Pre-Meeting Topical Conference

2002 ◽  
Vol 8 (I1) ◽  
pp. 20-20
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Polymeric Materials ◽  
Specimen Preparation ◽  
Microbeam Analysis ◽  
Scanning Electron

Topic: Characterization of Non-Conductive or Charging Materials by Microbeam AnalysisThe goal of this topical conference is to present the state of the art for materials characterization of non-conductive or charging materials using microbeam analysis. Examples of charging materials include polymeric materials, ceramic materials, and photoresist materials in the microelectronic industry. Also, the characterization of biological specimens will be covered because they are prone to problems related to charging. These materials are of great technological importance and their characterization is still a great challenge because they charge when analyzed with an electron beam. The techniques of microbeam analysis that will be considered are: X-ray Microanalysis in the Electron Microprobe, Low Voltage Scanning Electron Microscopy, Environmental Scanning Electron Microscopy, Analytical Electron Microscopy with Field Emission Transmission Electron Microscopy, and Focused Ion Beam Milling for specimen preparation. World experts will present papers on these topics. Papers from this topical conference will be published in a special issue of Microscopy & Microanalysis.

Specimen preparation by ion beam slope cutting for characterization of ductile damage by scanning electron microscopy

2016 ◽  
Vol 79 (4) ◽  
pp. 321-327 ◽  
Author(s):  
Hans-Bernward Besserer ◽  
Gregory Gerstein ◽  
Hans Jürgen Maier ◽  
Florian Nürnberger
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ion Beam ◽  
Ductile Damage ◽  
Specimen Preparation ◽  
Scanning Electron

scholarly journals Bridging the gap: 3D real-space characterization of colloidal assemblies via FIB-SEM tomography

Nanoscale ◽  
2019 ◽  
Vol 11 (12) ◽  
pp. 5304-5316 ◽  
Author(s):  
Jessi E. S. van der Hoeven ◽  
Ernest B. van der Wee ◽  
D. A. Matthijs de Winter ◽  
Michiel Hermes ◽  
Yang Liu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Real Space ◽  
Particle Level ◽  
Particle Assemblies ◽  
Space Characterization ◽  
Scanning Electron

Focused ion beam-scanning electron microscopy tomography for quantitative real space studies of particle assemblies on a single particle level.

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 614-615
Author(s):  
J. Lin ◽  
W. Heeschen ◽  
J. Reffner ◽  
J. Hook
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Pigment Dispersion ◽  
Beam Scanning ◽  
Paint Films ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Low-Voltage Scanning Electron Microscopy Investigation of Polymers

1988 ◽  
Vol 46 ◽  
pp. 220-221
Author(s):  
V. K. Berry
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Low Voltage ◽  
Morphological Characterization ◽  
Transmission Electron ◽  
Conducting Materials ◽  
Voltage Scanning ◽  
Scanning Electron

The morphological characterization of any polymer blend plays an important part in the development of a new blend system because the properties of blends are dictated by phase morphology which is dependent upon the chemistry and the processing conditions. Light microscopy, scanning electron microscopy and transmission electron microscopy are the most commonly used microscopical techniques for morphological characterization. Transmission electron microscopy techniques provide the best resolution (≈ 0.3 nm) but are limited in the size of sample area and require elaborate sample preparation procedures. Surface charging and beam damage problems have been some of the drawbacks of conventional scanning electron microscopy with non-conducting materials like polymers.The use of low accelerating voltage scanning electron microscopy (LVSEM) in the characterization of polymers and other non-conducting materials is beginning to be recognized.

Surface morphology characterization of industrial polymers by low-voltage scanning electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 1036-1037
Author(s):  
V. K. Berry
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Collection Efficiency ◽  
Steady Increase ◽  
Brightness Field ◽  
Morphology Characterization ◽  
Voltage Scanning ◽  
Scanning Electron

There has been an increase in awareness in low voltage scanning electron microscopy (LVSEM) of polymers in recent years because not only is it possible to use uncoated or very lightly coated (1-5nm) polymer samples but also due to an inherent advantage of limited beam damage of polymer samples by low energy beams. A steady increase in the use of low accelerating voltages for characterizing polymers has been made possible due to some major developments, such as high brightness field emission source, better lens and column design to minimize lens aberrations, and newer and improved detector systems with higher collection efficiency, incorporated by instrument manufacturers in their newer commercial models in recent years. Although there is still room for further improvements, the described instrumental changes have made possible the appreciation of LVSEM in characterization of polymers and non-conducting, beam sensitive materials.

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