Alloyed thick-film gold conductor for high reliability high-yield wire bonding

1980 ◽  
Vol 20 (6) ◽  
pp. 916
2018 ◽  
Vol 2018 (1) ◽  
pp. 000620-000627 ◽  
Author(s):  
Samson Shahbazi ◽  
Gregg Berube ◽  
Stephanie Edwards ◽  
Ryan Persons ◽  
Caitlin Shahbazi

Abstract The thick film paste manufacturers are expected to produce conductors which are lead and cadmium free, yet have excellent fired film properties and the same performance and properties as the cadmium and lead containing formulations. The fired film surface of these conductors must be defect free (i.e. imperfections, pills, agglomerates) after multiple firing steps and must perform on dielectric as well as substrates from different suppliers. Typically, the thick film gold conductors are used in high reliability applications such as medical devices, military applications, and high frequency circuits, which require robust performance at high and low temperatures, in chemically aggressive environments, or extremely humid conditions. As circuits decrease in size and become more complex, the thick film gold properties become increasingly critical. The challenge is to develop an alternative gold conductor formulation, which can print and resolve fine features (down to 4 mil lines and spaces) as well as have the ability to be etched for higher density circuit designs (down to 1–2 mil lines and spaces). Gold conductors are typically used in conjunction with other high temperature thick films so good performance after multiple firings was also a targeted requirement. Heraeus has been proactive for the past decade in the development of thick film products that are both RoHS (lead and cadmium free) as well as REACH compliant. This paper discusses the experiments that were performed in order to understand the contribution of gold powder, organic and inorganic system to improve the fired film performance. These formulations were compared against existing gold conductors including the high performance gold conductor options as well as other available standard gold conductor options. Thin wire bonding trials including both gold and aluminum wire are used to compare influences of raw materials which includes high volume wire bonding reliability including failure modes and aged wire bond adhesion at elevated temperature exposures (300°C) for extended periods of time. In order to analyze fired film morphology and link this up to wire bond performance, SEM images of the conductor surface and cross sections were conducted. These studies resulted in a newly developed thick film gold conductor paste for use in a wide variety of applications. We present wire-bonding data with gold and aluminum wire and reliability results on both 96% Al2O3 ceramic substrates as well as on top of standard dielectrics.


1988 ◽  
Vol 27 (4) ◽  
pp. 299-301
Author(s):  
J. Hirota ◽  
Y. Shibutani ◽  
T. Sugimura ◽  
K. Machida ◽  
T. Okuda

2013 ◽  
Vol 2013 (HITEN) ◽  
pp. 000039-000045 ◽  
Author(s):  
James Galipeau ◽  
Matt Gerlach

While ferrite Low Temperature Co-fired Ceramic (LTCC) inductor and transformer developments have undergone thermal shock and high temperature aging that focused on the stability of their electrical characteristics (resistance, inductance), little attention has been paid to their termination reliability at high temperatures. Testing has been done on AgPt and AgPd terminations with Ag5Cd95 and Pb88Sn10Ag2 solders for 2000 and 25 hrs, respectively. However, Ag5Cd95 is unusable in commercial applications due to ROHS restrictions while Pb88Sn10Ag2 is undesirable because of the high lead content. Sn96 solder and wire bonding are common attachment methods that have not been vetted. Initial investigations show that high Sn solders may interfere with bonding between the AgPt and AgPd termination materials and the ferrite bulk of the part. An alternative terminal structure for using Sn96 solder is created by electroplating Au and Ni; however, electroplating to ferrite is challenging due to the masking involved. Also, the preferred materials for wire bonding are thick film, thin film or electroplated Au. To this end an alternative termination structure using Au sputter deposited onto sputter deposited Ti is being investigated. This structure was chosen for its potential to be a lower cost alternative to thick film Au and for its potential for simpler manufacturing than electroplating. Tests involved measuring bond strength and resistance after thermal ageing and thermal shock. Baseline solder joint pull tests show strength comparable to other termination methods. Some issues with solder wetting of the terminals have been noted.


2012 ◽  
Vol 2012 (CICMT) ◽  
pp. 000334-000338
Author(s):  
Jens Müller ◽  
Thomas Mache ◽  
Torsten Thelemann

Electroless plating on silver is a low cost alternative to printing of mixed metals or pure gold paste systems on LTCC. It overcomes the necessity to have material transitions from inner to outer layers or from conductor lines to wire bonding- or solder-pads. Since no commercial process and material set for silver thick film conductors has been available on the market a proprietary Ni/Pd/Au coating technology was developed for the use on silver inks for LTCC and Al2O3-ceramic as a base for both soldering and wire bonding. The work included the screening of different chemicals as well as several silver paste systems from two commercial vendors. Conductor adhesion, plating layer thicknesses, plating accuracy, (lead free) solderability and gold wire-bondability were assessed to optimize the process. Layers of about 5 microns Ni, (0.1 to 0.3) microns Pd and (0.05 to 0.15) microns Au were electrolessly deposited. The developed Ni-Pd-Au finish is an economical alternative with only about a quarter of the cost compared to the conventional use of silver, silver / palladium and gold compounds for ceramic substrates. This technology allows coating of the structures down to a fine pad size of 200×200 microns and a minimum line width of 100 microns, without reducing the adhesion mechanism between thick-film metallization and ceramic substrate. By covering of pure conductors with high temperature glass or dielectrics, further material saving is possible. Besides, the process offers also very good coating of structures in cavities.


