Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology
2008 ◽
Vol 48
(11-12)
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pp. 1786-1790
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Keyword(s):
2003 ◽
Vol 42
(Part 1, No. 4B)
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pp. 1892-1896
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Keyword(s):
2017 ◽
Vol 10
(10)
◽
pp. 49-62
Keyword(s):
2008 ◽
Vol 46
(9)
◽
pp. 154-161
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Keyword(s):
2012 ◽
Vol 47
(6)
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pp. 1394-1407
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Keyword(s):