Triangular Single Shockley Stacking Fault Analyses on 4H-SiC PiN Diode with Forward Voltage Degradation
2020 ◽
Vol 49
(9)
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pp. 5232-5239
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pp. 214-217
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pp. 1359-1362
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pp. 969-972
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Vol 527-529
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pp. 1355-1358
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