A Study of the Thermodynamic Destabilization of Sodium Aluminum Hydride (NaAlH4 ) with Titanium Nitride (TiN) using X-ray Diffraction and Residual Gas Analysis

2011 ◽  
pp. 99-106
Author(s):  
Whitney Fisher Ukpai ◽  
Tabbetha A. Dobbins
Keyword(s):  
Titanium Nitride ◽  
Aluminum Hydride ◽  
Gas Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sodium Aluminum Hydride ◽  
Residual Gas

scholarly journals Laser power meters as an X-ray power diagnostic for LCLS-II

2018 ◽  
Vol 25 (1) ◽  
pp. 72-76 ◽  
Author(s):  
Philip Heimann ◽  
Stefan Moeller ◽  
Sergio Carbajo ◽  
Sanghoon Song ◽  
Georgi Dakovski ◽  
...  
Keyword(s):  
Free Electron Laser ◽  
Laser Power ◽  
High Vacuum ◽  
Average Power ◽  
Gas Analysis ◽  
Ultra High Vacuum ◽  
Beam Path ◽  
X Ray ◽  
High Repetition ◽  
Residual Gas

For the LCLS-II X-ray instruments, laser power meters are being developed as compact X-ray power diagnostics to operate at soft and tender X-ray photon energies. These diagnostics can be installed at various locations along an X-ray free-electron laser (FEL) beamline in order to monitor the transmission of X-ray optics along the beam path. In addition, the power meters will be used to determine the absolute X-ray power at the endstations. Here, thermopile power meters, which measure average power, and have been chosen primarily for their compatibility with the high repetition rates at LCLS-II, are evaluated. A number of characteristics in the soft X-ray range are presented including linearity, calibrations conducted with a photodiode and a gas monitor detector as well as ultra-high-vacuum compatibility tests using residual gas analysis. The application of these power meters for LCLS-II and other X-ray FEL sources is discussed.

Phase Transformation Behavior and Stability of LiNiO 2 Cathode Material for Li‐Ion Batteries Obtained from In Situ Gas Analysis and Operando X‐Ray Diffraction

ChemSusChem ◽  
2019 ◽  
Vol 12 (10) ◽  
pp. 2240-2250 ◽  
Author(s):  
Lea de Biasi ◽  
Alexander Schiele ◽  
Maria Roca‐Ayats ◽  
Grecia Garcia ◽  
Torsten Brezesinski ◽  
...  
Keyword(s):  
Phase Transformation ◽  
Cathode Material ◽  
Gas Analysis ◽  
Li Ion Batteries ◽  
X Ray Diffraction ◽  
Transformation Behavior ◽  
X Ray ◽  
Phase Transformation Behavior ◽  
Li Ion

Assessment of Carbon Contamination in Titanium Nitride Films Deposited from the Reaction of Titanium (IV) Ciiloride and Amines

1993 ◽  
Vol 327 ◽  
Author(s):  
Keith B. Williams ◽  
Ogie Stewart ◽  
Gene P. Reck ◽  
James W. Proscia
Keyword(s):  
Titanium Nitride ◽  
Atmospheric Pressure ◽  
Chemical Vapor ◽  
Primary Amines ◽  
Scanning Electron Micrographs ◽  
X Ray Diffraction ◽  
Carbon Contamination ◽  
X Ray ◽  
Infrared Reflectivity ◽  
Pressure Chemical

AbstractThe reaction of titanium (IV) chloride and amines in an atmospheric pressure chemical vapor deposition (APCVD) has been previously shown to produce high quality titanium nitride films. These films were gold in appearance with high infrared reflectivity and resistivities as low as 80 microhm-cm. In the present study, the carbon content of the amines was systematically increased and the carbon levels in the films measured by XPS. For primary amines carbon contamination was not detected. Films deposited from secondary and tertiary amines had measurable carbon contamination. Correlation of carbon contamination with electrical resistivity and infrared reflectivity is discussed. Scanning electron micrographs and x-ray diffraction of the films are presented.

