Impact of Galvanic Corrosion on Metal Gate Stacks
2009 ◽
Vol 145-146
◽
pp. 215-218
Keyword(s):
High K
◽
High-k gate dielectrics (HK), such as HfO2 or HfSiON, are being considered as the gate dielectric option for the 45nm node and beyond. In order to alleviate the Fermi-level pinning issue and to enhance the CET (Capacitive Effective Thickness) by generating the depletion layer in poly-Silicon gate, metal gate electrodes with proper work functions (WF) have to be used on the high-k dielectrics.
2007 ◽
Vol 84
(9-10)
◽
pp. 2259-2262
◽
A Hybrid Dry-Wet Approach for Removal of a Dummy Polysilicon Gate in a Replacement Metal Gate Scheme
2012 ◽
Vol 187
◽
pp. 57-60
◽
Keyword(s):
Keyword(s):
Keyword(s):