Hitachi Model XMA-5 Electron Probe Microanalyzer

1968 ◽  
Vol 26 ◽  
pp. 308-309
Author(s):  
Tomura ◽  
Okano ◽  
Hara
Keyword(s):  
Electron Probe ◽  
High Performance ◽  
List Type ◽  
X Rays ◽  
Type Number ◽  
Fluorescence Excitation ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Scientific Instrumentation ◽  
Made In

The recent advancement in scientific instrumentation has been phenomenal. This is particularity true in the electron probe microanalyzer field. This paper describes the improvements made in the Hitachi Model XMA-5 Electron Probe Microanalyzer to achieve high performance.1.X-ray spectroscopy1-1.It is now possible to analyze a wide variety of elements including ultra light elements in minute concentrations with the advent of an increasing number of dispersing elements and high detectability.1-2.A linear crystal drive and direct wavelength read-out (with respect to the crystal) is employed in the spectrometer to assure simultaneous analyses of up to three elements by using three of the six crystals provided. For correction of absorbed X-rays and fluorescence excitation and with due consideration of the angular distribution of the characteristic X-rays, an X-ray take off angle of 38° (electron probe is incident vertically on the specimen surface) was adopted.

scholarly journals Solar X radiation

1965 ◽  
Vol 23 ◽  
pp. 45-52 ◽  
Author(s):  
C. de Jager
Keyword(s):  
Electromagnetic Radiation ◽  
Gamma Rays ◽  
Electronic Transitions ◽  
List Type ◽  
X Rays ◽  
Type Number ◽  
X Ray ◽  
Image Position ◽  
Electron Shells

X-ray bursts are defined as electromagnetic radiation originating from electronic transitions involving the lowest electron shells; gamma rays are of nuclear origin. Solar gamma rays have not yet been discovered.According to the origin we have : 1.Quasi thermal X-rays, emitted by (a) the quiet corona, (b) the activity centers without flares, and (c) the X-ray flares.2.Non-thermal X-ray bursts; these are always associated with flares.The following subdivision is suggested for flare-associated bursts :

scholarly journals Use of the Disk-of-least-confusion in X-ray Microanalysis

1998 ◽  
Vol 4 (S2) ◽  
pp. 274-275
Author(s):  
E. A. Kenik ◽  
S. X. Ren
Keyword(s):  
Spatial Resolution ◽  
Electron Scattering ◽  
Electron Probe ◽  
X Rays ◽  
High Brightness ◽  
X Ray ◽  
Electron Sources ◽  
Probe Diameter ◽  
Electron Probe Microanalyzer ◽  
Subsequent Emission

Whereas the spatial resolution for standard secondary electron (SEI) imaging in a scanning electron microscope or electron probe microanalyzer is related to the incident probe diameter, the spatial resolution for x-ray microanalysis is related to the convolution of the probe diameter with the spatial extent of the analyzed volume for a point probe. The latter is determined by electron scattering in the specimen and the subsequent emission of excited x-rays from the specimen. As such, it is possible that “What you see is not what you get”. This is especially true for instruments with high brightness electron sources (field emission). This problem is compounded by probe aberrations which at Gaussian image focus can produce significant electron tails extending tens of microns from the center of the probe.

X-Ray Excited Optical Luminescence and Portable Electron Probe Microanalyzer–Cathodoluminescence (EPMA–CL) Analyzers for On-Line and On-Site Analysis of Nonmetallic Inclusions in Steel

2017 ◽  
Vol 23 (6) ◽  
pp. 1143-1149 ◽  
Author(s):  
Susumu Imashuku ◽  
Koichiro Ono ◽  
Kazuaki Wagatsuma
Keyword(s):  
Electron Probe ◽  
Nonmetallic Inclusions ◽  
Beam Current ◽  
X Rays ◽  
X Ray ◽  
Site Analysis ◽  
Electron Probe Microanalyzer ◽  
Optical Luminescence ◽  
On Line ◽  
Inclusions In Steel

