Evaluation of Hot Water and Electron Beam Irradiation for Reducing Fusarium Infection in Malting Barley

2003 ◽  
Vol 66 (7) ◽  
pp. 1241-1246 ◽  
Author(s):  
BALASUBRAHMANYAM KOTTAPALLI ◽  
CHARLENE E. WOLF-HALL ◽  
PAUL SCHWARZ ◽  
JURGEN SCHWARZ ◽  
JAMES GILLESPIE
Keyword(s):  
Electron Beam ◽  
Product Quality ◽  
Electron Beam Irradiation ◽  
Hot Water ◽  
Slight Reduction ◽  
Malting Barley ◽  
Beam Irradiation ◽  
Physical Methods ◽  
Fusarium Infection ◽  
Water Treatments

The use of Fusarium-infected barley for malting may lead to mycotoxin production and decreased product quality. Physical methods for the treatment of Fusarium-infected barley may prevent these safety and quality defects and allow the use of otherwise good quality barley. Hot water and electron beam irradiation were evaluated for their effectiveness in reducing Fusarium infection while maintaining germinative energy in barley samples. Hot-water treatments involved temperatures of 45, 50, 55, and 60°C and treatment times of 0, 1, 5, 10, and 15 min. Electron beam irradiation involved doses ranging from 0 to 11.4 kGy. Treatment with water at 45°C for 15 min resulted in a reduction in Fusarium infection from 32 to 1% after 15 min, with only a very slight reduction in germination. Treatment with water at 50°C for 1 min resulted in a reduction in Fusarium infection from 32 to 2%, and no effect on germination was observed for up to 5 min of treatment. At higher water temperatures, Fusarium infection was essentially eliminated, but germination was also severely reduced. Electron beam irradiation of Fusarium-infected barley reduced Fusarium infection at doses of >4 kGy, and a slight increase in germination for dry samples was observed with doses of 6 to 8 kGy. Doses of >10 kGy significantly decreased germination. Physical methods may have potential for the treatment of Fusarium-infected malting barley.

scholarly journals Electron-Beam Irradiation of the PLLA/CMS/β-TCP Composite Nanofibers Obtained by Electrospinning

Polymers ◽  
2020 ◽  
Vol 12 (7) ◽  
pp. 1593
Author(s):  
Mohd Reusmaazran Yusof ◽  
Roslinda Shamsudin ◽  
Sarani Zakaria ◽  
Muhammad Azmi Abdul Hamid ◽  
Fatma Yalcinkaya ◽  
...  
Keyword(s):  
Tissue Engineering ◽  
Electron Beam ◽  
Bone Tissue ◽  
Tricalcium Phosphate ◽  
Electron Beam Irradiation ◽  
Composite Nanofibers ◽  
Chemical Interaction ◽  
Slight Reduction ◽  
Beam Irradiation ◽  
Carboxy Methyl

Nanofibrous materials produced by electrospinning processes have potential advantages in tissue engineering because of their biocompatibility, biodegradability, biomimetic architecture, and excellent mechanical properties. The aim of the current work is to study the influence of the electron beam on the poly L-lactide acid/ carboxy-methyl starch/β-tricalcium phosphate (PLLA/CMS/β-TCP) composite nanofibers for potential applications as bone-tissue scaffolds. The composite nanofibers were prepared by electrospinning in the combination of 5% v/v carboxy-methyl starch (CMS) and 0.25 wt% of β-TCP with the PLLA as a matrix component. The composites nanofibers were exposed under 5, 30, and 100 kGy of irradiation dose. The electron-beam irradiation showed no morphological damage to the fibers, and slight reduction in the water-contact angle and mechanical strength at the higher-irradiation doses. The chain scission was found to be a dominant effect; the higher doses of electron-beam irradiation thus increased the in vitro degradation rate of the composite nanofibers. The chemical interaction due to irradiation was indicated by the Fourier transform infrared (FTIR) spectrum and thermal behavior was investigated by a differential scanning calorimeter (DSC). The results showed that the electron-beam-induced poly L-lactide acid/carboxy-methyl starch/β-tricalcium phosphate (PLLA/CMS/β-TCP) composite nanofibers may have great potential for bone-tissue engineering.

Electron Beam Irradiation Treatment of Cantaloupes: Effect on Product Quality

2004 ◽  
Vol 10 (6) ◽  
pp. 383-390 ◽  
Author(s):  
E. Castell-Perez ◽  
M. Moreno ◽  
O. Rodriguez ◽  
R. G. Moreira
Keyword(s):  
Electron Beam ◽  
Product Quality ◽  
Irradiation Dose ◽  
Electron Beam Irradiation ◽  
The United States ◽  
Quality Attributes ◽  
Beam Irradiation ◽  
Carotene Content ◽  
Single Beam ◽  
Fresh Cut

Despite the impressive advances in electron beam irradiation, the technology is not ready for application to all types of fresh and/or minimally processed fruits and vegetables. The relationships between food product quality (nutrients, colour and texture) and irradiation dose are still needed. Cantaloupes ( Cucumis melo, L.) have become a product of interest due to the recent food-borne illness outbreaks related to their consumption in the United States and other countries. The main goal of this study was to verify whether treatment of cantaloupes using electron beam technology has any detrimental effects on the product quality. Whole and fresh-cut packaged cantaloupes were irradiated using a linear electron beam accelerator with the single beam (10MeV) fixture. Samples were stored at 10°C for zero, 4, 8 and 12 days along with control (non-irradiated) samples and tested for colour, texture (firmness), size (density), sugars and carotene content to determine the effect of irradiation dose level (1.0, 1.5 and 3.1kGy). Results indicated that irradiation of cantaloupes, as whole fruits with dose up to 1.0kGy, caused no significant changes on the fruit’s physical and nutritional quality attributes. Irradiating at higher doses had an undesirable effect on product quality. The fresh-cut packaged cantaloupe may be irradiated up to 1.5kGy without worsening the product quality attributes. In both cases, carotene content slightly increased as irradiation dose increased. In general, samples irradiated with dose levels between 1.0-1.5kGy had better quality attributes than the non-irradiated samples.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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