A review on the mechanisms of ultrasonic wedge-wedge bonding

2017 ◽  
Vol 245 ◽  
pp. 241-258 ◽  
Author(s):  
Yangyang Long ◽  
Jens Twiefel ◽  
Jörg Wallaschek
Keyword(s):  
2006 ◽  
Vol 35 (1) ◽  
pp. 173-180 ◽  
Author(s):  
Ute Geißler ◽  
Martin Schneider-Ramelow ◽  
Klaus-Dieter Lang ◽  
Herbert Reichl
Keyword(s):  

2013 ◽  
Vol 2013 (1) ◽  
pp. 000208-000212 ◽  
Author(s):  
Simon Althoff ◽  
Jan Neuhaus ◽  
Tobias Hemsel ◽  
Walter Sextro

A model approach for wedge/wedge bonding copper wire is presented. The connection between wire and substrate is based on a variety of physical effects, but the dominant one is the friction based welding while applying ultrasound. Consequently, a friction model was used to investigate the welding process. This model is built up universal and can be used to describe the formation of micro welds in the time variant contact area between wire and substrate. Aim of the model is to identify the interactions between touchdown, bond normal force, ultrasonic power and bonding time. To do so, the contact area is discretized into partial areas where a Point Contact Model is applied. Based on this approach it is possible to simulate micro and macro slip inside the contact area between wire and substrate. The work done by friction force is a main criterion to define occurring micro joints which influence the subsequent welding.


2017 ◽  
Vol 2017 (1) ◽  
pp. 000444-000450
Author(s):  
Sarangapani Murali ◽  
Ei Phyu Phyu Theint ◽  
Hamdan Faizul Fitri ◽  
Tan Kean Tiong ◽  
Zhang Xi

Abstract The paper discusses on the bondability and reliability of aluminum (Al) wedge-to-wedge bonding using fine ceramic capillary and ball bonder. Initial trials revealed aluminum build-up and poor capillary life with touch down of 20K or less. Optimizing the process parameters, switching on air-scrub, reducing shape angle to 20° instead of usual 35° and using Al-1wt%Si wire processed with refined grains revealed better capillary life with touch down of 200K without surface burrs. The method is capable of bonding complex looping and sharp acute bends. The data comprising of 1st and 2nd wedge dimensions, wedge pull, wedge shear and fracture mode for 20μm and 50μm Al-1wt%Si wires are presented. High temperature storage of aluminum wedge bonding to different substrate surfaces such as Al-0.5wt%Cu metallization, bare copper and gold plating revealed stable bond. From the wedge pull and tensile data, floor and shelf life of the wire is recommended to be 7days and 6months respectively. Evaluation of gold, copper and silver base bonding wires by this method showed feasible to bond and needs detailed studies to practice. The fusing current of Al-1wt%Si wire for varying diameter from 0.6 to 3mil and wire length from 1 to 20mm are also stated.


2015 ◽  
Vol 2015 (1) ◽  
pp. 000413-000418
Author(s):  
Wenjuan Qi ◽  
Daniel D. Evans

Modern wedge bonders have evolved since their early inception in 1957. This paper will review the common challenges process engineers face when selecting a wedge bond machine configuration and developing robust processes. Wedge bond cases presented will show the tradeoff between process inputs and the resulting bond shapes, bond appearance of black ring, burrs, pull results, etc. The purpose of this work was to optimize the process outputs: bond shape, black ring, burrs, and pulls on a die with aluminum bond pads. Process inputs included Force, Time, and Ultrasonic Level. An aluminum wafer was used to understand the basic relationship between process parameter inputs and outputs. The learning was then applied to a die with aluminum bond pads. Examples of non-compliance and compliance will be shown to help process engineers evaluate wedge bonds and make refinements. The case studied was for an aluminum bond pad/Al wafer and 1.5 mil aluminum wire interaction that creates burrs around the bond (wire to pad interface), black ring on the bond periphery (wedge tool to wire interface) and the resulting pulls. Both the graphical and numerical results of the case study have clearly demonstrated the relationship between the typical process inputs and outputs, particularly bond shape, burrs, black ring and pulls. The findings in this study will provide a general guideline and a troubleshooting reference for wedge bonding process development.


2012 ◽  
Vol 2012 (1) ◽  
pp. 000209-000214 ◽  
Author(s):  
M. Schneider-Ramelow ◽  
J.-M. Göhre ◽  
U. Geißler ◽  
S. Schmitz ◽  
K.-D. Lang

Asian industry and development is currently very focused on replacing extremely expensive Au wire with Cu or Pd-plated Cu in IC (mass production) packaging technologies (ball/wedge bonding). In contrast, Europe traditionally is researching and developing in the field of wedge/wedge bonding using heavy wire (> 100 μm) for power electronic modules or standard (thin) wire (< 100 μm, mostly 25–50 μm) for chip-on-board (COB) applications. One primary failure mechanism limiting the lifetime of power modules is Al wedge lift-off due to the different coefficients of thermal expansion (CTE) of the Al wedge and the chip (Si). This classical type of fatigue cracking can be reduced by using materials of higher strength and/or lower CTE. Key strategies include doping or alloying elements and/or optimizing bonding conditions to improve the microstructure. Cu-based wire or Cu-Al bimetal ribbons are another option, although these include changes to the chip structure and metallization. AlSi1 has been the industry standard bonding material in wedge/wedge thin wire bonding for many years. Its thermal stability is limited at temperature above ≈100°C due to recrystallization, grain growth and Si coagulation. For example, glob top material curing processes used in chip on board (COB) applications (e.g. several hours at 160°C) can decrease the strength of standard AlSi1 wire to less than 60% of its original value. Research and development is currently attempting to improve this situation by alloying and doping Al base material to increase high-temperature behavior or by using Al-coated Au or Cu wires. The presentation will give an overview of alternative wedge/wedge wire bonding materials and discuss the challenges to processing and reliability.


2011 ◽  
Vol 695 ◽  
pp. 577-580
Author(s):  
Hyung Kwon Moon ◽  
Seung Boo Jung ◽  
Je Sik Shin

In this paper, it was aimed to develop a new interconnect material having high electrical conductivity and strength simultaneously. The Cu composite sheet, possessing mesh type Ag conduction paths on the surface of a high strength Cu alloy sheet, was manufactured by damascene electroplating. The peel strength of Cu composite sheet prepared by damascene electroplating increased by above 50 times compared to Cu composite sheet by conventional electroplating. Al wire wedge bonding was able to be successfully conducted without extra metal thin film coating.


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