heat Treated ◽  
Diffraction Patterns ◽  
Rapidly Solidified ◽  
Hard Magnetic Properties

Considerable interest has been shown recently in the hard magnetic properties of Co-Zr, Co-Zr-B, and Co-Hf-B alloys, but as yet no detailed microstructural studies have been published. The Co-Zr phase diagram seems to be reasonably well known, although the crystal structure of the Co11Zr2 phase is only partially determined. This paper will report on some preliminary studies of rapidly solidified Co-Zr-B-Si and Co-Hf-B-Si alloys and binary Co-Zr alloys.All specimens used in this study were prepared by melt spinning. Specific alloys were heat treated at temperatures from 650 to 900°C. TEM specimens were prepared from ribbon material by ion milling.X-ray diffraction studies of these alloys all showed a characteristic broad peak centered around d = 0.205nm. Although it was obvious that this was a complex peak, attempts to deconvolute it were unsuccessful. SAD patterns revealed that major phases in the alloys were very heavily faulted, thus giving rise to the very confusing X-ray diffraction patterns.

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