scholarly journals The Bright Future of Digital Imaging in Scanning Electron Microscopy

1994 ◽  
Vol 2 (4) ◽  
pp. 19-20 ◽  
Author(s):  
M.T. Postek ◽  
A.E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 X 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 X 4096 resolution or greater.

The bright future of digital imaging in scanning electron microscopy

1993 ◽  
Vol 51 ◽  
pp. 768-769
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 × 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 × 4096 resolution or greater. The two major categories of SEM systems to which digital technology have been applied are:In the analog SEM system the scan generator is normally operated in an analog manner and the image is displayed in an analog or "slow scan" mode.

Digital imaging: When should one take the plunge?

1996 ◽  
Vol 54 ◽  
pp. 602-603
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
New Instrument ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.

Spin-polarized Scanning Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 768-769
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Speed ◽  
Magnetic Thin Films ◽  
Electron Spin Polarization ◽  
Acquisition Time ◽  
Magnetization Direction ◽  
Spin Polarized ◽  
Conventional Methods ◽  
Scanning Electron

Spin-polarized scanning electron microscopy (spin SEM), where the secondary electron spin polarization is used as the image signal, is a novel technique for magnetic domain observation. Since its first development by Koike and Hayakawa in 1984, several laboratories have extensively studied this technique and have greatly improved its capability for data extraction and its range of applications. This paper reviews the progress over the last few years.Almost all the high expectations initially held for spin SEM have been realized. A spatial resolution of several hundreds angstroms has been attained, which is nearly one order of magnitude higher than that of conventional methods for thick samples. Quantitative analysis of magnetization direction has been performed more easily than with conventional methods. Domain observation of the surface of three-dimensional samples has been confirmed to be possible. One of the drawbacks, a long image acquisition time, has been eased by combining highspeed image-signal processing with high speed scanning, although at the cost of image quality. By using spin SEM, the magnetic structure of a 180 degrees surface Neel wall, magnetic thin films, multilayered films, magnetic discs, etc., have been investigated.

scholarly journals Digital Imaging: When Should One Take The Plunge?

1997 ◽  
Vol 5 (4) ◽  
pp. 14-15
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Optical Microscopy ◽  
Digital Imaging ◽  
High Quality ◽  
Storage Devices ◽  
Major Benefit ◽  
Transmission Electron ◽  
Scanning Electron

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quality positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).

The Fracture Failure Analysis of Precision Centrifuge Spindle

2014 ◽  
Vol 971-973 ◽  
pp. 802-805
Author(s):  
Wei Feng Zhang ◽  
Li Yan ◽  
Fu Xia Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Chemical Composition ◽  
Fracture Mechanics ◽  
Failure Analysis ◽  
Fatigue Failure ◽  
High Speed ◽  
Experimental Results ◽  
Fracture Failure ◽  
Scanning Electron

For the problem of high-speed rotating centrifuge spindle fracture failures, relevant analyses are conducted from the perspective of microstructure, chemical composition and fracture mechanics by using scanning electron microscopy and related instruments. Experimental results and analyses indicate that the spindle fracture is fatigue failure, mainly caused by cold cracks generated on the journal surfacing. Based on the analysis results, improvements and measures are suggested to better solve the spindle weld fracture failure problems.

scholarly journals Boosting the Adhesivity of π-Conjugated Polymers by Embedding Platinum Acetylides towards High-Performance Thermoelectric Composites

Polymers ◽  
2019 ◽  
Vol 11 (4) ◽  
pp. 593 ◽  
Author(s):  
Tao Wan ◽  
Xiaojun Yin ◽  
Chengjun Pan ◽  
Danqing Liu ◽  
Xiaoyan Zhou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Conjugated Polymers ◽  
High Performance ◽  
Single Walled Carbon Nanotubes ◽  
Strong Interactions ◽  
Transmission Electron ◽  
Higher Power ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

Single-walled carbon nanotubes (SWCNTs) incorporated with π-conjugated polymers, have proven to be an effective approach in the production of advanced thermoelectric composites. However, the studied polymers are mainly limited to scanty conventional conductive polymers, and their performances still remain to be improved. Herein, a new planar moiety of platinum acetylide in the π-conjugated system is introduced to enhance the intermolecular interaction with the SWCNTs via π–π and d–π interactions, which is crucial in regulating the thermoelectric performances of SWCNT-based composites. As expected, SWCNT composites based on the platinum acetylides embedded polymers displayed a higher power factor (130.7 ± 3.8 μW·m−1·K−2) at ambient temperature than those without platinum acetylides (59.5 ± 0.7 μW·m−1·K−2) under the same conditions. Moreover, the strong interactions between the platinum acetylide-based polymers and the SWCNTs are confirmed by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) measurements.

