X-Ray Diffraction Studies of Grain Growth in an Ultra-fine Grained 6060 Aluminium Alloy

2007 ◽  
Vol 558-559 ◽  
pp. 1299-1304 ◽  
Author(s):  
Børge Forbord ◽  
Ragnvald H. Mathiesen ◽  
Hans Jørgen Roven
Keyword(s):  
Aluminium Alloy ◽  
Grain Growth ◽  
Effective Strain ◽  
Growth Curves ◽  
Grain Structure ◽  
Growth Exponent ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fine Grained ◽  
Angular Pressing

In-situ synchrotron X-ray diffraction has been applied in order to study grain growth in an ultra-fine grained (D~400 nm) 6060 aluminium alloy at 270°C. The submicron grain structure was produced by Equal Channel Angular Pressing (ECAP) to an effective strain of ~6 without rotation of the billet. As the material was textured after ECAP, the initial stages of grain growth were seldom detected, but in the grain size interval available for studies a grain growth exponent of 3.6±0.3 was obtained. By interpolation of the grain growth curves to D=D0 (determined by EBSD) the effect of growth on the softening of the alloy was estimated. The interpolated average curve indicates that the initial stages of softening are not due to uniform grain growth, but rather reconfiguration and annihilation of dislocations as well as overaging of hardening precipitates.

Rapid projection of crystal grain orientation distribution in aluminium alloy sheets by synchrotron X-ray diffraction

1998 ◽  
Vol 5 (3) ◽  
pp. 1139-1140
Author(s):  
K. Kawasaki ◽  
M. Koizumi ◽  
H. Inagaki
Keyword(s):  
Aluminium Alloy ◽  
Grain Growth ◽  
Grain Orientation ◽  
Growth Process ◽  
Orientation Distribution ◽  
Primary Recrystallization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cold Rolled ◽  
Small Grains

An investigation of the primary recrystallization and the grain growth process of aluminium alloy sheets has been carried out using a method for rapid projection of the crystal grain orientation distribution. It is found that the projected pattern is continuous in the cold-rolled state. When the sheet is annealed, tiny diffraction spots or small grains appear. The addition of Mg greatly alters the sizes and number of grains, and the orientation of the grains in sheets.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Preparation and Characterisation of TiO2 Thick Films Fabricated by Electrophoretic Deposition

2007 ◽  
Vol 561-565 ◽  
pp. 2163-2166 ◽  
Author(s):  
H.Z. Abdullah ◽  
Charles C. Sorrell
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Grain Growth ◽  
Electrophoretic Deposition ◽  
Defect Formation ◽  
Titanium Foil ◽  
X Ray Diffraction ◽  
Voltage Range ◽  
X Ray ◽  
Scanning Electron

Rutile nano-powders were suspended in a solution of acetylacetone and iodine. The suspensions were electrophoretically deposited on titanium foil at a voltage range of 5-30 V over times of 5-120 s. The dried tapes then were sintered at 800°C for 2 h in flowing argon. Both the green and fired tapes were examined by field emission scanning electron microscopy, optical microscopy, X-ray diffraction, and Raman microspectroscopy. The thickness of the films depended on the voltage and the time of deposition. The sintered microstructures depended significantly on the thickness of the film, which was a function the proximity to the Ti/TiO2 interface. The interface is critical to the microstructure because it acts as the source of defect formation, which enhances sintering, grain growth, and grain facetting.

Microstructure Evolution of a Fine Grain Al-50wt%Si Alloy Fabricated by High Energy Milling

2011 ◽  
Vol 479 ◽  
pp. 54-61 ◽  
Author(s):  
Fei Wang ◽  
Ya Ping Wang
Keyword(s):  
Grain Growth ◽  
Microstructure Evolution ◽  
Room Temperature ◽  
Milling Time ◽  
High Energy ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Laser Method ◽  
X Ray ◽  
Fine Grain

Microstructure evolution of high energy milled Al-50wt%Si alloy during heat treatment at different temperature was studied. Scanning electron microscope (SEM) and X-ray diffraction (XRD) results show that the size of the alloy powders decreased with increasing milling time. The observable coarsening of Si particles was not seen below 730°C in the high energy milled alloy, whereas, for the alloy prepared by mixed Al and Si powders, the grain growth occurred at 660°C. The activation energy for the grain growth of Si particles in the high energy milled alloy was determined as about 244 kJ/mol by the differential scanning calorimetry (DSC) data analysis. The size of Si particles in the hot pressed Al-50wt%Si alloy prepared by high energy milled powders was 5-30 m at 700°C, which was significantly reduced compared to that of the original Si powders. Thermal diffusivity of the hot pressed Al-50wt%Si alloy was 55 mm2/s at room temperature which was obtained by laser method.

scholarly journals A prototype handheld X-ray diffraction instrument

2018 ◽  
Vol 51 (6) ◽  
pp. 1571-1585 ◽  
Author(s):  
Graeme Hansford
Keyword(s):  
Sample Preparation ◽  
Mineralogical Composition ◽  
General Purpose ◽  
Performance Criteria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fine Grained ◽  
Back Reflection ◽  
Promising Area ◽  
Sample Position

