Some sources of error in interface state density evaluation fromQ–U date in MOS systems
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2013 ◽
Vol 133
(7)
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pp. 1279-1284
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2000 ◽
Vol 44
(8)
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pp. 1511-1514
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2015 ◽
Vol 198
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pp. 14-19
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1998 ◽
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2014 ◽
Vol 778-780
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pp. 631-634
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2017 ◽
Vol 254
(8)
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pp. 1600691
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