Atomic Force Microscopy and EDX Analysis for Investigation Photoconductive LT-GaAs Terahertz Antennas
Keyword(s):
X Ray
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We investigate the influence of the surface properties of a low-temperature-grown GaAs photoconductive antenna on the terahertz (THz) response power. A comparison to the surface roughness which is extracted from an atomic force microscope is given. We used energy dispersive x-ray spectroscopy (EDX) measurements to determine the Ga/As compositional ratio in the LT-GaAs.