C-V and G-V characterization of in-situ fabricated Ga2O3GaAs interfaces for inversion/accumulation device and surface passivation applications
1996 ◽
Vol 39
(8)
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pp. 1133-1136
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Keyword(s):
2000 ◽
Vol 166
(1-4)
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pp. 526-531
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Keyword(s):
1973 ◽
Vol 31
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pp. 132-133
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1988 ◽
Vol 46
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pp. 830-831
Keyword(s):
1993 ◽
Vol 51
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pp. 1058-1059
2018 ◽
2013 ◽
Vol 37
(7)
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pp. 1002
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