2013 ◽  
Vol 2013 (1) ◽  
pp. 000276-000284 ◽  
Author(s):  
Brian Schmaltz

The age of advanced mobile devices is on the direct horizon, are we ready for it? Less power consumption, faster processing, high reliability, high yield, low cost are words engineers are all too familiar with. 2.5/3D utilizing interposer technology, Thru Silicon Via (TSV), sub-50μm die thickness are a few of the latest techniques engineers use to solve these issues. As technology progresses to smaller process generations, new packaging applications are being demanded. The standard solder reflow process is being pushed by advancements in Cu pillar bumps, thermal compression bonding (TCB) and wafer level / pre-applied materials. This presentation will centralize around the latest advancements in NAMICS Materials for Advanced Packaging Technology; Capillary Underfill (CUF), Pre-Applied Material, Non-Conductive Paste (NCP), Non-Conductive Films (NCF).


2014 ◽  
Vol 2014 (1) ◽  
pp. 000251-000257
Author(s):  
Steven Grabey ◽  
Samson Shahbazi ◽  
Sarah Groman ◽  
Catherine Munoz

An increased interest in low temperature polymer thick film products has become apparent due to the rise of the printed electronics market. The specifications for these products are becoming more demanding with expectations that the low temperature products should perform at a level that is typically reserved for their high temperature counterparts; including solderability with lead free solders, high reliability and strong adhesion. Traditionally, it has only been possible to use leaded solders for soldering to polymer based thick film conductors. Over the last 15 years environmental concerns and legislation have pushed the industry towards a lead free approach. The shift to lead free solders, while beneficial, provides new challenges during processing. The high temperatures required for a lead-free soldering process yield a naturally harsher environment for polymer thick film pastes. In the past these conditions have proven too harsh for the pastes to survive. The polymer thick film discussed in this document aims to address some of these concerns for a highly reliable and easy to process polymer thick film paste. Due to the poor leaching characteristics of polymer thick films, at elevated temperatures, the predecessors of this paste typically soldered at low temperatures with leaded solders. The goal of this paper is to present a low temperature paste that is compatible with a variety of substrates and readily accepts lead-free solder. This paper will discuss a newly formulated low temperature curing (150°C – 200°C) RoHS and REACH compliant paste that shows excellent solderability with SAC305 solder. The paste was evaluated using a dip soldering method at 235°C–250°C on a variety of substrates. The data presented includes solder acceptance, adhesion data, thermal analysis and SEM analysis.


2011 ◽  
Vol 2011 (1) ◽  
pp. 000430-000437
Author(s):  
M. Schneider-Ramelow ◽  
M. Hutter ◽  
H. Oppermann ◽  
J.-M. Göhre ◽  
S. Schmitz ◽  
...  

In the realm of power modules a strong trend toward high temperature and high reliability applications can be observed, which entails new technological challenges, especially for the assembly and packaging of power semiconductors. Because of the well known failure mechanisms of established lead-free standard soldering and heavy aluminum wire bonding technologies, such as fatigue and creep of die attach material and wire bonds at thermal cycling, academic and industrial research focuses on more reliable interconnection technologies. A priority is the research of alternative top and bottom side chip interconnection materials or technologies to improve the temperature cycling capability of power chips that are typically assembled on ceramic substrates. The scientific focus is on Ag sintering as die attach and/or heavy ribbon bonding, for example with Al or bi-metal (Al-Cu). Another focus is the material behavior of ribbon bonds in combination with bonding machine improvements (higher bonding parameters, cutting tool). But there are other very promising technologies like transient liquid phase bonding, for example with Cu-Sn or Ag-Sn systems or Cu heavy wire bonding (up to 400 μm wire diameter) or Cu/Al-Bi metal ribbon bonding. Challenges posed by these technologies have to be discussed focusing on materials and process selection and reliability issues. Process temperatures and temperature profiles must be optimized, wire bonding machines and the chip surface structures as well as finish metallizations need to be adapted. This paper will give an overview of alternative power chip interconnection technologies and discuss the challenges related to processing and reliability.


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