X-ray diffraction stress analysis of interrupted titanium nitride films: Combining the sin2ψ and crystallite group methods

2014 ◽  
Vol 562 ◽  
pp. 206-210 ◽  
Author(s):  
Theo Sinkovits ◽  
Yue Zhao ◽  
Rebecca O'Brien ◽  
Steve Dowey
Keyword(s):  
Titanium Nitride ◽  
Stress Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Group Methods

Morphological and structural evolutions of nonequilibrium titanium-nitride alloy powders produced by reactive ball milling

1992 ◽  
Vol 7 (4) ◽  
pp. 888-893 ◽  
Author(s):  
M. Sherif El-Eskandarany ◽  
K. Sumiyama ◽  
K. Aoki ◽  
K. Suzuki
Keyword(s):  
Electron Microscopy ◽  
Titanium Nitride ◽  
Gas Flow ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Nitrogen Gas ◽  
X Ray ◽  
Grain Sizes ◽  
Transmission Electron

Nonequilibrium titanium-nitride alloy powders have been fabricated by a high energetic ball mill under nitrogen gas flow at room temperature and characterized by means of x-ray diffraction, scanning electron microscopy, transmission electron microscopy, and differential scanning calorimetry. Initial hcp titanium is completely transformed to nonequilibrium-fcc Ti–N after 720 ks of the milling time. The fcc Ti–N phase is stable at relatively low temperature and transforms at 855 K to Ti2N and δ phases. At the final stage of milling, the particle- and grain-sizes of alloy powders are 1 mm and 5 nm, respectively, and the lattice parameter is 0.419 nm.

scholarly journals Photothermal behaviour of titanium nitride nanoparticles evaluated by transient X-ray diffraction

Nanoscale ◽  
2021 ◽  
Vol 13 (4) ◽  
pp. 2658-2664
Author(s):  
Benjamin T. Diroll ◽  
Alexandra Brumberg ◽  
Ariel A. Leonard ◽  
Shobhana Panuganti ◽  
Nicolas E. Watkins ◽  
...  
Keyword(s):  
Titanium Nitride ◽  
Optical Excitation ◽  
Metal Nitrides ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray

Metal nitrides are a promising non-toxic, inexpensive, and durable material for photothermal applications. The photothermal properties of titanium nitride are measured using time-resolved X-ray diffraction following optical excitation.

Pyrolysis Studies and Deposition of Sb Films Using the Novel Omvpe Source (I-Pr)2 SbH

1992 ◽  
Vol 282 ◽  
Author(s):  
Robert W. Gedridge ◽  
Kenneth E. Lee ◽  
Charlotte K. Lowe-Ma
Keyword(s):  
Atmospheric Pressure ◽  
Semiconductor Materials ◽  
Organometallic Vapor Phase Epitaxy ◽  
The Novel ◽  
Gas Analyzer ◽  
X Ray Diffraction ◽  
Temperature Growth ◽  
X Ray ◽  
Residual Gas ◽  
Carrier Gases

ABSTRACTThe novel antimony source compound di-isopropylantimony hydride, (i-Pr)2 was synthesized and evaluated for use as a volatile Sb-source compound for low temperature growth of Sb-containing semiconductor materials. (i-Pr)2SbH was pyrolyzed in a horizontal atmospheric pressure organometallic vapor phase epitaxy (OMVPE) reactor using Arand H2 as carrier gases. The gaseous exhaust products were analyzed by a residual gas analyzer. Complete pyrolysis of (i-Pr)2SbH in our OMVPE reactor occursaround 300°C and 350°C in Ar and H2, respectively. A comparison between the pyrolysis temperatures and pyrolysis byproducts with respect to a proposed decomposition mechanism of (i-Pr)2SbH is presented. Sb films were grown on Si(100) andSi(111) as low as 200° C. The Sb films were analyzed by Auger and X-ray diffraction. These polycrystalline Sb films were free of detectable carbon by AES. X-ray diffraction data indicated that these Sb films were highly oriented in the [000L] direction.

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