The Application of High Resolution Chemical Imaging Techniques for Butyl Rubber Blends
Abstract Atomic Force Microscopy (AFM), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging, and Scanning Transmission X-ray Microscopy (STXM) are applied to identical series of elastomeric blends to evaluate the relative strengths and weaknesses of each imaging technique. AFM is a high resolution, high contrast technique with straight forward sample preparation that derives contrast through elastic modulus variations, but, when used in a conventional mode, has limited chemical specificity. ToF-SIMS imaging can map phases, detect trace levels (ppm) of additives and other chemical species based on relatively straight forward sample preparation, but has poorer spatial resolution and the instrumentation is expensive. STXM has excellent chemical specificity and good spatial resolution but is only available at a beamline and requires more advanced sample preparation. Each technique will be overviewed briefly and relative merits of each will be compared based on evaluations of some commercially relevant rubber blend materials.