A conceptual design for a handheld X-ray diffraction (HHXRD) instrument is proposed. Central to the design is the application of energy-dispersive XRD (EDXRD) in a back-reflection geometry. This technique brings unique advantages which enable a handheld instrument format, most notably, insensitivity to sample morphology and to the precise sample position relative to the instrument. For fine-grained samples, including many geological specimens and the majority of common alloys, these characteristics negate sample preparation requirements. A prototype HHXRD device has been developed by minor modification of a handheld X-ray fluorescence instrument, and the performance of the prototype has been tested with samples relevant to mining/quarrying and with an extensive range of metal samples. It is shown, for example, that the mineralogical composition of iron-ore samples can be approximately quantified. In metals analysis, identification and quantification of the major phases have been demonstrated, along with extraction of lattice parameters. Texture analysis is also possible and a simple example for a phosphor bronze sample is presented. Instrument formats other than handheld are possible and online process control in metals production is a promising area. The prototype instrument requires extended measurement times but it is argued that a purpose-designed instrument can achieve data-acquisition times below one minute. HHXRD based on back-reflection EDXRD is limited by the low resolution of diffraction peaks and interference by overlapping fluorescence peaks and, for these reasons, cannot serve as a general-purpose XRD tool. However, the advantages ofin situ, nondestructive and rapid measurement, tolerance of irregular surfaces, and no sample preparation requirement in many cases are potentially transformative. For targeted applications in which the analysis meets commercially relevant performance criteria, HHXRD could become the method of choice through sheer speed and convenience.

A Study on Nanocrystalline Nickel Parts Prepared by Jet Electrodeposition

2010 ◽  
Vol 37-38 ◽  
pp. 64-67
Author(s):  
Jin Song Chen ◽  
Yin Hui Huang ◽  
Bin Qiao ◽  
Jian Ming Yang ◽  
Yi Qiang He
Keyword(s):  
Dimensional Accuracy ◽  
Processing Parameters ◽  
X Ray Diffraction ◽  
Scanning Microscope ◽  
Nanocrystalline Nickel ◽  
X Ray ◽  
Fine Grained ◽  
Average Grain Size ◽  
Jet Electrodeposition ◽  
Fine Grained Structure

The principles of jet electrodeposition orientated by rapid prototyping were introduced. The nanocrystalline nickel parts with simple shape were fabricated using jet electrodeposition. The microstructure and phase transformation of nanocrystalline nickel were observed under the scanning microscope and X-ray diffraction instrument. The results show that the jet electrodeposition can greatly enhance the limited current density, fine crystalline particles and improve deposition quality. The nickel parts prepared by jet electrodeposition own a fine-grained structure (average grain size 25.6nm) with a smooth surface and high dimensional accuracy under the optimum processing parameters.

scholarly journals Microstructural Development in a TRIP-780 Steel Joined by Friction Stir Welding (FSW): Quantitative Evaluations and Comparisons with EBSD Predictions

2016 ◽  
Vol 21 (2) ◽  
pp. 146-155 ◽  
Author(s):  
Gladys Perez Medina ◽  
Hugo Lopez Ferreira ◽  
Patricia Zambrano Robledo ◽  
Argelia Miranda Pérez ◽  
Felipe A. Reyes Valdés
Keyword(s):  
Retained Austenite ◽  
Shear Fracture ◽  
Grain Structure ◽  
Microstructural Development ◽  
Grain Texture ◽  
X Ray Diffraction ◽  
Significant Drop ◽  
X Ray ◽  
Friction Stir ◽  
Lap Shear

Abstract The present work describes the effect of FSW on the result microstructure in the stir zone (SZ), thermo-mechanically affected zone (TMAZ), heat affected zone (HAZ) and base metal (BM) of a TRIP-780 steel. X-ray diffraction (XRD), optical microscopy (OM) and EBSD were used for determinations retained austenite (RA) in the SZ, It was found that the amount of RA developed in SZ was relatively large, (approximately 11% to 15%). In addition, recrystallization and the formation of a grain texture were resolved using EBSD. During FSW, the SZ experienced severe plastic deformation which lead to an increase in the temperature and consequently grain recrystallization. Moreover, it was found that the recrystallized grain structure and relatively high martensite levels developed in the SZ lead to a significant drop in the mechanical properties of the steel. In addition, microhardness profiles of the welded regions indicated that the hardness in both the SZ and TMAZ were relatively elevated confirming the development of martensite in these regions. In particular, to evaluate the mechanical strength of the weld, lap shear tensile test was conducted; exhibited the fracture zone in the SZ with shear fracture with uniformly distributed elongation shear dimples.

Residual stresses in a SiC whisker-reinforced alumina composite by high-temperature X-ray diffraction

1994 ◽  
Vol 9 (1) ◽  
pp. 50-53 ◽  
Author(s):  
Benjamin L. Ballard ◽  
Paul K. Predecki ◽  
Camden R. Hubbard
Keyword(s):  
Residual Stress ◽  
Single Crystal Silicon ◽  
Linear Extrapolation ◽  
X Ray Diffraction ◽  
Crystal Silicon ◽  
X Ray ◽  
Fine Grained ◽  
Silicon Carbide Whiskers ◽  
Alumina Composite ◽  
Residual Strains

Residual strains and microstresses are evaluated for both phase of a hot-pressed, fine-grained α-alumina reinforced with 25 wt% (29 vol%) single-crystal silicon carbide whiskers at temperatures from 25 to 1000 °C. The sample was maintained in a nonoxidizing environment while measurements of the interplaner spacing of alumina (146) and SiC (511 + 333) were made using X-ray diffraction methods. The residual strains were profiled at temperature increments of 250 °C from which the corresponding microstresses were calculated. Linear extrapolation of the SiC ε33 profile indicates that the strains are completely relaxed at a temperature of approximately 1470 °C. These residual stress relaxation results suggest that elevated temperature toughness and fracture strength of this composite may result from cooperative mechanisms.

Sign in / Sign up

Export Citation Format

Share Document