Characterization of Tungsten Silicides Formed by Rapid Thermal Annealing.

1985 ◽  
Vol 52 ◽  
Author(s):  
M. Siegal ◽  
J. J. Santiago ◽  
J. Van der Spiegel
Keyword(s):  
High Vacuum ◽  
Diffusion Profile ◽  
X Ray Diffraction ◽  
Mixed Composition ◽  
Time Intervals ◽  
X Ray ◽  
Radiation Sources ◽  
New Phase ◽  
Film Side

ABSTRACTTungsten silicide samples were formed by sputter depositing 80 nm W metal onto (100) oriented, 5 ohm-cm Si wafers. After deposition, the samples were fast radiatively processed in an RTA system using quartz-halogen tungsten lamps as radiation sources for time intervals ranging from 20 to 60s under high vacuum. Films processed at 22–25 W/cm2 radiation with the film side of the samples oriented away from the lamps result in films which are metallic or cloudy in color, and have mixed composition as evidenced by x-ray diffraction (W, W5 Si3 and WSi2). Films processed with the film side oriented toward the lamps show the occurrence of a phase transforF.ation clearly nucleated at the film edge. The new phase is grey and mostly composed of WSi2, with film resistivities 55–60 μΩ-cm. AES measurements show a uniformly distributed Si diffusion profile into the metal film, while SEM indicates a nucleation and growth of the phase once diffusion occurs.

Microstructure Characterization of the Reaction Interface between CBN Grain and Titanium-Deposited Film

2012 ◽  
Vol 538-541 ◽  
pp. 166-171
Author(s):  
Wen Feng Ding ◽  
Yang Min Liang ◽  
Jian He ◽  
Li Tang ◽  
Jie Yu ◽  
...  
Keyword(s):  
Heating Temperature ◽  
Cubic Boron Nitride ◽  
High Vacuum ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
Energy Dispersion Spectrometer ◽  
Heat Treated ◽  
Deposited Film

Cubic boron nitride (CBN) abrasive grains with surface titanium-deposited film were heat-treated during 550-950°C for 60 min under high vacuum circumstance. Detailed interfacial compounds analysis by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersion spectrometer (EDS), differential thermal analysis (DTA) indicates that the interfacial reactions are much dependent on the heating temperature to some extents, and the reaction products, TiN, TiB2 and TiB chiefly form the network structure. In particular, at 950°C the transition layers with excellent performance, CBN/TiB2/TiB/(TiB+TiN)/TiN/CBN, is realized.

Characterization of polyherbal-incorporated polycaprolactone nanofibrous mat for biomedical applications

2019 ◽  
Vol 34 (4-5) ◽  
pp. 401-411
Author(s):  
Rajalakshmi Ramamoorthy ◽  
Muthumanickkam Andiappan ◽  
Murugesan Muthalagu
Keyword(s):  
Drug Release ◽  
Biomedical Applications ◽  
X Ray Diffraction ◽  
Time Intervals ◽  
Drug Release Rate ◽  
Electrospinning Technique ◽  
X Ray ◽  
Thermogravimetric Analyzer ◽  
Physical And Chemical

The polyherbal-loaded polycaprolactone nanofibrous mat was prepared by electrospinning technique, and physical and chemical characteristics of nanofibrous mats were studied using scanning electron microscopy, x-ray diffraction, thermogravimetric analyzer, and Fourier transform infrared spectroscopy. The presence of various phytochemicals in the crude monoherbal and polyherbal extracts was analyzed. The antimicrobial activity and biocompatibility of the polyherbal-loaded nanofibrous mats were studied. The drug release pattern of the polyherbal-loaded nanofibrous mats was studied at different time intervals. The 5% drug-loaded nanofibrous mat shows higher sustainable drug release rate than 1% and 3% drug-loaded nanofibrous mats. The cell viability was found to be 98.91%, 98.77%, 98.5%, and 98.22% for polycaprolactone and 1%, 3%, and 5% for polyherbal-loaded nanofibrous mats, respectively.

Synthesis and Characterization of A Metastable (SiC)aN4 Phase

1994 ◽  
Vol 354 ◽  
Author(s):  
C. Uslu ◽  
B. Park ◽  
D. B. Poker
Keyword(s):  
Cubic Phase ◽  
High Dose ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Transmission Electron ◽  
Position Sensitive ◽  
New Phase

AbstractA metastable C-Si-N compound has been synthesized by high dose N+ implantation into polycrystalline /8-SiC (cubic phase). The thin films formed upon 100 keV implantations were characterized with respect to various ion doses and target temperatures. X-ray diffraction with a position-sensitive detector and cross-sectional transmission electron microscopy revealed that the as-implanted surfaces contained ∼0.15 jttm thick continuously-buried amorphous layers. Rutherford backscattering spectroscopy showed that the peak concentration of nitrogen saturated up to approximately 54 at. % with increasing doses, suggesting a new phase formation.

Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces

1986 ◽  
Vol 1 (3) ◽  
pp. 468-475 ◽  
Author(s):  
D.D. Allred ◽  
J. Gonzalez-Hernandez ◽  
O.V. Nguyen ◽  
D. Martin ◽  
D. Pawlik
Keyword(s):  
Raman Spectra ◽  
High Vacuum ◽  
Amorphous Semiconductor ◽  
Ultra High Vacuum ◽  
Chemical Bonds ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sharp Interfaces ◽  
Deposition Techniques

Raman spectroscopy (RS) and low-angle x-ray diffraction (LAXRD) have been used to characterize semiconductor multilayer interfaces. In the present study a model for Raman spectra of multilayers is developed and applied to the specific case of the interfaces of a-Si/a-Ge multilayers. Quantification of the “blurring” of interfaces is possible because peak heights in the Raman spectra of thin films are proportional to the number of scatterers, thus RS is capable of directly “counting” the total number of chemical bonds of a given type in the film. Multilayers, prepared by various deposition techniques, are compared. The relative roles of LAXRD and RS in investigating interfaces are contrasted. Several a-Si/a-Ge multilayers deposited by ultra-high vacuum (UHV) evaporation (MBD) are found to exhibit very regular periodicities and exceptionally sharp interfaces (<1.0 Å intermixing).