AbstractThe potential of the application of an X-ray excited optical luminescence (XEOL) analyzer and portable analyzers, composed of a cathodoluminescence (CL) spectrometer and electron probe microanalyzer (EPMA), to the on-line and on-site analysis of nonmetallic inclusions in steel is investigated as the first step leading to their practical use. MgAl2O4 spinel and Al2O3 particles were identified by capturing the luminescence as a result of irradiating X-rays in air on a model sample containing MgAl2O4 spinel and Al2O3 particles in the size range from 20 to 50 μm. We were able to identify the MgAl2O4 spinel and Al2O3 particles in the same sample using the portable CL spectrometer. In both cases, not all of the particles in the sample were identified because the luminescence intensities of the smaller Al2O3 in particular were too low to detect. These problems could be solved by using an X-ray tube with a higher power and increasing the beam current of the portable CL spectrometer. The portable EPMA distinguished between the MgAl2O4 spinel and Al2O3 particles whose luminescent colors were detected using the portable CL spectrometer. Therefore, XEOL analysis has potential for the on-line analysis of nonmetallic inclusions in steel if we have information on the luminescence colors of the nonmetallic inclusions. In addition, a portable EPMA–CL analyzer would be able to perform on-site analysis of nonmetallic inclusions in steel.

Twenty Years of Progress in X-Ray Diffraction Techniques

1961 ◽  
Vol 5 ◽  
pp. 1-12
Author(s):  
Andre Guinier
Keyword(s):  
Electron Microscopy ◽  
List Type ◽  
X Rays ◽  
Type Number ◽  
Rational Utilization ◽  
X Ray Diffraction ◽  
New Approach ◽  
X Ray ◽  
Near Future

AbstractAlthough no revolutionary advance has been achieved in the last two decades, X-ray diffraction is not to be considered as a quiescent field of physics. Actually many improvements, in theory as well as in experiment, slight by themselves but very numerous, have considerably increased the efficiency of techniques such as the determination of crystal structures, the analysis of crystalline phases, and the applications of X-rays to various problems of the physics of solids. Only the two last points will be dealt with here:1.Crystalline phase analysis. The development of a satisfactory atlas of powder patterns has been too slow, and the data are not yet complete and precise enough to permit a rational utilization of the modern diffractometers. A very interesting new approach is the systematic indexing of the powder patterns which would be possible with computers. In the near future, anyone should be able to analyze a powder at any temperature as an easy routine experiment.2.The study of lattice defects. X-ray techniques are now in competition with electron microscopy, the development of which has been very successful in recent years. Now we have a better understanding of the possibilities of both techniques. X-rays give better results to determine the statistics of an extended disorder even if it is slight (e.g., degrees of order in a solid solution), and the microscope is more powerful for the detection of large but rare defects (e.g., dislocations).

High spatial resolution x-ray microanalysis of interfaces

1995 ◽  
Vol 53 ◽  
pp. 284-285
Author(s):  
J. R. Michael
Keyword(s):  
Spatial Resolution ◽  
Electron Probe ◽  
Solid Angle ◽  
Collection Efficiency ◽  
Spatial Scales ◽  
Energy Dispersive Spectrometer ◽  
X Rays ◽  
X Ray ◽  
Probe Size ◽  
Brightness Field

X-ray microanalysis in the analytical electron microscope (AEM) refers to a technique by which chemical composition can be determined on spatial scales of less than 10 nm. There are many factors that influence the quality of x-ray microanalysis. The minimum probe size with sufficient current for microanalysis that can be generated determines the ultimate spatial resolution of each individual microanalysis. However, it is also necessary to collect efficiently the x-rays generated. Modern high brightness field emission gun equipped AEMs can now generate probes that are less than 1 nm in diameter with high probe currents. Improving the x-ray collection solid angle of the solid state energy dispersive spectrometer (EDS) results in more efficient collection of x-ray generated by the interaction of the electron probe with the specimen, thus reducing the minimum detectability limit. The combination of decreased interaction volume due to smaller electron probe size and the increased collection efficiency due to larger solid angle of x-ray collection should enhance our ability to study interfacial segregation.

