Amorphous carbon layer contributing Li storage capacity to Nb2O5@C nanosheets

RSC Advances ◽  
2015 ◽  
Vol 5 (45) ◽  
pp. 36104-36107 ◽  
Author(s):  
Lei Wang ◽  
Boyang Ruan ◽  
Jiantie Xu ◽  
Hua Kun Liu ◽  
Jianmin Ma
Keyword(s):  
Amorphous Carbon ◽  
Storage Capacity ◽  
High Capacity ◽  
Carbon Layer ◽  
Large Capacity ◽  
Li Storage ◽  
Amorphous Carbon Layer

The high-capacity of Nb2O5 nanosheets has been successfully realized through introducing amorphous carbon layers, which have been demonstrated to have a large capacity owing to the existence of defects on amorphous carbon layers.

Diamond-like amorphous carbon layer film by an inductively coupled plasma system for next generation etching hard mask

2018 ◽  
Vol 663 ◽  
pp. 21-24 ◽  
Author(s):  
Se Jun Park ◽  
Dohyung Kim ◽  
Seungmoo Lee ◽  
Yongjoon Ha ◽  
Mingyoo Lim ◽  
...  
Keyword(s):  
Amorphous Carbon ◽  
Inductively Coupled Plasma ◽  
Carbon Layer ◽  
Next Generation ◽  
Plasma System ◽  
Layer Film ◽  
Hard Mask ◽  
Inductively Coupled ◽  
Amorphous Carbon Layer

Defect Structure of Diamond Film at the Interface with Amorphous Carbon

1992 ◽  
Vol 270 ◽  
Author(s):  
Li Chang
Keyword(s):  
Amorphous Carbon ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Amorphous Layer ◽  
Carbon Layer ◽  
Silicon Substrates ◽  
Plasma Chemical Vapor Deposition ◽  
Diamond Crystals ◽  
Transmission Electron ◽  
Amorphous Carbon Layer

ABSTRACTDiamond films prepared by microwave plasma chemical vapor deposition, using a gas mixture of methane and hydrogen with ethanol, were formed on silicon substrates. Highresolution transmission electron microscopy was employed to characterize the microstructure at interface regions. It was found that the diamond crystals were grown on an amorphous carbon layer. Twins and stacking faults were observed at the regions interfaced with the amorphous carbon layer, suggesting that the defects may already exist in the nucleation stage and at the very first stage of growth. Also, some diamond nuclei embedded in the amorphous layer were observed.

Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of graphene

2018 ◽  
Vol 29 (30) ◽  
pp. 305302 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Iwona Pasternak ◽  
Paweł Ciepielewski ◽  
Francisco Guinea ◽  
Włodek Strupiński
Keyword(s):  
Amorphous Carbon ◽  
Ion Bombardment ◽  
Carbon Layer ◽  
Amorphous Carbon Layer

Graphitic Disks or Polygons? Faceting of Graphite Disks

1998 ◽  
Vol 4 (S2) ◽  
pp. 708-709
Author(s):  
A. Krishnan ◽  
E. Dujardin ◽  
T.W. Ebbesen ◽  
M.M.J. Treacy
Keyword(s):  
Amorphous Carbon ◽  
Carbon Layer ◽  
Nucleation And Growth ◽  
Growth Mechanisms ◽  
Additional Insight ◽  
Structural Peculiarities ◽  
Carbon Soot ◽  
20 Nm ◽  
Insight Into ◽  
Amorphous Carbon Layer

The recent discovery of graphite cones [1,2] has raised some interesting questions about the nucleation and growth of curved graphitic structures. Here we report the structural peculiarities of one member of the ensemble, i.e. the flat graphite disks. Unlike graphite flakes seen in carbon soot which are irregularly shaped, the disks in this sample often show regular faceting which might give us additional insight into the growth mechanisms.The samples were examined in a Hitachi H9000 NAR TEM. Samples were sonicated in high purity methanol and dispersed on a 300 mesh Cu grid coated with a 20 nm thick amorphous carbon layer. Typical disk diameters range from 0.5 to 3.0 μm, with thickness ranging from 10 nm to 50 nm.A close examination reveals that the edges of the disks are faceted and typically have 12 sides. In most cases, the edges show a long facet alternating with a shorter facet.

Simultaneous Measurements of Electrical Resistivity and Raman Scattering from Conductive Die Attach Adhesives

2001 ◽  
Vol 682 ◽  
Author(s):  
Joseph Miragliotta ◽  
Richard C. Benson ◽  
Terry E. Phillips ◽  
John A. Emerson
Keyword(s):  
Electrical Conductivity ◽  
Electrical Resistivity ◽  
Raman Scattering ◽  
Amorphous Carbon ◽  
Conductive Polymer ◽  
Carbon Layer ◽  
Sers Spectrum ◽  
Subsequent Performance ◽  
Die Attach ◽  
Amorphous Carbon Layer

ABSTRACTThe development of electrical conductivity in silver (Ag)-filled conductive polymer adhesives is dependent on the thermal profile of the curing process. Previous studies of polymer adhesive systems have shown that chemical reactions at the interface of the micronsized Ag filler are a key factor in determining the subsequent performance of the conductive system. In an attempt to correlate the behavior of electrical conductivity with the chemical nature of the Ag particle interface, we have simultaneously performed electrical resistivity and surface enhanced Raman scattering (SERS) measurements on a commercial conductive adhesive. At room temperature in the low conductance state (∼10−9 ohms−1), the SERS spectrum from the uncured adhesive exhibited peaks that were identified with a molecular species bound to Ag surface via the carboxylate functionality of the adsorbate. During the thermal cure processing, the SERS data showed a partial decomposition of the carboxylate species and the formation of an amorphous carbon layer at the Ag surface. A comparison of the simultaneously recorded electrical resistance and SERS data showed a strong correlation between the development of high conductance (∼ 1 ohm−1) in the adhesive and the formation of the amorphous carbon layer.

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