Production and Characterization of Alumina-Diamond Composites and Nanocomposites

2010 ◽  
Vol 65 ◽  
pp. 16-20
Author(s):  
Elíria Maria de Jesus Agnolon Pallone ◽  
Vania Trombini ◽  
Kátia L. Silva ◽  
Luis O. Bernardi ◽  
Makoto Yokoyama ◽  
...  
Keyword(s):  
Wear Resistance ◽  
High Vacuum ◽  
Secondary Phase ◽  
Diamond Powder ◽  
High Energy ◽  
Alumina Matrix ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ceramic Matrices

One of the most recent alternatives in the development of materials with high mechanical properties and wear resistance is the addition of nanometric and/or micrometric particles of a secondary phase into ceramic matrices. Nanostructured materials can be defined as systems that have at least one microstructural characteristic of nanometric dimensions (less than 100nm). In this work, alumina-diamond nanocomposites were produced using nanometric diamond powder obtained by high energy milling in a SPEX mixer mill for 6h. The crystallite size was 30nm. After deagglomeration, the diamond powder was added to the alumina matrix in a ratio of 5wt%. The samples were isostatically pressed and high-vacuum sintered. The resulting nanocomposites and composites were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM), and by microhardness, diametral compression and wear resistance tests. The results confirmed the promising wear characteristics of the alumina-diamond nanocomposite.

Synthesis and structural characterization of barium complexes containing the bulky amino-siloxide hybrid ligand −OSi(tBu)2((CH2)3NMe2)

1995 ◽  
Vol 73 (6) ◽  
pp. 797-803 ◽  
Author(s):  
Pengcheng Shao ◽  
David J. Berg ◽  
Gordon W. Bushnell
Keyword(s):  
Structural Characterization ◽  
Benzene Solution ◽  
High Vacuum ◽  
Crystal Data ◽  
X Ray Diffraction ◽  
X Ray

The bulky amino-siloxide hybrid ligand −OSi(tBu)2((CH2)3NMe2) allows isolation of dinuclear, hydrocarbon-soluble barium complexes. The structures of two mono(ligand) complexes, {Ba[OSi(tBu)2((CH2)3NMe2)][N(SiMe3)2]}2 (1) and {Ba[OSi(tBu)2((CH2)3NMe2)][N(SiMe3)2][THF]}2 (3), have been determined by X-ray diffraction (crystal data: 1, monoclinic, C2/c, a = 20.451(4) Å, b = 14.277(3) Å, c = 22.258(5) Å, β = 101.14(2)°, V = 6376.1(2) Å3, Z = 4 (dimers), R = 0.069,Rw = 0.100; 3, monoclinic, P21/c, a = 11.025(4) Å, b = 22.414(3) Å, c = 13.925(2) Å, β = 104.05(2)°, V = 3338.0(1) Å3, Z = 2 (dimers), R = 0.090, Rw = 0.117). Complex 1 is stable towards ligand redistribution in d6-benzene or d8-toluene, but in d8-THF both 1 and 3 exist in equilibrium with the ligand redistribution products Ba[N(SiMe3)2]2[THF]2 and Ba[OSi(tBu)2((CH2)3NMe2)]2 (2). Complex 2 was prepared independently and appears to exist as a monomer–dimer equilibrium in d6-benzene solution. Complexes 1–3 do not sublime when heated under high vacuum (200 °C, 10−4Torr). Keywords: siloxide, barium, synthesis, structure, bis(trimethylsilyl)amide.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Synthesis and characterization of TiN / Ti / AISI 410 coatings

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama
Keyword(s):  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Columnar Grains ◽  
Tin Thin Films ◽  
Steel Aisi ◽  
Interacting Surfaces ◽  
Stainless Steel Aisi

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

Studies on the Preparation, Characterization and Solubility of -Cyclodextrin-Roxythromycin Inclusion Complexes

2009 ◽  
Vol 2 (2) ◽  
pp. 523-530
Author(s):  
D. Nagasamy Venkatesh ◽  
S. Karthick ◽  
M. Umesh ◽  
G. Vivek ◽  
R.M. Valliappan ◽  
...  
Keyword(s):  
Dissolution Rate ◽  
Inclusion Complexes ◽  
Phase Solubility ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Ir Studies ◽  
Poorly Soluble ◽  
Poorly Soluble Drug

Roxythromycin/ β-cyclodextrin (Roxy/ β-CD) dispersions were prepared with a view to study the influence of β-CD on the solubility and dissolution rate of this poorly soluble drug. Phase-solubility profile indicated that the solubility of roxythromycin was significantly increased in the presence of β-cyclodextrin and was classified as AL-type, indicating the 1:1 stoichiometric inclusion complexes. Physical characterization of the prepared systems was carried out by differential scanning calorimetry (DSC), X-ray diffraction studies (XRD) and IR studies. Solid state characterization of the drug β-CD binary system using XRD, FTIR and DSC revealed distinct loss of drug crystallinity in the formulation, ostensibly accounting for enhancement of dissolution rate.

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