Electrochemical Control of Charge Current Flow in Nanoporous Graphene

We investigate spin and charge current through a quantum dot pumped by a time-varying magnetic field. Using the density matrix method, quantum rate equations for the electronic occupation numbers in the quantum dot are obtained and solved in the stationary state limit for a wide set of parameters. Both charge and spin currents are expressed explicitly in terms of several relevant parameters and analyzed in detail. The results suggest a way of optimizing experimental parameters to obtain an maximal spin current without the charge current flow.

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COUNTER CURRENT FLOW LIMITATION, CCFL

A-to-Z Guide to Thermodynamics Heat and Mass Transfer and Fluids Engineering ◽

10.1615/atoz.c.coucurflolimccf ◽

2006 ◽

Vol c ◽

Keyword(s):

Current Flow ◽

Flow Limitation ◽

Counter Current Flow ◽

Counter Current

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COUNTER-CURRENT FLOW QUENCHING OF VERTICAL-NARROW-ANNULAR FLOW PASSAGES

Equipment ◽

10.1615/ihtc13.p12.230 ◽

2006 ◽

Author(s):

Y. Koizumi ◽

H. Ohtake ◽

Y. Okabayashi

Keyword(s):

Annular Flow ◽

Current Flow ◽

Counter Current Flow ◽

Counter Current

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Fin Level Defect Isolation Inside a FinFET Using Electron Beam Alteration of Current Flow

ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2017p0473 ◽

2017 ◽

Author(s):

H.J. Ryu ◽

A.B. Shah ◽

Y. Wang ◽

W.-H. Chuang ◽

T. Tong

Keyword(s):

Electron Microscopy ◽

Electron Beam ◽

Focused Ion Beam ◽

Current Flow ◽

Ion Beam ◽

The Body ◽

Complete Understanding ◽

Root Cause ◽

Transmission Electron ◽

Defect Isolation

Abstract When failure analysis is performed on a circuit composed of FinFETs, the degree of defect isolation, in some cases, requires isolation to the fin level inside the problematic FinFET for complete understanding of root cause. This work shows successful application of electron beam alteration of current flow combined with nanoprobing for precise isolation of a defect down to fin level. To understand the mechanism of the leakage, transmission electron microscopy (TEM) slice was made along the leaky drain contact (perpendicular to fin direction) by focused ion beam thinning and lift-out. TEM image shows contact and fin. Stacking fault was found in the body of the silicon fin highlighted by the technique described in this paper.

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Study of MFM Application in Semiconductor Failure Analysis

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0353 ◽

2004 ◽

Author(s):

Way-Jam Chen ◽

Lily Shiau ◽

Ming-Ching Huang ◽

Chia-Hsing Chao

Keyword(s):

Magnetic Field ◽

Failure Analysis ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Current Flow ◽

Force Microscopy ◽

The Magnetic Field ◽

A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

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All-Contactless Measurement of Series Resistance Distributions on Solar Cells with Photoluminescence Imaging

ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2011p0340 ◽

2011 ◽

Author(s):

M. Kasemann ◽

L.M. Reindl ◽

B. Michl ◽

W. Warta ◽

A. Schütt ◽

...

Keyword(s):

Solar Cells ◽

Solar Cell ◽

Current Flow ◽

Series Resistance ◽

Electrical Contacts ◽

New Method ◽

Contactless Measurement ◽

Sample Handling ◽

Imaging Methods ◽

Lateral Current

Abstract Conventional series resistance imaging methods require electrical contacts for current injection or extraction in order to generate lateral current flow in the solar cell. This paper presents a new method to generate lateral current flow in the solar cell without any electrical contacts. This reduces the sample handling complexity for inline application and allows for measurements on unfinished solar cell precursors.

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THE EFFECT OF OXYGEN ADSORPTION ON THE CONDUCTIVITY OF PBTE FILMS.

EurasianUnionScientists ◽

10.31618/esu.2413-9335.2020.6.77.1001 ◽

2020 ◽

Vol 6 (8(77)) ◽

pp. 21-23

Author(s):

S.N. Sarmasov ◽

R.Sh. Rahimov ◽

T.Sh. Abdullayev

Keyword(s):

Spectral Region ◽

Current Flow ◽

Oxygen Adsorption ◽

Tunneling Mechanism ◽

Pn Junction ◽

Flow Through ◽

Pn Junctions ◽

Effect Of Oxygen

The effect of oxygen adsorption on the conductivity of PbTe films is studied. Pn junctions based on PbTe films are photosensitive in the IR spectral region with a maximum photosensitivity of 𝜆𝑚𝑎𝑥 microns. The tunneling mechanism of current flow through the pn junction is shown.

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Water Temperature Control Using PID Control System Based on LabVIEW

Telekontran : Jurnal Ilmiah Telekomunikasi, Kendali dan Elektronika Terapan ◽

10.34010/telekontran.v4i2.1888 ◽

2016 ◽

Vol 4 (2) ◽

pp. 35-46

Author(s):

Ari Ramadhani

Keyword(s):

Water Temperature ◽

Pid Control ◽

Temperature Sensor ◽

Pid Controller ◽

Current Flow ◽

Electrical Energy ◽

Heating Process ◽

Water Heater ◽

Digital Thermometer ◽

Flow Through

Abstract - Automatic system have grown widespread across all sector so do water heater. Traditionally, heating water is done by utilizing fire as heat source. As the growing of technology, the heating process could be done by manipulating electrical energy by convert it to heat. Electrical energy is flown to a metal rod that contact directly with the water which increase the water temperature. On some case, appropiate water temperature is needed. Altough, a thermometer is needed to read the actual temperature as a feedback value for the system and a system that can control the electricity current flow through the heater that the heat produced is linear to the current flow. With implementing microcontroller as a process node for generating PWM signal, this problem can be solved. Also, Labview is needed as an interface for monitoring and bursting an output which have been processed by Proportional, Integral, and Devivative (PID) controller to producing accurate and stable heat. Based on the results of testing, the system is able to provide a rapid response to any changes that occur, both changes in set-point and changes in water temperature (actual value). Another test is done by comparing the temperature value detected by the temperature sensor in this device with an external digital thermometer placed in the same place, and from some of the tests the temperature value detected by the temperature sensor in this device has a difference of ± 0.19 ℃ with a digital thermometer. Keyword : Water Heater, Thermometer, Microcontroller, LabView, PID.

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