Point Defects Characterization in Quenched δ-Ni2Si as Deduced from Isothermal Magnetic Susceptibility Measurements
2008 ◽
Vol 273-276
◽
pp. 312-317
Keyword(s):
The behaviour of quenched defects in Ni2Si compound is studied by isothermal susceptibility magnetic measurements. In the range of temperature 553-593K, where an enhancement of susceptibility has been previously detected by isochronal measurements, an activation energy (EA=2.5 ± 0.2 eV) is determined. This value is in agreement with the break-up of 3D nickel vacancy clusters, formed at lower temperatures, and the subsequent formation of nickel rich defects via the released vacancies.
2009 ◽
Vol 81
(8)
◽
pp. 1357-1383
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Keyword(s):
2002 ◽
Vol 17
(11)
◽
pp. 2960-2965
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2017 ◽
Vol 43
(1)
◽
pp. 289
◽
1965 ◽
Vol 20
(4)
◽
pp. 527-532
◽
Keyword(s):