Digital imaging for scanning electron microscopy

Scanning ◽  
2006 ◽  
Vol 18 (1) ◽  
pp. 1-7 ◽  
Author(s):  
Michael T. Postek ◽  
András E. Vladár
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
Scanning Electron

Preparation of Molybdenum High Speed Tool Steels with Addition of Niobium Carbide by Powder Metallurgy Techniques

2014 ◽  
Vol 802 ◽  
pp. 102-107 ◽  
Author(s):  
Oscar Olimpio de Araújo Filho ◽  
Rodrigo Tecchio Antonello ◽  
Cezar Henrique Gonzalez ◽  
Severino Leopoldino Urtiga Filho ◽  
Francisco Ambrozio Filho
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Powder Metallurgy ◽  
Liquid Phase ◽  
High Speed ◽  
Niobium Carbide ◽  
High Energy ◽  
Tool Steels ◽  
Vacuum Sintering ◽  
Scanning Electron

High speed steels processed by Powder Metallurgy (PM) techniques present better mechanical properties when compared with similar steels obtained by the conventional process of cast to ingot and hot working. PM techniques produce improved microstructures with smaller and better distribution of carbides. Liquid phase sintering high speed steel seems to be a cheaper processing route in the manufacturing of tool steels if compared to the well-known and expansive hot isostatic pressing high speed steels. The introduction of niobium as alloying element began with the object of replacing elements like vanadium (V) and tungsten (W). Phase liquid sintering consists in a manufacturing technique to process high speed steels by powder metallurgy. The aim of this work of research is to process and obtain AISI M2 and M3:2 with and without the addition of niobium carbide by high energy milling, cold uniaxial compaction and vacuum sintering in the presence of a liquid phase. The powders of the AISI M2 and M3:2 were processed by high energy milling adding a small quantity of niobium carbide (6% in mass), then the powders were characterized by means of X-ray diffraction (XRD) and scanning electron Microscopy (SEM) plus energy dispersion spectroscopy (EDS) in order to evaluate the milling process. The powders of the AISI M2 and M3:2 with the addition of niobium carbide (NbC) were uniaxially cold compacted and then submitted to vacuum sintering. The sintered samples had their microstructure, porosity and carbide distribution observed and evaluated by means of Scanning Electron Microscopy (SEM) and the mechanical property of hardness was investigated by means of Vickers hardness tests. At least five samples of each steel were investigated.

Plastic Deformation and Surface Recrystallization of Cu-4 Mass%Zn Alloy under Instantaneous Extrusion and High Speed Friction

2011 ◽  
Vol 467-469 ◽  
pp. 1280-1284
Author(s):  
Jun Hui Yin ◽  
Jian Zheng ◽  
Chang Zhi Jia ◽  
Ming Hui Ye
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Plastic Deformation ◽  
Surface Layer ◽  
High Speed ◽  
Fibrous Tissue ◽  
Equiaxed Grains ◽  
Rotating Band ◽  
Zn Alloy ◽  
Scanning Electron

As a special hot-work progress, artillery shooting test was put in practice, and rotating band specimen of Cu-4 Mass%Zn alloy was prepared. The mesostructure and microstructure evolution of the alloy under instantaneous extrusion and high speed friction were observed by optical microscopy (OM) and scanning electron microscopy (SEM). Severe plastic deformation (SPD) and dynamic recrystallization phenomena were researched. The analysis results are as follows. At the beginning of SPD, under the instantaneous compression, the surface layer of alloy became fibrous tissue with the phenomena of work-hardening. With the plastic deformation continue, temperature of alloy arising rapidly under the high speed friction. Recrystallization occurs within the outermost part of fibrous tissue due to heating, so subgrains gradually become homogeneous equiaxed grains. In addition, SPD has little effect on the inner tissue, which is full of equiaxed grains still. Between equiaxed grains and fibrous tissue, there are many oblique strip grains which formed by radial extrusion stress , tangential slip stress and axial sliding stress .

Sign in / Sign up

Export Citation Format

Share Document