Fluorescence effects in quantitative microprobe analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 188-189
Author(s):  
S.J.B. Reed
Keyword(s):  
Microprobe Analysis ◽  
Depth Distribution ◽  
Exciting Radiation ◽  
Primary Radiation ◽  
List Type ◽  
Type Number ◽  
Computing Power ◽  
X Ray ◽  
Fluorescent Radiation

Characteristic fluorescenceThe theory of characteristic fluorescence corrections was first developed by Castaing. The same approach, with an improved expression for the relative primary x-ray intensities of the exciting and excited elements, was used by Reed, who also introduced some simplifications, which may be summarized as follows (with reference to K-K fluorescence, i.e. K radiation of element ‘B’ exciting K radiation of ‘A’):1.The exciting radiation is assumed to be monochromatic, consisting of the Kα line only (neglecting the Kβ line).2.Various parameters are lumped together in a single tabulated function J(A), which is assumed to be independent of B.3.For calculating the absorption of the emerging fluorescent radiation, the depth distribution of the primary radiation B is represented by a simple exponential.These approximations may no longer be justifiable given the much greater computing power now available. For example, the contribution of the Kβ line can easily be calculated separately.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Interactive multiple area spectrum integration (MASI)

1994 ◽  
Vol 52 ◽  
pp. 942-943
Author(s):  
John A. Hunt ◽  
Richard D. Leapman ◽  
David B. Williams
Keyword(s):  
Image Processing ◽  
Low Dose ◽  
Routine Analysis ◽  
Reference Image ◽  
Area Spectrum ◽  
List Type ◽  
Type Number ◽  
Image Processor ◽  
X Ray ◽  
Scanning Path

Interactive MASI involves controlling the raster of a STEM or SEM probe to areas predefined byan integration mask which is formed by image processing, drawing or selecting regions manually. EELS, x-ray, or other spectra are then acquired while the probe is scanning over the areas defined by the integration mask. The technique has several advantages: (1) Low-dose spectra can be acquired by averaging the dose over a great many similar features. (2) MASI can eliminate the risks of spatial under- or over-sampling of multiple, complicated, and irregularly shaped objects. (3) MASI is an extremely rapid and convenient way to record spectra for routine analysis. The technique is performed as follows:Acquire reference imageOptionally blank beam for beam-sensitive specimensUse image processor to select integration mask from reference imageCalculate scanning path for probeUnblank probe (if blanked)Correct for specimen drift since reference image acquisition

The Man in the Background: The Search for Maecenas

Antichthon ◽  
2020 ◽  
Vol 54 ◽  
pp. 54-79
Author(s):  
Ronald T. Ridley
Keyword(s):  
Sixteenth Century ◽  
Current Understanding ◽  
List Type ◽  
Type Number ◽  
Large Role ◽  
Mistaken Identity ◽  
Augustan Era ◽  
Ara Pacis ◽  
Made In

AbstractSince the late sixteenth century parts of the ‘imperial frieze’ of the Ara Pacis have been known. The most striking figure in the background of the southern frieze is that long thought to be a portrait of Maecenas, the Etruscan prince and literary patron of the Augustan era. This article attempts three things: to discover 1.Where and how this identification originated,2.What evidence there now is for that identification, and3.What alternative identifications can be offered.The bibliography is substantial, the trail is complicated and highly paradoxical, and fantasy has often played a large role. The ‘evidence’ in play for centuries has sometimes evaporated into thin air. The identities proposed are, in fact, numerous. Not of least interest is the hidden or mistaken identity, in turn, of crucial modern scholars. A method is proposed at last for evaluating the identifications of this background portrait, including obvious comparison with other background figures. This analysis emphasizes how much is still not known about the most famous piece of Augustan art. An attempt is nevertheless made in the last analysis, to support what can be offered, in the light of current understanding, as the most plausible identification.

Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis.

1999 ◽  
Vol 5 (S2) ◽  
pp. 78-79
Author(s):  
C. Merlet ◽  
X. Llovet ◽  
F. Salvat
Keyword(s):  
Electron Probe ◽  
Numerical Models ◽  
Carbon Layer ◽  
Single Element ◽  
Surface Ionization ◽  
Copper Films ◽  
Multilayered Structures ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma

Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficulties to describe the process when the various layers have very different atomic numbers. In a previous work, we studied the surface ionization of thin copper films of various thicknesses deposited on substrates with very different atomic numbers. In the present communication, the study is extended to the case of multilayered specimens.The studied specimens consisted of thin copper films deposited on a carbon layer which, in turn, was placed on a variety of single-element substrates, ranging from Be to Bi.

Sign in / Sign up

Export Citation Format

Share Document